scholarly journals Design and Experiment of Symmetrical Shape Deployable Arc Profiling Mechanism Based on Composite Multi-Cam Structure

Symmetry ◽  
2019 ◽  
Vol 11 (8) ◽  
pp. 958 ◽  
Author(s):  
Zeyu Xu ◽  
Zhou Yang ◽  
Jieli Duan ◽  
Mohui Jin ◽  
Jiasi Mo ◽  
...  
Keyword(s):  
Relative Motion ◽  
Inverse Solution ◽  
Continuous Change ◽  
Design Purpose ◽  
Symmetrical Shape ◽  
Analysis Experiment ◽  
Arc Shape ◽  
Surface Envelope ◽  
Pitch Curve

At present, there are few reports on the profiling mechanism that can achieve surface envelope profiling along the surface of a shaft whose radius is constantly changing. Existing profiling mechanisms cannot achieve this function. To this end, a novel deployable arc profiling mechanism is presented in this paper. The mechanism can realize centering deployment along the shaft with a changing radius. The radius of the deployable arc can be adapted to the continuous change of shaft radius, and its surface can always maintain the arc shape for surface envelope profiling. The mechanism is mainly composed of compound cams. Each cam contains multiple grooves, and each groove connects to an arc support linkage. The arc support linkage is controlled by the compound motion of cams in different layers. The pitch curve of each groove is designed by applying the method of relative motion and inverse solution and obtained various parameter equations of the mechanism. The feasibility of this mechanism is verified by analysis, experiment, and application test. The results show that the proposed deployable arc profiling mechanism can achieve the design purpose and the profiling accuracy is kept above 96.425%.

The restoration of blurred electron micrographs

1986 ◽  
Vol 44 ◽  
pp. 180-181
Author(s):  
Bridget Carragher ◽  
David A. Bluemke ◽  
Michael J. Potel ◽  
Robert Josephs
Keyword(s):  
Cross Section ◽  
Electron Micrographs ◽  
Relative Motion ◽  
Finite Thickness ◽  
Image Plane ◽  
Helical Axis ◽  
Thin Sections ◽  
Structural Details

We have investigated the feasibility of restoring blurred electron micrographs. Two related problems have been considered; the restoration of images blurred as a result of relative motion between the specimen and the image plane, and the restoration of images which are rotationally blurred about an axis. Micrographs taken while the specimen is drifting result in images which are blurred in the direction of motion. An example of rotational blurring arises in micrographs of thin sections of helical particles viewed in cross section. The twist of the particle within the finite thickness of the section causes the image to appear rotationally blurred about the helical axis. As a result, structural details, particularly at large distances from the helical axis, will be obscured.

Dynamic low-dose electron diffraction and imaging of phase transitions in polymers

1993 ◽  
Vol 51 ◽  
pp. 890-891
Author(s):  
David C. Martin ◽  
Jun Liao
Keyword(s):  
Crystal Structure ◽  
Phase Transition ◽  
Electron Diffraction ◽  
Low Dose ◽  
Dark Field ◽  
Continuous Change ◽  
Selected Area Electron Diffraction ◽  
Resolution Electron ◽  
Chain Axis ◽  
High Resolution Electron Micrographs

By careful control of the electron beam it is possible to simultaneously induce and observe the phase transformation from monomer to polymer in certain solid-state polymcrizable diacetylenes. The continuous change in the crystal structure from DCHD diacetylene monomer (a=1.76 nm, b=1.36 nm, c=0.455 nm, γ=94 degrees, P2l/c) to polymer (a=1.74 nm, b=1.29 nm, c=0.49 nm, γ=108 degrees, P2l/c) occurs at a characteristic dose (10−4C/cm2) which is five orders of magnitude smaller than the critical end point dose (20 C/cm2). Previously we discussed the progress of this phase transition primarily as observed down the [001] zone (the chain axis direction). Here we report on the associated changes of the dark field (DF) images and selected area electron diffraction (SAED) patterns of the crystals as observed from the side (i.e., in the [hk0] zones).High resolution electron micrographs (HREM), DF images, and SAED patterns were obtained on a JEOL 4000 EX HREM operating at 400 kV.

