scholarly journals Lead-Free Piezoelectric Diaphragm Biosensors Based on Micro-Machining Technology and Chemical Solution Deposition

Sensors ◽  
2016 ◽  
Vol 16 (1) ◽  
pp. 69 ◽  
Author(s):  
Xiaomeng Li ◽  
Xiaoqing Wu ◽  
Peng Shi ◽  
Zuo-Guang Ye
Keyword(s):  
Chemical Solution Deposition ◽  
Lead Free ◽  
Micro Machining ◽  
Chemical Solution ◽  
Solution Deposition

Influence of Excess Potassium on Structural and Ferroelectric Properties of Lead-Free Bi0.5K0.5TiO3 Thin Films

2021 ◽  
Vol 21 (4) ◽  
pp. 2681-2686
Author(s):  
Nguyen Ngoc Minh ◽  
Bui Van Dan ◽  
Nguyen Duc Minh ◽  
Guus Rijnders ◽  
Ngo Duc Quan
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Single Phase ◽  
Ferroelectric Properties ◽  
Lead Free ◽  
Chemical Solution ◽  
Ferroelectric Films ◽  
Solution Deposition ◽  
Si Substrates ◽  
Excess Amount

Lead-free Bi0.5K0.5TiO3 (BKT) ferroelectric films were synthesized on Pt/Ti/SiO2/Si substrates via the chemical solution deposition. The influence of the excess potassium on the microstructures and the ferroelectric properties of the films was investigated in detail. The results showed that the BKT films have reached the well-crystallized state in the single-phase perovskite structure with 20 mol.% excess amount of potassium. For this film, the ferroelectric properties of the films were significantly enhanced. The remnant polarization (Pr) and maximum polarization (Pm) reached the highest values of 9.4 μC/cm2 and 32.2 μC/cm2, respectively, under the electric field of 400 kV/cm.

Enhanced ferroelectric properties of LiNbO3 substituted Na0.5K0.5NbO3 lead-free thin films grown by chemical solution deposition

2008 ◽  
Vol 93 (21) ◽  
pp. 212905 ◽  
Author(s):  
Chang Won Ahn ◽  
Euh Duck Jeong ◽  
Sun Young Lee ◽  
Hai Joon Lee ◽  
Sun Hee Kang ◽  
...  
Keyword(s):  
Thin Films ◽  
Chemical Solution Deposition ◽  
Ferroelectric Properties ◽  
Lead Free ◽  
Chemical Solution ◽  
Solution Deposition

Crystallization Behavior of KNbO3 Series Precursors Synthesized by CSD Process

2006 ◽  
Vol 320 ◽  
pp. 85-88 ◽  
Author(s):  
Kiyotaka Tanaka ◽  
Kenichi Kakimoto ◽  
Hitoshi Ohsato
Keyword(s):  
Thermal Analysis ◽  
Differential Thermal Analysis ◽  
Chemical Solution Deposition ◽  
Crystallization Behavior ◽  
Piezoelectric Materials ◽  
Lead Free ◽  
Metal Alkoxides ◽  
Chemical Solution ◽  
Environmental Preservation ◽  
Solution Deposition

The development of lead-free piezoelectric materials has been required from the viewpoint of environmental preservation. We focused the lead-free KNbO3-based systems, and used a chemical solution deposition (CSD) process to obtain their precursor. (Na1-xKx)NbO3 precursor solutions were prepared from metal alkoxides and solvents such as absolute ethanol and 2-methoxyethanol. Crystallization behavior of the precursor gels obtained from the above solutions was investigated by the thermogravimetry differential thermal analysis (TG-DTA) measurement.

Chemical Solution Deposition of Ferroelectric Hafnium Oxide for Future Lead Free Ferroelectric Devices

2015 ◽  
Vol 4 (12) ◽  
pp. P419-P423 ◽  
Author(s):  
Sergej Starschich ◽  
David Griesche ◽  
Theodor Schneller ◽  
Ulrich Böttger
Keyword(s):  
Chemical Solution Deposition ◽  
Hafnium Oxide ◽  
Lead Free ◽  
Chemical Solution ◽  
Solution Deposition

scholarly journals Stable dielectric response in lead-free relaxor K0.5Na0.5NbO3–SrTiO3 thin films

2014 ◽  
Vol 04 (02) ◽  
pp. 1450012 ◽  
Author(s):  
A. Eršte ◽  
A. Kupec ◽  
B. Kmet ◽  
B. Malič ◽  
V. Bobnar
Keyword(s):  
Thin Films ◽  
Dielectric Response ◽  
Chemical Solution Deposition ◽  
Lead Free ◽  
Deposition Method ◽  
Chemical Solution ◽  
Structural Investigations ◽  
Solution Deposition ◽  
Chemical Solution Deposition Method ◽  
Fatigue Endurance

K 0.5 Na 0.5 NbO 3– SrTiO 3 (KNN–STO) thin films of different compositions were prepared by the chemical solution deposition method. While structural investigations confirmed the formation of perovskite solid solution in all developed films, dielectric experiments revealed a relaxor broad dispersive maximum in the sample with 15 mol% of STO, exhibiting for a thin film high ε′ ~ 330 at ~ 210 K. The history-dependent effects of this relaxor sample were compared to those of KNN–STO ceramics and, furthermore, shown to be much weaker than in widely used lead-based ferroelectric and relaxor ( Pb , La )( Zr , Ti ) O 3 ceramics: While fatigue endurance results revealed a slight drop in polarization after 3 × 105 switching cycles, the results of aging of the dielectric constant revealed no notable decrease in its values after 106 s.

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