scholarly journals Hydrogen Sensor: Detecting Far-Field Scattering of Nano-Blocks (Mg, Ag, and Pd)

Sensors ◽  
2020 ◽  
Vol 20 (14) ◽  
pp. 3831
Author(s):  
Eunso Shin ◽  
Young Jin Lee ◽  
Hyoungjoo Nam ◽  
Soon-Hong Kwon
Keyword(s):  
Hydrogen Concentration ◽  
Dielectric Material ◽  
Incident Light ◽  
Hydrogen Sensor ◽  
Far Field ◽  
Resolution Limit ◽  
Atomic Lattice ◽  
Scattering Pattern ◽  
Plasmonic Gap ◽  
Gap Mode

Hydrogen sensor technologies have been rapidly developing. For effective and safe sensing, we proposed a hydrogen sensor composed of magnesium (Mg), silver (Ag), and palladium (Pd) nano-blocks that overcomes the spectral resolution limit. This sensor exploited the properties of Mg and Pd when absorbing hydrogen. Mg became a dielectric material, and the atomic lattice of Pd expanded. These properties led to changes in the plasmonic gap mode between the nano-blocks. Owing to the changing gap mode, the far-field scattering pattern significantly changed with the hydrogen concentration. Thus, sensing the hydrogen concentration was able to be achieved simply by detecting the far-field intensity at a certain angle for incident light with a specific wavelength.

Optically induced atomic lattice with tunable near-field and far-field diffraction patterns

2017 ◽  
Vol 5 (6) ◽  
pp. 676 ◽  
Author(s):  
Feng Wen ◽  
Huapeng Ye ◽  
Xun Zhang ◽  
Wei Wang ◽  
Shuoke Li ◽  
...  
Keyword(s):  
Near Field ◽  
Far Field ◽  
Atomic Lattice ◽  
Diffraction Patterns ◽  
Optically Induced

Plasmonic gap mode nanocavities at telecommunication wavelengths

2014 ◽  
Author(s):  
Pi-Ju Cheng ◽  
Chen-Ya Weng ◽  
Shu-Wei Chang ◽  
Tzy-Rong Lin ◽  
Chung-Hao Tien
Keyword(s):  
Plasmonic Gap ◽  
Gap Mode

scholarly journals Demonstration of nanoimprinted hyperlens array for high-throughput sub-diffraction imaging

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Minseop Byun ◽  
Dasol Lee ◽  
Minkyung Kim ◽  
Yangdoo Kim ◽  
Kwan Kim ◽  
...  
Keyword(s):  
Real Time ◽  
Large Scale ◽  
Medical Science ◽  
Super Resolution ◽  
Fabrication Process ◽  
Far Field ◽  
Resolution Limit ◽  
Imaging Science ◽  
Diffraction Imaging ◽  
Resolution Imaging

Abstract Overcoming the resolution limit of conventional optics is regarded as the most important issue in optical imaging science and technology. Although hyperlenses, super-resolution imaging devices based on highly anisotropic dispersion relations that allow the access of high-wavevector components, have recently achieved far-field sub-diffraction imaging in real-time, the previously demonstrated devices have suffered from the extreme difficulties of both the fabrication process and the non-artificial objects placement. This results in restrictions on the practical applications of the hyperlens devices. While implementing large-scale hyperlens arrays in conventional microscopy is desirable to solve such issues, it has not been feasible to fabricate such large-scale hyperlens array with the previously used nanofabrication methods. Here, we suggest a scalable and reliable fabrication process of a large-scale hyperlens device based on direct pattern transfer techniques. We fabricate a 5 cm × 5 cm size hyperlenses array and experimentally demonstrate that it can resolve sub-diffraction features down to 160 nm under 410 nm wavelength visible light. The array-based hyperlens device will provide a simple solution for much more practical far-field and real-time super-resolution imaging which can be widely used in optics, biology, medical science, nanotechnology and other closely related interdisciplinary fields.

