scholarly journals Characterization of Green Paints in Ming and Qianlong Dynasties’ Lin’xi Pavilion by Complimentary Techniques

Molecules ◽  
2021 ◽  
Vol 26 (2) ◽  
pp. 266
Author(s):  
Marcie B. Wiggins ◽  
Mengyu Liu ◽  
Catherine Matsen ◽  
Chang Liu ◽  
Karl S. Booksh
Keyword(s):  
Cross Sections ◽  
Secondary Ion Mass Spectrometry ◽  
Inorganic Materials ◽  
Unique Case ◽  
Ming And Qing Dynasties ◽  
Time Periods ◽  
Architectural Paint ◽  
Secondary Ion

During conservation of the painted ceiling decoration of Lin’xi Pavilion in the Forbidden City, two distinct paint campaigns were isolated as a unique case study into architectural paint materials during both the Ming and Qing dynasties. Paint samples and cross sections from both paint generations were analyzed with SEM-EDX, time of flight-secondary ion mass spectrometry (ToF-SIMS), XRD, FTIR, and Raman spectroscopies. Similar organic and inorganic materials characteristic of these time periods were identified. The pigments of interest found in both paint generations were botallackite and atacamite polymorphs. This suggests a shift from natural mineral sources to synthetic copper-based pigments for these larger architectural projects.

Non-resonant multi- and single-photon ionization for the chemical characterization of surfaces

1992 ◽  
Vol 50 (2) ◽  
pp. 1554-1555
Author(s):  
David G. Welkie
Keyword(s):  
Chemical Analysis ◽  
Electron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Single Photon ◽  
Chemical Characterization ◽  
Molecular Structures ◽  
Inorganic Materials ◽  
Photon Ionization ◽  
Secondary Ion

The chemical analysis of surfaces, where the ‘surface’ of a sample refers to the top few monolayers, is most commonly performed using the techniques of Auger electron spectroscopy (AES), secondary ion mass spectrometry (SIMS), and/or electron spectroscopy for chemical analysis (ESCA). For inorganic materials, AES is especially advantageous for quantitative elemental surface analysis at high spatial resolution. At lower spatial resolutions, SIMS generally provides the highest sensitivity, although quantitative interpretation of the results is often difficult or impossible. The primary reason for such difficulties is that the SIMS signal often depends more strongly on the nature of the local chemical environment at the analysis site than on the concentration of the species that is generating the signal. This is commonly referred to as the SIMS ‘matrix effect’.For organic materials, both ESCA and SIMS are used to obtain information on the chemical structure at surfaces. While ESCA can provide unique information on the nature of the chemical bonds between species at a surface, SIMS can provide complementary information on the molecular structures that are present.

Laser ablation and static secondary ion mass spectrometry capabilities in the characterization of inorganic materials

2002 ◽  
Vol 186 (1-4) ◽  
pp. 315-321 ◽  
Author(s):  
Frédéric Aubriet ◽  
Claude Poleunis ◽  
Nouari Chaoui ◽  
Benoı̂t Maunit ◽  
Eric Millon ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Laser Ablation ◽  
Secondary Ion Mass Spectrometry ◽  
Inorganic Materials ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

scholarly journals Time-of-Flight Secondary Ion Mass Spectrometry Imaging of Cross Sections from the Bacchanals Paintings of Nicolas Poussin

2021 ◽  
Vol 93 (10) ◽  
pp. 4463-4471
Author(s):  
Caroline Bouvier ◽  
Helen Glanville ◽  
Laurence de Viguerie ◽  
Chiara Merucci ◽  
Philippe Walter ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Cross Sections ◽  
Mass Spectrometry Imaging ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Ion Mass Spectrometry ◽  
Nicolas Poussin ◽  
Secondary Ion
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