scholarly journals In Situ Monitoring of Microwave Processing of Materials at High Temperatures through Dielectric Properties Measurement

Materials ◽  
2016 ◽  
Vol 9 (5) ◽  
pp. 349 ◽  
Author(s):  
Beatriz Garcia-Baños ◽  
Jose Catalá-Civera ◽  
Felipe Peñaranda-Foix ◽  
Pedro Plaza-González ◽  
Gabriel Llorens-Vallés
Keyword(s):  
Dielectric Properties ◽  
High Temperatures ◽  
Microwave Processing ◽  
In Situ Monitoring

scholarly journals Photoluminescence from GaN layers at high temperatures as a candidate for in situ monitoring in MOVPE

2014 ◽  
Vol 397 ◽  
pp. 24-28 ◽  
Author(s):  
C. Prall ◽  
M. Ruebesam ◽  
C. Weber ◽  
M. Reufer ◽  
D. Rueter
Keyword(s):  
High Temperatures ◽  
In Situ Monitoring

Visual in-situ monitoring of the behavior and phase states of water-hydrocarbon inclusions at high temperatures and pressures

Petrology ◽  
2011 ◽  
Vol 19 (7) ◽  
pp. 653-674 ◽  
Author(s):  
V. S. Balitsky ◽  
S. V. Penteley ◽  
L. V. Balitskaya ◽  
M. A. Novikova ◽  
T. M. Bublikova
Keyword(s):  
High Temperatures ◽  
In Situ Monitoring

In situ REM imaging of surface processes on ceramic bulk crystals from 300 to 1670 K in a conventional TEM

1991 ◽  
Vol 49 ◽  
pp. 660-661
Author(s):  
Z. L. Wang ◽  
J. Bentley
Keyword(s):  
High Temperatures ◽  
Image Resolution ◽  
Atomic Processes ◽  
Crystal Surfaces ◽  
Beam Radiation ◽  
Surface Areas ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Gas Reactions

Studying the behavior of surfaces at high temperatures is of great importance for understanding the properties of ceramics and associated surface-gas reactions. Atomic processes occurring on bulk crystal surfaces at high temperatures can be recorded by reflection electron microscopy (REM) in a conventional transmission electron microscope (TEM) with relatively high resolution, because REM is especially sensitive to atomic-height steps.Improved REM image resolution with a FEG: Cleaved surfaces of a-alumina (012) exhibit atomic flatness with steps of height about 5 Å, determined by reference to a screw (or near screw) dislocation with a presumed Burgers vector of b = (1/3)<012> (see Fig. 1). Steps of heights less than about 0.8 Å can be clearly resolved only with a field emission gun (FEG) (Fig. 2). The small steps are formed by the surface oscillating between the closely packed O and Al stacking layers. The bands of dark contrast (Fig. 2b) are the result of beam radiation damage to surface areas initially terminated with O ions.

scholarly journals Development of an electrochemical sensor for in-situ monitoring of reactive species produced by cold physical plasma

2021 ◽  
Vol 326 ◽  
pp. 129007
Author(s):  
Zahra Nasri ◽  
Giuliana Bruno ◽  
Sander Bekeschus ◽  
Klaus-Dieter Weltmann ◽  
Thomas von Woedtke ◽  
...  
Keyword(s):  
Electrochemical Sensor ◽  
Reactive Species ◽  
In Situ Monitoring ◽  
Physical Plasma

In situ synthesis of Mn3O4/graphene nanocomposite and its application as a lubrication additive at high temperatures

2021 ◽  
Vol 546 ◽  
pp. 149019
Author(s):  
Bao Jin ◽  
Jun Zhao ◽  
Guangyan Chen ◽  
Yongyong He ◽  
Yiyao Huang ◽  
...  
Keyword(s):  
High Temperatures ◽  
In Situ Synthesis ◽  
Graphene Nanocomposite ◽  
Lubrication Additive

In Situ Monitoring of Polaron Localization and Cell Activity with Charge Accumulation Spectroscopy

2021 ◽  
pp. 2105799
Author(s):  
Yu Zhang ◽  
Li Yang ◽  
Jintao Wang ◽  
Wangying Xu ◽  
Qiming Zeng ◽  
...  
Keyword(s):  
Cell Activity ◽  
In Situ Monitoring ◽  
Charge Accumulation
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