scholarly journals A Dynamic Range Expansion Technique for CMOS Image Sensors with Dual Charge Storage in a Pixel and Multiple Sampling

Sensors ◽  
2008 ◽  
Vol 8 (3) ◽  
pp. 1915-1926 ◽  
Author(s):  
Suhaidi Shafie ◽  
Shoji Kawahito ◽  
Shinya Itoh
Sensors ◽  
2019 ◽  
Vol 19 (24) ◽  
pp. 5447
Author(s):  
Calvin Yi-Ping Chao ◽  
Shang-Fu Yeh ◽  
Meng-Hsu Wu ◽  
Kuo-Yu Chou ◽  
Honyih Tu ◽  
...  

In this paper we present a systematic approach to sort out different types of random telegraph noises (RTN) in CMOS image sensors (CIS) by examining their dependencies on the transfer gate off-voltage, the reset gate off-voltage, the photodiode integration time, and the sense node charge retention time. Besides the well-known source follower RTN, we have identified the RTN caused by varying photodiode dark current, transfer-gate and reset-gate induced sense node leakage. These four types of RTN and the dark signal shot noises dominate the noise distribution tails of CIS and non-CIS chips under test, either with or without X-ray irradiation. The effect of correlated multiple sampling (CMS) on noise reduction is studied and a theoretical model is developed to account for the measurement results.


2015 ◽  
Vol 15 (6) ◽  
pp. 3265-3273 ◽  
Author(s):  
Zhiyuan Gao ◽  
Suying Yao ◽  
Congjie Yang ◽  
Jiangtao Xu

2009 ◽  
Author(s):  
Leo H. C. Braga ◽  
Suzana Domingues ◽  
José G. Gomes ◽  
Antonio C. Mesquita

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