scholarly journals Chiral Nematic Structure of Cellulose Nanocrystal Suspensions and Films; Polarized Light and Atomic Force Microscopy

Materials ◽  
2015 ◽  
Vol 8 (11) ◽  
pp. 7873-7888 ◽  
Author(s):  
Derek Gray ◽  
Xiaoyue Mu
Keyword(s):  
Atomic Force Microscopy ◽  
Polarized Light ◽  
Cellulose Nanocrystal ◽  
Force Microscopy ◽  
Atomic Force ◽  
Chiral Nematic ◽  
Chiral Nematic Structure

Collapse and Self-Reconstruction of Mesoscopic Architectures of Supramolecular J Aggregates in Solution: From Strings to Tubular Rods

2004 ◽  
Vol 1 (3) ◽  
pp. 280-287 ◽  
Author(s):  
Hiroshi Yao ◽  
Chris Michaels ◽  
Stephan Stranick ◽  
Takeshi Isohashi ◽  
Keisaku Kimura
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Light Microscopy ◽  
Near Field ◽  
Polarized Light ◽  
Force Microscopy ◽  
Atomic Force ◽  
J Aggregates ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning

: This Letter reports the collapse and subsequent self-reassembly of mesoscopic architectures of supramolecular J aggregates in solution. Ultrasonication of the string-like 5,5-dichloro-3,3-disulfopropyl thiacyanine (TC) J aggregates caused fragmentation (collapse) of the initial morphology, followed by a prompt self-reconstruction into mesoscopic rod-like architectures. Fluorescence microscopy, polarized light microscopy, atomic force microscopy and near-field scanning optical microscopy revealed that the apparent rod-like morphology was a tubular architecture with a monomolecular wall (single-wall) and open ends.

Investigation of TiO2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy

2012 ◽  
Vol 527 ◽  
pp. 154-158 ◽  
Author(s):  
Kristaps Rubenis ◽  
Karlis Kundzins ◽  
Janis Locs ◽  
Jurijs Ozolins
Keyword(s):  
Electrical Conductivity ◽  
Atomic Force Microscopy ◽  
Polarized Light ◽  
Ceramic Surface ◽  
Atmospheric Conditions ◽  
X Ray Diffraction ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Microscopy Technique ◽  
Atomic Force

Dense TiO2 (rutile) ceramic samples were prepared by sintering compacts of titanium dioxide anatase powder at 1500 °C for 5h. Sintered samples were polished and annealed in vacuum at 1000 °C for 1h. Structural properties of the samples were studied by X-ray diffraction, polarized light and scanning electron microscopy. The surface topography and local electrical conductivity of the samples were investigated by atomic force microscopy technique under atmospheric conditions. Enhanced electrical conductivity was observed at grain boundaries while the polished, vacuum annealed grains surface showed non-homogeneous conductivity.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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