scholarly journals DEVICE FOR GEOPHYSICAL EXPLORATION OF THE EARTH'S CRUST BASED ON A DETONATION GENERATOR

2020 ◽  
pp. 393-397
Author(s):  
Mamasadikov Yu ◽  
Yunusaliev E.M ◽  
Tojiev R.J
Keyword(s):  
Phase Shift ◽  
Block Diagram ◽  
Harmonic Component ◽  
Shallow Depth ◽  
Detonation Waves ◽  
Limited Area ◽  
Geophysical Exploration ◽  
Timing Diagrams ◽  
Timing Diagram ◽  
Operation Timing

The article describes the principle of operation of the device for geophysical exploration, which is based on the action of detonation waves to a limited area of the earth's surface at a shallow depth (up to 100 m), a block diagram and timing diagrams explaining the principle of the device. KEYWORDS: geophysical exploration, device, block diagram, principle of operation, timing diagram, detonation generator, phase shift, harmonic component of echo signals.

scholarly journals INVESTIGATION OF DEVICE FOR GEOPHYSICAL EXPLORATION AT SHALLOW DEPTH

2017 ◽  
Vol 2 ◽  
pp. 34-39
Author(s):  
Obbozzhon Kuldashev ◽  
Ibrohimzhon Tojiboev
Keyword(s):  
Seismic Waves ◽  
Block Diagram ◽  
Maximum Amplitude ◽  
Mineral Resources ◽  
Shallow Depth ◽  
Impact Pulse ◽  
Geophysical Exploration ◽  
Harmonic Components ◽  
The Impact ◽  
Frequency Harmonic

The article presents the results of the development of the echolocation device for geophysical exploration at shallow depth. The principle of operation, block diagram and time diagrams of the echolocation device for geophysical exploration at shallow depths are outlined. The urgency of developing an echolocation device for geophysical exploration at shallow depth is revealed in the conditions of a lack of mineral resources, the need to replenish them with the help of discovering new deposits. It is analyzed that under the action of a shock wave, multi-frequency harmonic damped seismic waves are excited to the earth's surface, the frequency band of which is 1-200 Hz. When detonation generators are used to control the earth's crust, the duration of the impact pulse is on the order of one millisecond and the frequency range at 0.5 from the maximum amplitude of the echo signals is 20-400 Hz, which allows using higher-frequency harmonic components of echo signals to determine and classify the object at depth up to 100 m. Echolocation device for geophysical exploration is intended for detection and primary classification of objects by their acoustic rigidity and can be used for geophysical exploration at shallow depths (up to 100.0 m).

scholarly journals Vector model of the timing diagram of automatic machine

2013 ◽  
Vol 4 (2) ◽  
pp. 391-396 ◽  
Author(s):  
A. Jomartov
Keyword(s):  
Transfer Functions ◽  
Equations Of Motion ◽  
Automatic Machine ◽  
Vector Model ◽  
Timing Diagrams ◽  
Timing Diagram

Abstract. In this paper a vector model of timing diagram of automatic machine is developed, which allows us to solve a variety dynamic tasks by changing the parameters of timing diagram of its mechanisms. The connection between the parameters of the timing diagram of automatic machine and equations of motion mechanisms through functions of position and transfer functions of mechanisms is established. The vector model of timing diagram can be used to optimize the timing diagrams of looms and polygraphic machines.

scholarly journals Gamma Precorrection and Phase Error Compensation Methods Based on Three-Frequency with Three-Phase Shift

2021 ◽  
Vol 2021 ◽  
pp. 1-15
Author(s):  
Wei Feng ◽  
Shaojing Tang ◽  
Shinan Xu ◽  
Tong Qu ◽  
Daxing Zhao
Keyword(s):  
Phase Shift ◽  
Error Compensation ◽  
Phase Error ◽  
Three Dimensional ◽  
Harmonic Component ◽  
Measurement Technology ◽  
Compensation Methods ◽  
Three Phase ◽  
Phase Calculation ◽  
Fringe Patterns

