scholarly journals Investigation of Roughness Correlation in Polymer Brushes via X-ray Scattering

Polymers ◽  
2020 ◽  
Vol 12 (9) ◽  
pp. 2101
Author(s):  
Marcus Hildebrandt ◽  
Eui-young Shin ◽  
Suan Yang ◽  
Wael Ali ◽  
Sedakat Altinpinar ◽  
...  
Keyword(s):  
Polymer Films ◽  
Polymer Brushes ◽  
Substrate Surface ◽  
Polymer Surface ◽  
Intrinsic Property ◽  
Polymer Chains ◽  
Thin Polymer Films ◽  
Solvent Vapor ◽  
X Ray Scattering ◽  
Thin Polymer

Thin polymer films and coatings are used to tailor the properties of surfaces in various applications such as protection against corrosion, biochemical functionalities or electronic resistors. Polymer brushes are a certain kind of thin polymer films, where polymer chains are covalently grafted to a substrate and straighten up to form a brush structure. Here we report on differences and similarities between polymer brushes and spin-coated polymer films from polystyrene and polymethyl methacrylate with special emphasis on surface roughness and roughness correlation. The phenomenon of roughness correlation or conformality describes the replication of the roughness profile from the substrate surface to the polymer surface. It is of high interest for polymer physics of brush layers as well as applications, in which a homogeneous polymer layer thickness is required. We demonstrate that spin-coated films as well as polymer brushes show roughness correlation, but in contrast to spin-coated films, the correlation in brushes is stable to solvent vapor annealing. Roughness correlation is therefore an intrinsic property of polymer brushes.

Novel Technique for Measuring Through-Plane Thermo-Mechanical Properties of Thin Polymer Films

1998 ◽  
Vol 511 ◽  
Author(s):  
K. S. Patel ◽  
Sue Ann bidstrup-Allen ◽  
P. A. Kohl ◽  
T. C. HODGE
Keyword(s):  
Polymer Films ◽  
Mechanical Design ◽  
Coefficient Of Thermal Expansion ◽  
Compression Modulus ◽  
Polymer Chains ◽  
Thin Polymer Films ◽  
Electrode Structure ◽  
Thin Polymer ◽  
Characterization Of Properties ◽  
A New Technique

ABSTRACTPolymer thin films (less than 20 ltm) are widely used as coatings and inter-level dielectrics in microelectronic applications. In multi-layer structures, stresses generated in the films due to interaction with adjacent layers and solvent evaporation induced shrinkage, cause the polymer chains to orient in the plane of the film resulting in anisotropic film properties. Characterization of properties in all directions is essential for accurate electrical and mechanical design and modeling.A new technique has been developed to measure, in-situ, the through-plane (z) properties of thin polymer films. A parallel plate capacitor device and an interdigitated electrode structure were used as sensors to detect changes in dielectric constant and thickness of thin polymer films under thermal or mechanical loading. The through-plane compression modulus and coefficient of thermal expansion were calculated and results are reported for benzocyclobutene (BCB) films.

Solvent-Vapor-Assisted Dewetting of Prepatterned Thin Polymer Films: Control of Morphology, Order, and Pattern Miniaturization

Langmuir ◽  
2015 ◽  
Vol 31 (10) ◽  
pp. 3203-3214 ◽  
Author(s):  
Nandini Bhandaru ◽  
Partho Sarathi Goohpattader ◽  
Danish Faruqui ◽  
Rabibrata Mukherjee ◽  
Ashutosh Sharma
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
Solvent Vapor ◽  
Thin Polymer

Glass transition behaviour of thin polymer films coated on the 3D networks of porous CNT sponges

2020 ◽  
Vol 22 (37) ◽  
pp. 21297-21306
Author(s):  
Min Wang ◽  
Jiapeng Zhang ◽  
Shenglin Zhou ◽  
Zhaohui Yang ◽  
Xiaohua Zhang
Keyword(s):  
Glass Transition ◽  
Free Surface ◽  
Polymer Films ◽  
Polymer Chains ◽  
Polymer Substrate ◽  
Thin Polymer Films ◽  
Substrate Interface ◽  
Thin Polymer ◽  
Transition Behaviour ◽  
3D Networks

