scholarly journals ANALYSIS OF ALL-PASS FILTERS APPLICATION TO ELIMINATE NEGATIVE EFFECTS OF LOUDNESS WAR TREND

2020 ◽  
Vol 10 (2) ◽  
pp. 8-11
Author(s):  
Marcin Maciejewski ◽  
Wojciech Surtel ◽  
Krzysztof Nowak
Keyword(s):  
Frequency Band ◽  
Dynamic Range ◽  
Negative Effects ◽  
Subjective Tests ◽  
Music Information

In this paper the influence of all-pass filters on musical material with applied hypercompression dynamics (loudness war trend) was analyzed. These filters are characterized by shifting phase in selected frequency band of signal, not by change of their amplitude levels. Because a lot of music information is present in music tracks, the dynamic range was tested together with influence of other sound parameters like selectivity or instruments’ arrangement on scene, by running subjective tests on a group of respondents.

scholarly journals Assessing a 6C Kalman filter using experimental datasets from an industrial robot

2020 ◽  
Author(s):  
Yara Rossi ◽  
Eleni Chatzi ◽  
Markus Rothacher ◽  
John Clinton ◽  
Cédric Schmelzbach
Keyword(s):  
Kalman Filter ◽  
Ground Motion ◽  
Frequency Band ◽  
Dynamic Range ◽  
Industrial Robot ◽  
Translational Motion ◽  
Strong Motion ◽  
Observation Data ◽  
Low Frequencies ◽  
Broad Frequency Band

<p>Current best practice in monitoring earthquake strong motion are dense networks comprising strong motion accelerometers that measure acceleration over a broad frequency and amplitude range. These instruments are capable of measuring translational motions of large earthquakes, but lack sensitivity to very low frequencies or permanent displacements. However, it is widely accepted that during earthquakes the rotational component of the ground motion, both static and dynamic, is large enough to contaminate the derived displacements from these sensors. Modern rotational sensors, are also very broadband, have a large dynamic range, and are not sensitive to translational motions. We explore the value of complementing accelerometers with these rotational sensors at seismic strong motion monitoring stations.</p><p>The assessment of the errors introduced into accelerometer records from rotational ground motions is only possible with co-located rotational instruments sensitive enough to record the small rotation rates accompanying the translational motion. Operating accelerometers alongside gyros and additionally GNSS instrumentation should allow us to record the full 6 components (6C) of near-field earthquake motions, with increasing fidelity across a very broad frequency band for the strongest motions.</p><p>We aim to demonstrate how, using a combination of the three sensor types, we can recover the full 6C ground motion, and hence also more reliable displacement records, using a versatile industrial six-axis robot that can produce controlled and repeatable 6C motion across a broad frequency band. Through the precise feedback loop used by the robot to stabilize its precise trajectory, we get a 6C recording of the driven motion represented by Euler rotations and displacements, which we use as ground truth. By simulating a combination of translational and rotational motions on the robot, we show that the 6C Kalman filter can accurately reproduce the clean simulated translational motion. By using a Kalman filter, we attempt to combine the different data sets using prediction and weighting of the observation data for an optimal solution. Our methodology tries to take into account the strengths and weaknesses of the individual instruments that are providing partly redundant and partly complementary ground motion information.</p>

Intermediate frequency band digitized high dynamic range radiometer system for plasma diagnostics and real-time Tokamak control

2011 ◽  
Vol 82 (6) ◽  
pp. 063508 ◽  
Author(s):  
W. A. Bongers ◽  
V. van Beveren ◽  
D. J. Thoen ◽  
P. J. W. M. Nuij ◽  
M. R. de Baar ◽  
...  
Keyword(s):  
Real Time ◽  
Frequency Band ◽  
Plasma Diagnostics ◽  
Dynamic Range ◽  
High Dynamic Range ◽  
Intermediate Frequency ◽  
High Dynamic

scholarly journals Trace Selenium Measurement in Water Using Laser-Induced Fluorescence Assisted by Laser Ablation

2021 ◽  
pp. 000370282110357
Author(s):  
Elton Soares de Lima Filho ◽  
Paul Bouchard ◽  
Mohamad Sabsabi ◽  
Guy Lamouche ◽  
Aïssa Harhira
Keyword(s):  
Laser Ablation ◽  
Dynamic Range ◽  
Limit Of Detection ◽  
Laser Induced Fluorescence ◽  
Label Free ◽  
Negative Effects ◽  
Wide Dynamic Range ◽  
Aquatic Life ◽  
Versatile Tool ◽  
Concentration Levels

Selenium detection and removal from industrial and mining effluents have gained attention recently due to the negative effects of this trace element on aquatic life. However, the current methods for the detection of selenium in effluents are off-line by nature. In order to fill this gap, we investigated the use of laser ablation-assisted laser-induced fluorescence (LA-LIF) to measure trace amount of selenium in aqueous solutions. LA-LIF measurements are real time, label-free, standoff, and require no consumables as well as no sample preparation. They can provide a field-amenable, versatile tool for the measurement of selenium in the whole water treatment chain. We describe the system utilized, the temporal and fluence optimization studies, and the resulting calibration curve, which is linear over a wide dynamic range from parts-per-billion to tens of parts-per-million concentration levels. We also show that the achieved limit of detection of selenium can reach 32 µg/L using LA-LIF, without any kind of preconcentration or matrix transfer.