Digital fringe projection measurement technology has been widely used in computer vision and optical three-dimensional (3D) measurement. Considering the phase error caused by the gamma distortion and nonlinear error, the active gamma precorrection and phase error compensation methods based on the three-frequency with three-phase shifts are designed to reversely solve the initial phase and accurately compensate phase error. On the one hand, the gamma coefficient of the measurement system depends on precoding two groups of fringe sequences with different gamma coefficients to calculate the corresponded proportional coefficient of harmonic component. On the other hand, the phase error compensation method is designed to compensate the phase error and improve the accuracy and speed of phase calculation after gamma correction. Experiments show that the proposed precalibration gamma coefficient method can effectively reduce the sinusoidal error in nearly 80 percent which only needs fewer fringe patterns. Compared with the traditional three-frequency with four-phase shift method, the proposed method not only has higher phase accuracy and better noise resistance but also has good robustness and flexibility, which is not limited to the gamma distortion model.

Errors of Timing Diagram of Automatic Machine

2014 ◽  
Vol 565 ◽  
pp. 228-232
Author(s):  
Assylbek Jomartov
Keyword(s):  
Automatic Machine ◽  
Vector Form ◽  
Timing Diagrams ◽  
Timing Diagram

The paper presents the method of determining of the errors of timing diagram of automatic machine. The timing diagram of automatic machine is represented in a vector form with preservation of the visibility of a linear timing diagram. To determine of the errors of actuation of the mechanisms is used the method of calculating of dimensional chains. The method allows taking into account the errors of operation of mechanisms of automatic machine at design of the timing diagrams.

scholarly journals REINFORCING THE DESIGN FOUNDATION OF ASYNCHRONOUS SERIAL DATA COMMUNICATIONS USING LOGIC AND PROTOCOLS ANALYZERS

2011 ◽  
Author(s):  
Dario Schor ◽  
Witold Kinsner ◽  
Kathryn Marcynuk
Keyword(s):  
Data Communications ◽  
Noisy Environments ◽  
Laboratory Unit ◽  
Timing Diagrams ◽  
Sequence Of Events ◽  
Timing Diagram ◽  
Serial Data ◽  
Clear Link ◽  
Transmission Link ◽  
Protocol Analyzer

The foundation behind asynchronous serial data communications in microprocessor-based systems is generally taught through the theoretical timing diagrams and implementation of a protocol in a laboratory setting. Although students can extract the necessary information from the timing diagram to program a selected microprocessor, they face a number of challenges during the implementation because of the lack of tools to debug and observe the output of the microprocessor incrementally. More specifically, students cannot apply some of the acquired debugging skills like the use of breakpoints or oscilloscopes because (i) programming breakpoints can confirm the logic state of a signal and sequence of events, but not the timing of events, (ii) oscilloscopes can only capture portions of timing signals, and (iii) the signals captured are not digitized, thus displaying uncertainty in noisy environments. Once the programming task is completed, the protocol is verified by transmitting a known message, with the expectation that it will be received at the other end of the serial transmission link - an approach (all-or-nothing) that can be very frustrating during a lab session. This paper presents the use of a logic/protocol analyzer to enhance learning of asynchronous serial data communications by capturing and visualizing the real timing diagrams from a laboratory unit. The use of the Saleae Logic Analyzer provides students with a visual representation of the waveforms at every stage of their design and establishes a very clear link between the timing diagrams discussed in a class and their actual implementations in the lab.

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

A Many-Beam Technique for Enhanced Resolution of Partial Dislocations

1972 ◽  
Vol 30 ◽  
pp. 646-647
Author(s):  
J. M. Oblak ◽  
B. H. Kear
Keyword(s):  
Phase Shift ◽  
Field Method ◽  
Dark Field ◽  
Bright Field ◽  
Field Technique ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Enhanced Resolution ◽  
Nickel Base ◽  
Beam Technique

The “weak-beam” and systematic many-beam techniques are the currently available methods for resolution of closely spaced dislocations or other inhomogeneities imaged through strain contrast. The former is a dark field technique and image intensities are usually very weak. The latter is a bright field technique, but generally use of a high voltage instrument is required. In what follows a bright field method for obtaining enhanced resolution of partial dislocations at 100 KV accelerating potential will be described.A brief discussion of an application will first be given. A study of intermediate temperature creep processes in commercial nickel-base alloys strengthened by the Ll2 Ni3 Al γ precipitate has suggested that partial dislocations such as those labelled 1 and 2 in Fig. 1(a) are in reality composed of two closely spaced a/6 <112> Shockley partials. Stacking fault contrast, when present, tends to obscure resolution of the partials; thus, conditions for resolution must be chosen such that the phase shift at the fault is 0 or a multiple of 2π.

