scholarly journals Spinning Carbon Nanotube Nanothread under a Scanning Electron Microscope

Materials ◽  
2011 ◽  
Vol 4 (9) ◽  
pp. 1519-1527 ◽  
Author(s):  
Weifeng Li ◽  
Chaminda Jayasinghe ◽  
Vesselin Shanov ◽  
Mark Schulz
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Electron

Advancement in fabrication of carbon nanotube tip for atomic force microscope using multi-axis nanomanipulator in scanning electron microscope

2022 ◽  
Author(s):  
Sanjeev Kumar Kanth ◽  
Anjli Sharma ◽  
Byong Chon Park ◽  
Woon Song ◽  
Hyun Rhu ◽  
...  
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Atomic Force Microscope ◽  
Structural Integrity ◽  
Ion Beam ◽  
Rectilinear Motion ◽  
Atomic Force ◽  
Scanning Electron

Abstract We have constructed a new nanomanipulator (NM) in a field emission scanning electron microscope (FE-SEM) to fabricate carbon nanotube (CNT) tip to precisely adjust the length and attachment angle of CNT onto the mother atomic force microscope (AFM) tip. The new NM is composed of 2 modules, each of which has the degree of freedom of three-dimensional rectilinear motion x, y and z and one-dimensional rotational motion θ. The NM is mounted on the stage of a FE-SEM. With the system of 14 axes in total which includes 5 axes of FE-SEM and 9 axes of nano-actuators, it was possible to see CNT tip from both rear and side view about the mother tip. With the help of new NM, the attachment angle error could be reduced down to 0º as seen from both the side and the rear view, as well as, the length of the CNT could be adjusted with the precision using electron beam induced etching. For the proper attachment of CNT on the mother tip surface, the side of the mother tip was milled with focused ion beam. In addition, electron beam induced deposition was used to strengthen the adhesion between CNT and the mother tip. In order to check the structural integrity of fabricated CNT, transmission electron microscope image was taken which showed the fine cutting of CNT and the clean surface as well. Finally, the performance of the fabricated CNT tip was demonstrated by imaging 1-D grating and DNA samples with atomic force microscope in tapping mode.

Highly sensitive compression sensors using three-dimensional printed polydimethylsiloxane/carbon nanotube nanocomposites

2019 ◽  
Vol 30 (8) ◽  
pp. 1216-1224 ◽  
Author(s):  
Mohammad Charara ◽  
Mohammad Abshirini ◽  
Mrinal C Saha ◽  
M Cengiz Altan ◽  
Yingtao Liu
Keyword(s):  
Carbon Nanotubes ◽  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Three Dimensional ◽  
Multi Walled Carbon Nanotube ◽  
Highly Sensitive ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes ◽  
Scanning Electron

This article presents three-dimensional printed and highly sensitive polydimethylsiloxane/multi-walled carbon nanotube sensors for compressive strain and pressure measurements. An electrically conductive polydimethylsiloxane/multi-walled carbon nanotube nanocomposite is developed to three-dimensional print compression sensors in a freestanding and layer-by-layer manner. The dispersion of multi-walled carbon nanotubes in polydimethylsiloxane allows the uncured nanocomposite to stand freely without any support throughout the printing process. The cross section of the compression sensors is examined under scanning electron microscope to identify the microstructure of nanocomposites, revealing good dispersion of multi-walled carbon nanotubes within the polydimethylsiloxane matrix. The sensor’s sensitivity was characterized under cyclic compression loading at various max strains, showing an especially high sensitivity at lower strains. The sensing capability of the three-dimensional printed nanocomposites shows minimum variation at various applied strain rates, indicating its versatile potential in a wide range of applications. Cyclic tests under compressive loading for over 8 h demonstrate that the long-term sensing performance is consistent. Finally, in situ micromechanical compressive tests under scanning electron microscope validated the sensor’s piezoresistive mechanism, showing the rearrangement, reorientation, and bending of the multi-walled carbon nanotubes under compressive loads, were the main reasons that lead to the piezoresistive sensing capabilities in the three-dimensional printed nanocomposites.

Calibration of Carbon Nanotube Probes for Pico-Newton Order Force Measurement Inside a Scanning Electron Microscope

2004 ◽  
Vol 16 (2) ◽  
pp. 155-162 ◽  
Author(s):  
Masahiro Nakajima ◽  
◽  
Fumihito Arai ◽  
Lixin Dong ◽  
Toshio Fukuda
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Elastic Moduli ◽  
Force Measurement ◽  
Ultrasonic Waves ◽  
Copper Electrodes ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Scanning Electron

A method is presented for pico-Newton (pN) order force measurement using a carbon nanotube (CNT) probe, which is calibrated by electromechanical resonance. A CNT probe is constructed by attaching a CNT to the end of a tungsten needle or an atomic force microscope (AFM) cantilever using nanorobotic manipulators inside a field-emission scanning electron microscope (FE-SEM). Conductive electron-beam-induced deposition (EBID) is used for the fixation of CNTs with an internal vaporized precursor W(CO)6. For manipulating them easily and quickly, CNTs are dispersed in ethanol by ultrasonic waves and oriented on copper electrodes by electrophoresis. The elastic moduli of CNT probes are calibrated for use as a force measurement probe by electrically exciting at fundamental frequency. We analyzed the resolution of force measurement using a CNT probe. This force measurement can be used to characterize the mechanical properties of nanostructures and to measure friction or exfoliation forces in nanometer order.

