CMOS Fixed Pattern Noise Elimination Based on Sparse Unidirectional Hybrid Total Variation

With the improvement of semiconductor technology, the performance of CMOS Image Sensor has been greatly improved, reaching the same level as that of CCD in dark current, linearity and readout noise. However, due to the production process, CMOS has higher fix pattern noise than CCD at present. Therefore, the removal of CMOS fixed pattern noise has become the research content of many scholars. For current fixed pattern noise (FPN) removal methods, the most effective one is based on optimization. Therefore, the optimization method has become the focus of many scholars. However, most optimization models only consider the image itself, and rarely consider the structural characteristics of FPN. The proposed sparse unidirectional hybrid total variation (SUTV) algorithm takes into account both the sparse structure of column fix pattern noise (CFPN) and the random properties of pixel fix pattern noise (PFPN), and uses adaptive adjustment strategies for some parameters. From the experimental values of PSNR and SSM as well as the rate of change, the SUTV model meets the design expectations with effective noise reduction and robustness.