scholarly journals Synergistic Effect of Pressurization Rate and β-Form Nucleating Agent on the Multi-Phase Crystallization of iPP

Polymers ◽  
2021 ◽  
Vol 13 (17) ◽  
pp. 2984
Author(s):  
Wenxia Jia ◽  
Ranran Zhuo ◽  
Mingkun Xu ◽  
Jiaxiang Lin ◽  
Xiaoting Li ◽  
...  
Keyword(s):  
Synergistic Effect ◽  
Nucleating Agent ◽  
Nucleation Theory ◽  
Classical Nucleation Theory ◽  
X Ray Diffraction ◽  
Relative Crystallinity ◽  
X Ray ◽  
X Ray Scattering ◽  
Pressurization Rate ◽  
Multi Phase

Using a homemade pressure device, we explored the synergistic effect of pressurization rate and β-form nucleating agent (β-NA) on the crystallization of an isotactic polypropylene (iPP) melt. The obtained samples were characterized by combining small angle X-ray scattering and synchrotron wide angle X-ray diffraction. It was found that the synergistic application of pressurization and β-NA enables the preparation of a unique multi-phase crystallization of iPP, including β-, γ- and/or mesomorphic phases. Pressurization rate plays a crucial role on the formation of different crystal phases. As the pressurization rate increases in a narrow range between 0.6–1.9 MPa/s, a significant competitive formation between β- and γ-iPP was detected, and their relative crystallinity are likely to be determined by the growth of the crystal. When the pressurization rate increases further, both β- and γ-iPP contents gradually decrease, and the mesophase begins to emerge once it exceeds 15.0 MPa/s, then mesomorphic, β- and γ- iPP coexist with each other. Moreover, with different β-NA contents, the best pressurization rate for β-iPP growth is the same as 1.9 MPa/s, while more β-NA just promotes the content of β-iPP under the rates lower than 1.9 MPa/s. In addition to inducing the formation of β-iPP, it shows that β-NA can also significantly promote the formation of γ-iPP in a wide pressurization rate range between 3.8 to 75 MPa/s. These results were elucidated by combining classical nucleation theory and the growth theory of different crystalline phases, and a theoretical model of the pressurization-induced crystallization is established, providing insight into understanding the multi-phase structure development of iPP.

Rapid-Quenching Investigation of the Nb-Pd-Ge System

1990 ◽  
Vol 205 ◽  
Author(s):  
C. E. Krill ◽  
W. L. Johnson
Keyword(s):  
Phase Diagram ◽  
Single Phase ◽  
Rapid Quenching ◽  
Nucleation Theory ◽  
Classical Nucleation Theory ◽  
X Ray Diffraction ◽  
X Ray ◽  
Solubility Range ◽  
Fcc Phase ◽  
Bcc Phase

AbstractThe structure of rapidly quenched Nb100-x-yPdxGey alloys has been investigated using x-ray diffraction. Niobium concentrations were varied between 100 and 45 at.% the remainder at each Nb concentration was composed of Pd and up to y = 15 at.% Ge. Germanium was found to suppress the nucleation rate of the fcc α-NbPd phase relative to that of the bcc α-Nb phase, thereby extending the single-phase bcc solubility range by ≈ 2 at.% Nb. High Ge content (y > 6) also induced quenching of the amorphous phase. These results can be understood from the standpoint of classical nucleation theory and from a consideration of the polymorphic phase diagram of Nb-Pd. The two approaches are consistent with Ge addition depressing the To line of the fcc phase more rapidly than it depresses the To line of the bcc phase.

Crystallization Behaviors of Plasticized Poly(Lactic Acid)/Microcrystalline Cellulose Composite Sheet

2020 ◽  
Vol 856 ◽  
pp. 303-308
Author(s):  
Suttinun Phongtamrug ◽  
Sirisart Ouajai
Keyword(s):  
Lactic Acid ◽  
Microcrystalline Cellulose ◽  
Testing Machine ◽  
Crystallization Rate ◽  
Nucleating Agent ◽  
Poly Lactic Acid ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Twin Screw

Poly(lactic acid) (PLA) is a potential biodegradable polymer to replace petroleum-based plastic, however, its main drawback is brittleness because of slow crystallization rate. To overcome this limitation, compounding with some additives is the most chosen choice due to easy and effective preparation. In this study, an epoxidized soybean oil (ESO) and a microcrystalline cellulose (MCC) were applied as a plasticizer and a nucleating agent, respectively. The PLA was compounded with ESO and MCC by using a twin-screw extruder. The product sheets were prepared by using a chill-roll cast film extruder. Change of thermal property after adding ESO and MCC was investigated by a differential scanning calorimeter. Mechanical property of the prepared sheet was carried out by using a universal testing machine in a tensile mode. Microstructure of the sheets was also studied by wide angle X-ray diffraction (WAXD) and small angle X-ray scattering (SAXS) techniques. The results showed that ESO assisted plasticization while the MCC induced crystallization of PLA. Also, ESO and MCC eased flowability and alignment of PLA microstructure in machine direction.