An Image Reconstruction System Applied to High Voltage Microscopy

1975 ◽  
Vol 33 ◽  
pp. 292-293
Author(s):  
D. E. Johnson
Keyword(s):  
High Voltage ◽  
Prior Information ◽  
Block Diagram ◽  
Three Dimensional ◽  
Real Space ◽  
Two Dimensional ◽  
Efficient Manner ◽  
Fourier Methods ◽  
Tilt Series ◽  
Methods Of Reconstruction

Increased specimen penetration; the principle advantage of high voltage microscopy, is accompanied by an increased need to utilize information on three dimensional specimen structure available in the form of two dimensional projections (i.e. micrographs). We are engaged in a program to develop methods which allow the maximum use of information contained in a through tilt series of micrographs to determine three dimensional speciman structure.In general, we are dealing with structures lacking in symmetry and with projections available from only a limited span of angles (±60°). For these reasons, we must make maximum use of any prior information available about the specimen. To do this in the most efficient manner, we have concentrated on iterative, real space methods rather than Fourier methods of reconstruction. The particular iterative algorithm we have developed is given in detail in ref. 3. A block diagram of the complete reconstruction system is shown in fig. 1.

Observation of surface morphology by reflection electron holography

1989 ◽  
Vol 47 ◽  
pp. 536-537
Author(s):  
N. Osakabe ◽  
J. Endo ◽  
T. Matsuda ◽  
A. Tonomura
Keyword(s):  
Phase Shift ◽  
Surface Morphology ◽  
High Sensitivity ◽  
High Energy ◽  
Path Difference ◽  
Transmission Mode ◽  
Electron Holography ◽  
Dynamical Process ◽  
High Vertical Resolution ◽  
Amplification Technique

Progress in microscopy such as STM and TEM-TED has revealed surface structures in atomic dimension. REM has been used for the observation of surface dynamical process and surface morphology. Recently developed reflection electron holography, which employes REM optics to measure the phase shift of reflected electron, has been proved to be effective for the observation of surface morphology in high vertical resolution ≃ 0.01 Å.The key to the high sensitivity of the method is best shown by comparing the phase shift generation by surface topography with that in transmission mode. Difference in refractive index between vacuum and material Vo/2E≃10-4 owes the phase shift in transmission mode as shownn Fig. 1( a). While geometrical path difference is created in reflection mode( Fig. 1(b) ), which is measured interferometrically using high energy electron beam of wavelength ≃0.01 Å. Together with the phase amplification technique , the vertivcal resolution is expected to be ≤0.01 Å in an ideal case.

On-line alignment and astigmatism correction using a TV and personal computer

1993 ◽  
Vol 51 ◽  
pp. 202-203
Author(s):  
F. Hosokawa ◽  
Y. Kondo ◽  
T. Honda ◽  
Y. Ishida ◽  
M. Kersker
Keyword(s):  
High Resolution ◽  
Personal Computer ◽  
Block Diagram ◽  
Incident Beam ◽  
Ccd Camera ◽  
Alignment Procedure ◽  
Astigmatism Correction ◽  
Transmission Electron ◽  
Alignment System ◽  
On Line

High-resolution transmission electron microscopy must attain utmost accuracy in the alignment of incident beam direction and in astigmatism correction, and that, in the shortest possible time. As a method to eliminate this troublesome work, an automatic alignment system using the Slow-Scan CCD camera has been introduced recently. In this method, diffractograms of amorphous images are calculated and analyzed to detect misalignment and astigmatism automatically. In the present study, we also examined diffractogram analysis using a personal computer and digitized TV images, and found that TV images provided enough quality for the on-line alignment procedure of high-resolution work in TEM. Fig. 1 shows a block diagram of our system. The averaged image is digitized by a TV board and is transported to a computer memory, then a diffractogram is calculated using an FFT board, and the feedback parameters which are determined by diffractogram analysis are sent to the microscope(JEM- 2010) through the RS232C interface. The on-line correction system has the following three modes.

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