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

Quantitative energy-filtered electron diffraction

1994 ◽  
Vol 52 ◽  
pp. 992-993
Author(s):  
R. Vincent
Keyword(s):  
Electron Diffraction ◽  
Inelastic Scattering ◽  
Dynamic Range ◽  
Electron Optics ◽  
Surface Layers ◽  
High Brightness ◽  
Inclined Surfaces ◽  
Perfect Symmetry ◽  
Amorphous Surface ◽  
The Ideal

Microanalysis and diffraction on a sub-nanometre scale have become practical in modern TEMs due to the high brightness of field emission sources combined with the short mean free paths associated with both elastic and inelastic scattering of incident electrons by the specimen. However, development of electron diffraction as a quantitative discipline has been limited by the absence of any generalised theory for dynamical inelastic scattering. These problems have been simplified by recent innovations, principally the introduction of spectrometers such as the Gatan imaging filter (GIF) and the Zeiss omega filter, which remove the inelastic electrons, combined with annual improvements in the speed of computer workstations and the availability of solid-state detectors with high resolution, sensitivity and dynamic range.Comparison of experimental data with dynamical calculations imposes stringent requirements on the specimen and the electron optics, even when the inelastic component has been removed. For example, no experimental CBED pattern ever has perfect symmetry, departures from the ideal being attributable to residual strain, thickness averaging, inclined surfaces, incomplete cells and amorphous surface layers.

Direct measurement of electron-diffraction-pattern intensities using an energy loss spectrometer

1989 ◽  
Vol 47 ◽  
pp. 668-669
Author(s):  
A. G. Jackson ◽  
M. Rowe
Keyword(s):  
Thermal Effects ◽  
Dynamic Range ◽  
Scattering Amplitude ◽  
Dynamical Theory ◽  
Site Symmetry ◽  
Proof Of Concept ◽  
Parallel Acquisition ◽  
Kinematic Approximation ◽  
Speed Up ◽  
Structure Calculations

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.

Development of imaging plate for a TEM and its characteristics

1989 ◽  
Vol 47 ◽  
pp. 100-101
Author(s):  
N. Mori ◽  
T. Oikawa ◽  
Y. Harada ◽  
J. Miyahara ◽  
T. Matsuo
Keyword(s):  
Dynamic Range ◽  
Protective Layer ◽  
High Sensitivity ◽  
Imaging Plate ◽  
Phosphor Layer ◽  
Imaging Device ◽  
X Ray Imaging ◽  
New Type ◽  
Basic Characteristics ◽  
Reading System

The Imaging Plate (IP) is a new type imaging device, which was developed for diagnostic x ray imaging. We have reported that usage of the IP for a TEM has many merits; those are high sensitivity, wide dynamic range, and good linearity. However in the previous report the reading system was prototype drum-type-scanner, and IP was also experimentally made, which phosphor layer was 50μm thick with no protective layer. So special care was needed to handle them, and they were used only to make sure the basic characteristics. In this article we report the result of newly developed reading, printing system and high resolution IP for practical use. We mainly discuss the characteristics of the IP here. (Precise performance concerned with the reader and other system are reported in the other article.)Fig.1 shows the schematic cross section of the IP. The IP consists of three parts; protective layer, phosphor layer and support.

Slow-scan CCD cameras and low-dose High-Resolution Electron Microscopy: Direct and quantitative

1994 ◽  
Vol 52 ◽  
pp. 412-413
Author(s):  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Structural Damage ◽  
Low Dose ◽  
Dynamic Range ◽  
High Resolution Electron Microscopy ◽  
Operating Conditions ◽  
Digital Data ◽  
Ccd Cameras ◽  
Resolution Electron

It has been known for many years that materials such as zeolites, polymers, and biological specimens have crystalline structures that are vulnerable to electron beam irradiation. This radiation damage severely restrains the use of high resolution electron microscopy (HREM). As a result, structural characterization of these materials using HREM techniques becomes difficult and challenging. The emergence of slow-scan CCD cameras in recent years has made it possible to record high resolution (∽2Å) structural images with low beam intensity before any apparent structural damage occurs. Among the many ideal properties of slow-scan CCD cameras, the low readout noise and digital recording allow for low-dose HREM to be carried out in an efficient and quantitative way. For example, the image quality (or resolution) can be readily evaluated on-line at the microscope and this information can then be used to optimize the operating conditions, thus ensuring that high quality images are recorded. Since slow-scan CCD cameras output (undistorted) digital data within the large dynamic range (103-104), they are ideal for quantitative electron diffraction and microscopy.

Quantitative Electron Microscope with imaging plate

1994 ◽  
Vol 52 ◽  
pp. 408-409
Author(s):  
D. Shindo
Keyword(s):  
Electron Microscope ◽  
Dynamic Range ◽  
Processing System ◽  
Digital Data ◽  
Imaging Plate ◽  
Crystal Thickness ◽  
X Ray Diffraction ◽  
Resolution Electron ◽  
Electron Intensity ◽  
Diffraction Patterns

Imaging plate has good properties, i.e., a wide dynamic range and good linearity for the electron intensity. Thus the digital data (2048x1536 pixels, 4096 gray levels in log scale) obtained with the imaging plate can be used for quantification in electron microscopy. By using the image processing system (PIXsysTEM) combined with a main frame (ACOS3900), quantitative analysis of electron diffraction patterns and high-resolution electron microscope (HREM) images has been successfully carried out.In the analysis of HREM images observed with the imaging plate, quantitative comparison between observed intensity and calculated intensity can be carried out by taking into account the experimental parameters such as crystal thickness and defocus value. An example of HREM images of quenched Tl2Ba2Cu1Oy (Tc = 70K) observed with the imaging plate is shown in Figs. 1(b) - (d) comparing with a structure model proposed by x-ray diffraction study of Fig. 1 (a). The image was observed with a JEM-4000EX electron microscope (Cs =1.0 mm).

Sign in / Sign up

Export Citation Format

Share Document