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

scholarly journals X-ray and Neutron Study on the Structure of Hydrous SiO2 Glass up to 10 GPa

Minerals ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 84 ◽  
Author(s):  
Satoru Urakawa ◽  
Toru Inoue ◽  
Takanori Hattori ◽  
Asami Sano-Furukawa ◽  
Shinji Kohara ◽  
...  
Keyword(s):  
Oxide Glasses ◽  
Void Space ◽  
X Ray Diffraction ◽  
Amorphous Sio2 ◽  
Sio2 Glass ◽  
X Ray ◽  
X Ray Scattering ◽  
Medium Range ◽  
Two Phases ◽  
A Minor

The structure of hydrous amorphous SiO2 is fundamental in order to investigate the effects of water on the physicochemical properties of oxide glasses and magma. The hydrous SiO2 glass with 13 wt.% D2O was synthesized under high-pressure and high-temperature conditions and its structure was investigated by small angle X-ray scattering, X-ray diffraction, and neutron diffraction experiments at pressures of up to 10 GPa and room temperature. This hydrous glass is separated into two phases: a major phase rich in SiO2 and a minor phase rich in D2O molecules distributed as small domains with dimensions of less than 100 Å. Medium-range order of the hydrous glass shrinks compared to the anhydrous SiO2 glass by disruption of SiO4 linkage due to the formation of Si–OD deuterioxyl, while the response of its structure to pressure is almost the same as that of the anhydrous SiO2 glass. Most of D2O molecules are in the small domains and hardly penetrate into the void space in the ring consisting of SiO4 tetrahedra.

Comparative Studies of Ultra Low-κ Porous Silica Films with 2-D Hexagonal and Disordered Pore Structures

2004 ◽  
Vol 812 ◽  
Author(s):  
Nobutoshi Fujii ◽  
Kazuhiro Yamada ◽  
Yoshiaki Oku ◽  
Nobuhiro Hata ◽  
Yutaka Seino ◽  
...  
Keyword(s):  
Pore Structure ◽  
Nonionic Surfactants ◽  
Porous Silica ◽  
Silica Film ◽  
X Ray Diffraction ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Porous Silica Film ◽  
Diffraction Peaks

AbstractPeriodic 2-dimensional (2-D) hexagonal and the disordered pore structure silica films have been developed using nonionic surfactants as the templates. The pore structure was controlled by the static electrical interaction between the micelle of the surfactant and the silica oligomer. No X-ray diffraction peaks were observed for the disordered mesoporous silica films, while the pore diameters of 2.0-4.0 nm could be measured by small angle X-ray scattering spectroscopy. By comparing the properties of the 2-D hexagonal and the disordered porous silica films which have the same porosity, it is found that the disordered porous silica film has advantages in terms of the dielectric constant and Young's modulus as well as the hardness. The disordered porous silica film is more suitable for the interlayer dielectrics for ULSI.

Time-resolved isothermal crystallization of absorbable PGA-co-PLA copolymer by synchrotron small-angle X-ray scattering and wide-angle X-ray diffraction

Polymer ◽  
2001 ◽  
Vol 42 (21) ◽  
pp. 8965-8973 ◽  
Author(s):  
Zhi-Gang Wang ◽  
Xuehui Wang ◽  
Benjamin S. Hsiao ◽  
Saša Andjelić ◽  
Dennis Jamiolkowski ◽  
...  
Keyword(s):  
Small Angle ◽  
Isothermal Crystallization ◽  
Wide Angle ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

An X-ray scattering study on inverted Ge–Si huts grown at low temperatures

2004 ◽  
Vol 19 (4) ◽  
pp. 347-351
Author(s):  
J. Xu ◽  
X. S. Wu ◽  
B. Qian ◽  
J. F. Feng ◽  
S. S. Jiang ◽  
...  
Keyword(s):  
Low Temperatures ◽  
Lattice Strain ◽  
Lattice Mismatch ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Transmission Electron ◽  
Large Lattice ◽  
Scattering Study