HASTANELERİN HİZMET KALİTESİNİN HASTA TATMİN ÖLÇEĞİ İLE ÖLÇÜLMESİ: KARABÜK DEVLET HASTANESİNDE YATAN HASTALAR ÜZERİNDE BİR ARAŞTIRMA THE MEASUREMENT SERVICE QUALITY OF THE HOSPITALS BY THE PATIENT SCALE: A RESEARCH ON THE PATIENTS IN KARABUK STATE HOSP

2013 ◽  
Vol 1 (1) ◽  
pp. 100
Author(s):  
Selçuk Yurtsever
Keyword(s):  
Patient Satisfaction ◽  
Health Services ◽  
Literature Review ◽  
Private Sector ◽  
State Hospital ◽  
Continuous Change ◽  
Satisfaction Scale ◽  
The World ◽  
Main Factors

It has been known that both in the world and in Turkey a continuous change has been experienced in the provision of health services in recent years. In this sense by adopting the customer(client) focused approach of either public or private sector hospitals; it has been seen that they are in the struggle for presenting a right, fast, trustuble, comfy service. The purpose of this research is to measure the satisfaction degree, expectations and perceptions of the patients in Karabük State Hospital through comparison. In this context, the patient satisfaction scale which has been developed as a result of literature review has been used and by this scale it has been tried to measure the satisfaction levels of the patients in terms of material and human factors which are the two main factors of the service that was presented. In the study, with the scales of Servqual and 0-100 Points together, in the part of the analysis MANOVA have been used. The expectations and the perceptions of the patient has been compared first by generally and then by separating to different groups according to the various criterias and in thisway it has been tried to be measured their satisfaction levels. According to the results that were obtained, although, the satisfaction levels of the patients who have taken service from Karabük State Hospital are high in terms of thedoctors and the nurses; it has been reached to the result that their satisfaction levels are low in terms of the materials that have been used at the presenting of the service and the management.

Prediction Method of a System with Continuous Change Parameters Considering SNR Fluctuation

2018 ◽  
Vol 138 (9) ◽  
pp. 1075-1081
Author(s):  
Yasuhide Kobayashi ◽  
Mitsuyuki Saito ◽  
Yuki Amimoto ◽  
Wataru Wakita
Keyword(s):  
Prediction Method ◽  
Continuous Change

A Novel OBIRCH Fault Isolation Method to Locate the Leakage Failure Point

2008 ◽  
Author(s):  
Chi-Lin Huang ◽  
Yu Hsiang Shu
Keyword(s):  
Semiconductor Device ◽  
Fault Isolation ◽  
Resistance Change ◽  
Cross Sectional ◽  
Isolation Technique ◽  
Isolation Techniques ◽  
Atomic Force ◽  
Analysis Experiment ◽  
Failure Point ◽  
Leakage Failure

Abstract Conventional isolation techniques, such as Optical Beam Induced Resistance Change (OBIRCH) or photoemission microscopy (PEM) frequently fail to locate failure points when only applied to power pin of the semiconductor device. In this paper, a novel OBIRCH failure isolation technique is utilized to detect leakage failures. Different test conditions are presented to identify the differences in current when all input pins are pulled high in an OBIRCH system. In order to verify a failure point, it is necessary to perform electrical analysis of the suspected failure point in the failing sample. In general, Conductive Atomic Force Microscope (C-AFM) and a Nano-Prober is sufficient to provide the electrical data required for failure analysis. Experiment results, however, prove that this novel OBIRCH failure isolation technique is effective in locating the failure point, especially for leakage failures. The failure mechanism is illustrated using cross-sectional TEM.

Sign in / Sign up

Export Citation Format

Share Document