Near-Field Scanning Optical Microscopy

1987 ◽  
Vol 45 ◽  
pp. 184-187
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
A. Lewis ◽  
K. Lin
Keyword(s):  
Spatial Resolution ◽  
Structural Damage ◽  
Near Field ◽  
Far Field ◽  
Resolution Limit ◽  
Field Methods ◽  
General Applicability ◽  
Minimal Sample ◽  
Near Field Imaging ◽  
Field Imaging

The spatial resolution of most of the imaging or microcharacterization methods presently in use are fundamentally limited by the wavelength of the exciting or the emitted radiation being used. In general, the smaller the wavelength of the exciting probe, the greater the structural damage to the sample under study. Thus, the requirements of minimal sample alteration and high spatial resolution seem to be at odds with one another.However, the reason for this wavelength resolution limit is due to the far field methods for producing or detecting the radiation of interest. If one does not use far field optics, but rather the method of near field imaging, the spatial resolution attainable can be much smaller than the wavelength of the radiation used. This method of near field imaging has a general applicability for all wave probes.

scholarly journals Plasmonic gap-mode nanocavities with metallic mirrors in high-index cladding

2013 ◽  
Vol 21 (11) ◽  
pp. 13479 ◽  
Author(s):  
Pi-Ju Cheng ◽  
Chen-Ya Weng ◽  
Shu-Wei Chang ◽  
Tzy-Rong Lin ◽  
Chung-Hao Tien
Keyword(s):  
High Index ◽  
Plasmonic Gap ◽  
Gap Mode

scholarly journals Coexistence of Near-Field and Far-Field Sources: the Angular Resolution Limit

2013 ◽  
Vol 464 ◽  
pp. 012002
Author(s):  
Rémy Boyer ◽  
Mohammed Nabil El Korso ◽  
Alexandre Renaux ◽  
Sylvie Marcos
Keyword(s):  
Angular Resolution ◽  
Near Field ◽  
Far Field ◽  
Resolution Limit

Information-theoretical resolution limit of a far-field subwavelength diffraction system

2021 ◽  
Vol 103 (3) ◽  
Author(s):  
Yan-ming Gao ◽  
Chuan-jin Zu ◽  
Xiang-sheng Xie ◽  
Xiang-yang Yu
Keyword(s):  
Far Field ◽  
Resolution Limit

scholarly journals Far field scattering pattern of differently structured butterfly scales

2007 ◽  
Vol 194 (3) ◽  
pp. 201-207 ◽  
Author(s):  
M. A. Giraldo ◽  
S. Yoshioka ◽  
D. G. Stavenga
Keyword(s):  
Far Field ◽  
Scattering Pattern

scholarly journals A general theory of far-field optical microscopy image formation and resolution limit using double-sided Feynman diagrams

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Naoki Fukutake
Keyword(s):  
Optical Microscopy ◽  
Optical Resolution ◽  
Image Formation ◽  
Image Resolution ◽  
Feynman Diagrams ◽  
Far Field ◽  
Resolution Limit ◽  
Theoretical Frameworks ◽  
Microscopy Image ◽  
New Applications

Abstract Optical resolution of far-field optical microscopy is limited by the diffraction of light, while diverse light-matter interactions are used to push the limit. The image resolution limit depends on the type of optical microscopy; however, the current theoretical frameworks provide oversimplified pictures of image formation and resolution that only address individual types of microscopy and light-matter interactions. To compare the fundamental optical resolutions of all types of microscopy and to codify a unified image-formation theory, a new method that describes the influence of light-matter interactions on the resolution limit is required. Here, we develop an intuitive technique using double-sided Feynman diagrams that depict light-matter interactions to provide a bird’s-eye view of microscopy classification. This diagrammatic methodology also allows for the optical resolution calculation of all types of microscopy. We show a guidepost for understanding the potential resolution and limitation of all optical microscopy. This principle opens the door to study unexplored theoretical questions and lead to new applications.

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