Ge–Si inverted huts, which formed at the Si∕Ge interface of Si∕Ge superlattice grown at low temperatures, have been measured by X-ray diffraction, grazing incidence X-ray specular and off-specular reflectivities, and transmission electron microscopy (TEM). The surface of the Si∕Ge superlattice is smooth, and there are no Ge–Si huts appearing on the surface. The roughness of the surfaces is less than 3 Å. Large lattice strain induced by lattice mismatch between Si and Ge is found to be relaxed because of the intermixing of Ge and Si at the Si∕Ge interface.

scholarly journals Linear Structural Trends and Multi-Phase Intergrowths in Helvine-Group Minerals, (Zn,Fe,Mn)8[Be6Si6O24]S2

Minerals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 325
Author(s):  
Sytle Antao
Keyword(s):  
Cell Parameter ◽  
Structural Parameters ◽  
Unit Cell ◽  
Fluid Composition ◽  
Ternary Solid Solution ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Difference ◽  
Multi Phase ◽  
And Diffusion

Synchrotron high-resolution powder X-ray diffraction (HRPXRD) and Rietveld structure refinements were used to examine the crystal structure of single phases and intergrowths (either two or three phases) in 13 samples of the helvine-group minerals, (Zn,Fe,Mn)8[Be6Si6O24]S2. The helvine structure was refined in the cubic space group P4¯3n. For the intergrowths, simultaneous refinements were carried out for each phase. The structural parameters for each phase in an intergrowth are only slightly different from each other. Each phase in an intergrowth has well-defined unit-cell and structural parameters that are significantly different from the three endmembers and these do not represent exsolution or immiscibility gaps in the ternary solid-solution series. The reason for the intergrowths in the helvine-group minerals is not clear considering the similar radii, identical charge, and diffusion among the interstitial M cations (Zn2+, Fe2+, and Mn2+) that are characteristic of elongated tetrahedral coordination. The difference between the radii of Zn2+ and Mn2+ cations is 10%. Depending on the availability of the M cations, intergrowths may occur as the temperature, pressure, fugacity fS2, and fluid composition change on crystallization. The Be–Si atoms are fully ordered. The Be–O and Si–O distances are nearly constant. Several structural parameters (Be–O–Si bridging angle, M–O, M–S, average <M–O/S>[4] distances, and TO4 rotational angles) vary linearly with the a unit-cell parameter across the series because of the size of the M cation.

A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray diffraction and small-angle X-ray scattering experiments

2021 ◽  
Vol 54 (3) ◽  
Author(s):  
Peter Nadazdy ◽  
Jakub Hagara ◽  
Petr Mikulik ◽  
Zdenko Zaprazny ◽  
Dusan Korytar ◽  
...  
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Photon Flux ◽  
Photon Flux Density ◽  
X Ray Diffraction ◽  
High Beam ◽  
X Ray ◽  
X Ray Scattering ◽  
Beam Collimation ◽  
Ray Scattering

A four-bounce monochromator assembly composed of Ge(111) and Ge(220) monolithic channel-cut monochromators with V-shaped channels in a quasi-dispersive configuration is presented. The assembly provides an optimal design in terms of the highest transmittance and photon flux density per detector pixel while maintaining high beam collimation. A monochromator assembly optimized for the highest recorded intensity per detector pixel of a linear detector placed 2.5 m behind the assembly was realized and tested by high-resolution X-ray diffraction and small-angle X-ray scattering measurements using a microfocus X-ray source. Conventional symmetric and asymmetric Ge(220) Bartels monochromators were similarly tested and the results were compared. The new assembly provides a transmittance that is an order of magnitude higher and 2.5 times higher than those provided by the symmetric and asymmetric Bartels monochromators, respectively, while the output beam divergence is twice that of the asymmetric Bartels monochromator. These results demonstrate the advantage of the proposed monochromator assembly in cases where the resolution can be partially sacrificed in favour of higher transmittance while still maintaining high beam collimation. Weakly scattering samples such as nanostructures are an example. A general advantage of the new monochromator is a significant reduction in the exposure time required to collect usable experimental data. A comparison of the theoretical and experimental results also reveals the current limitations of the technology of polishing hard-to-reach surfaces in X-ray crystal optics.

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