scholarly journals Stable Operating Condition of Carbon Nanotube Field Electron Emitter for Small Size Scanning Electron Microscope

Shinku ◽  
2007 ◽  
Vol 50 (6) ◽  
pp. 448-451
Author(s):  
Hiroshi SUGA ◽  
Teruaki OHNO ◽  
Miyuki TANAKA ◽  
Yasushiro NISHIOKA ◽  
Hiroshi TOKUMOTO ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Operating Condition ◽  
Electron Emitter ◽  
Field Electron ◽  
Stable Operating ◽  
Scanning Electron

scholarly journals Engineered nanostructures to carry the biological ligands

2018 ◽  
Vol 150 ◽  
pp. 06002 ◽  
Author(s):  
Subash C.B. Gopinath ◽  
Santheraleka Ramanathan ◽  
Koh Hann Suk ◽  
Mu Ee Foo ◽  
Periasamy Anbu ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Agar Plate ◽  
The Other ◽  
Inhibition Assay ◽  
Single Walled Carbon Nanotube ◽  
Cow Urine ◽  
Herbal Plants ◽  
Scanning Electron

Different nanostructures were engineered with the nanoscale dimension lesser than 100 nm. These nanostructures include silver, cellulose nanoparticles and single-walled carbon nanotube (SWCNT). Biological ligands were obtained from the medicinally important herbal plants, such as Solanum trilobatum and Hempedu bumi and conjugated with the nanostructures silver nanoparticle and SWCNT, respectively. On the other hand, bio-ligands from cow urine were encapsulated in the cellulose nanoparticle. To confirm morphology these nanostructures, they were observed under Field Emission Scanning Electron Microscope and the results displayed the uniformed nanostructures. Further, biological ligand carrying ability of these nanostructures was confirmed by the bacterial inhibition assay on the agar plate. This study provided the evidence on the capability of nanostructures to carry the biological ligands.

Carbon-Nanotube Engineering for Probes and Tweezers Operating in Scanning Probe Microscope

2003 ◽  
Vol 772 ◽  
Author(s):  
Yoshikazu Nakayama ◽  
Seiji Akita
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Knife Edge ◽  
Maximum Current ◽  
Probe Microscope ◽  
Carbon Nanotube Devices ◽  
Scanning Electron

AbstractWe have developed a series of processes for preparing carbon nanotube devices of probes and tweezers that operate in scanning probe microscope (SPM). The main developments are a nanotube cartridge where nanotubes are aligned at a knife-edge to be easily picked up one by one and a scanning-electron-microscope manipulator by which a nanotube is transferred from the nanotube cartridge onto a Si tip under observing its view.We have also developed the electron ablation of a nanotube to adjust its length and the sharpening of a multiwall nanotube to have its inner layer with or without an end cap at the tip. For the sharpening process, the free end of a nanotube protruded from the cartridge was attached onto a metal-coated Si tip and the voltage was applied to the nanotube. At a high voltage giving the saturation of current, the current decreased stepwise in the temporal variation, indicating the sequential destruction of individual nanotube layers. The nanotube was finally cut at the middle of the nanotube bridge, and its tip was sharpened to have an inner layer with an opened end. Moving up the cartridge before cutting enables us to extract the inner layer with an end cap.It is evidenced that the maximum current at each layer during the stepwise decrease depends on its circumference, and the force for extracting the inner layer with ∼ 5nm diameter is ∼ 4 nN.

Tensile Test of Individual Multi Walled Carbon Nanotube Using Nano-Manipulator inside Scanning Electron Microscope

2006 ◽  
Vol 326-328 ◽  
pp. 329-332 ◽  
Author(s):  
Hoon Sik Jang ◽  
Sung Hwan Kwon ◽  
Am Kee Kim ◽  
Seung Hoon Nahm
Keyword(s):  
Electron Microscope ◽  
Carbon Nanotube ◽  
Scanning Electron Microscope ◽  
Tensile Test ◽  
Force Sensor ◽  
Displacement Curve ◽  
Linear Deformation ◽  
Deformation And Fracture ◽  
Multi Walled Carbon Nanotube ◽  
Scanning Electron

We have attempted to observe straining responses of an individual multi-walled carbon nanotube (MWNT) by performing an in-situ tensile testing inside scanning electron microscope (SEM). The both ends of an individual MWNT was attached on the rigid support and the tip of the force sensor using electron beam and was elongated by a nano-manipulator. The nano-manipulator was automatically controlled by personal computer. Linear deformation and fracture behaviors of MWNT were successfully observed and its force-displacement curve was also measured from the bending stiffness and displacement of the force sensor and manipulator. The tensile properties of individual MWNT were evaluated from the tensile test results.

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