Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data
2018 ◽
pp. 4991-5004
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2020 ◽
Vol 249
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pp. 119409
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2016 ◽
Vol 2016
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pp. 1-13
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2018 ◽
Vol 271
(3)
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pp. 775-796
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2018 ◽
Vol 8
(1)
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pp. 483