The influence of the coexistence of a free surface and a polymer–substrate interface on the glass transition behaviour of polymer chains on CNT sidewalls.

scholarly journals Mapping the Structural Order of Laser-Induced Periodic Surface Structures in Thin Polymer Films by Microfocus Beam Grazing Incidence Small-Angle X-ray Scattering

2015 ◽  
Vol 7 (5) ◽  
pp. 3162-3169 ◽  
Author(s):  
Ignacio Martín-Fabiani ◽  
Esther Rebollar ◽  
Mari Cruz García-Gutiérrez ◽  
Daniel R. Rueda ◽  
Marta Castillejo ◽  
...  
Keyword(s):  
Polymer Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Surface Structures ◽  
Thin Polymer Films ◽  
Periodic Surface ◽  
X Ray ◽  
Structural Order ◽  
X Ray Scattering ◽  
Thin Polymer

Lattice Orientations of Evaporated Metals onto Uniaxially Oriented, Semicrystalline, Ultra thin Polymer Films

1992 ◽  
Vol 280 ◽  
Author(s):  
Klaus D. Jandt ◽  
Maren Buhk ◽  
Jürgen Petermann ◽  
Lukas M. Eng ◽  
Harald Fuchs
Keyword(s):  
Polymer Films ◽  
Bulk Material ◽  
Polymer Surface ◽  
Scanning Force Microscopy ◽  
Thin Polymer Films ◽  
Surface Steps ◽  
Thin Polymer ◽  
Polymer Metal ◽  
Scanning Force ◽  
Layer I

ABSTRACTThe textured oriented overgrowth (epitaxy) of certain metals evaporated onto substrates consisting of highly oriented ultra thin polymer films of polyethylene (PE), polypropylene (PP) and polybutene-1 (PB-1) has been well known since a few years. However, the origin of the observed epitaxy is not clear at all: graphoepitaxy (i. e. orientation induced by nucleation onto oriented topographic features of the substrate), the formation of a chemical layer (i. e. of metal-methyl groups building up the polymer-metal interface, or simply classic epitaxy (i.e. lattice matching) seem all to be possible explanations for the observed orientations. Here, we used Transmission Electron Microscopy (TEM) and Scanning Force Microscopy (SFM) to investigate the possibility of graphoepitaxial growth on polymeric surfaces. Our investigations show that the morphology of polymeric bulk material determine the topographic properties observed at the polymer surface. The semicrystalline nature of the polymer films leads to polymeric surface steps which are suitable as locations for graphoepitaxial growth. Artificial epitaxy (graphoepitaxy) seems to be the most likely orientation mechanism.

scholarly journals Measurement of the interior structure of thin polymer films using grazing incidence diffuse x-ray scattering

2010 ◽  
Vol 82 (1) ◽  
Author(s):  
M. K. Mukhopadhyay ◽  
L. B. Lurio ◽  
Z. Jiang ◽  
X. Jiao ◽  
Michael Sprung ◽  
...  
Keyword(s):  
Polymer Films ◽  
Grazing Incidence ◽  
Interior Structure ◽  
Thin Polymer Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Thin Polymer ◽  
Ray Scattering

scholarly journals Structure and dynamics of thin polymer films using synchrotron X-ray scattering

2007 ◽  
Vol 40 (s1) ◽  
pp. s18-s22 ◽  
Author(s):  
Zhang Jiang ◽  
Hyunjung Kim ◽  
Heeju Lee ◽  
Young Joo Lee ◽  
Xuesong Jiao ◽  
...  
Keyword(s):  
Polymer Films ◽  
Thin Polymer Films ◽  
X Ray ◽  
Structure And Dynamics ◽  
X Ray Scattering ◽  
Thin Polymer ◽  
Ray Scattering
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