scholarly journals Impact of Annealing on Magnetic Properties and Structure of Co40Fe40W20 Thin Films on Si(100) Substrate

Materials ◽  
2021 ◽  
Vol 14 (11) ◽  
pp. 3017
Author(s):  
Wen-Jen Liu ◽  
Yung-Huang Chang ◽  
Yuan-Tsung Chen ◽  
Tian-Yi Jhou ◽  
Ying-Hsuan Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Magnetic Properties ◽  
Magnetic Layer ◽  
Low Frequency ◽  
X Ray Diffraction ◽  
Good Thermal Stability ◽  
Annealing Conditions ◽  
Thermal Disturbance ◽  
Alternative Current

Co40Fe40W20 monolayers of different thicknesses were deposited on Si(100) substrates by DC magnetron sputtering, with Co40Fe40W20 thicknesses from 10 to 50 nm. Co40Fe40W20 thin films were annealed at three conditions (as-deposited, 250 °C, and 350 °C) for 1 h. The structural and magnetic properties were then examined by X-ray diffraction (XRD), low-frequency alternative-current magnetic susceptibility (χac), and an alternating-gradient magnetometer (AGM). The XRD results showed that the CoFe (110) peak was located at 2θ = 44.6°, but the metal oxide peaks appeared at 2θ = 38.3, 47.6, 54.5, and 56.3°, corresponding to Fe2O3 (320), WO3 (002), Co2O3 (422), and Co2O3 (511), respectively. The saturation magnetization (Ms) was calculated from the slope of the magnetization (M) versus the CoFeW thickness. The Ms values calculated in this manner were 648, 876, 874, and 801 emu/cm3 at the as-deposited condition and post-annealing conditions at 250, 350, and 400 °C, respectively. The maximum MS was about 874 emu/cm3 at a thickness of 50 nm following annealing at 350 °C. It indicated that the MS and the χac values rose as the CoFeW thin films’ thickness increased. Owing to the thermal disturbance, the MS and χac values of CoFeW thin films after annealing at 350 °C were comparatively higher than at other annealing temperatures. More importantly, the Co40Fe40W20 films exhibited a good thermal stability. Therefore, replacing the magnetic layer with a CoFeW film improves thermal stability and is beneficial for electrode and strain gauge applications.

MICROSTRUCTURE AND MAGNETIC PROPERTIES OF GRANULAR CoPtCr-SiO2 FILMS ON Ru SEED LAYER

2007 ◽  
Vol 21 (06) ◽  
pp. 357-363
Author(s):  
CHUN-TAO XIAO ◽  
YUKI INABA ◽  
TAKEHITO SHIMATSU ◽  
HIROAKI MURAOKA
Keyword(s):  
Thermal Stability ◽  
Magnetic Properties ◽  
Epitaxial Growth ◽  
Seed Layer ◽  
Magnetic Layer ◽  
Micro Structure ◽  
Good Thermal Stability ◽  
Magnetic Parameters ◽  
High Anisotropy ◽  
Microstructure And Magnetic Properties

Granular-type [( Co 90 Cr 10)85 Pt 15]89.8-[ SiO 2]10.2 films were prepared by using co-sputtering methods, with Ru as a seed layer. Influences of Ru thickness on the micro-structure and magnetic properties of the CoPtCr-SiO 2 magnetic layer were investigated. It was found that the seed layer obviously effected the grain isolation, c-axis distribution and magnetic parameters. The Ru seed layer with a suitable thickness is very helpful for achievement of high anisotropy, proper coercivity and high squareness. The anisotropy energy of the magnetic layer can be as high as 5×106 erg/cm 3 or more, even with a thin Ru layer, promising good thermal stability. It was noted that the Ru layer markedly enhanced the isolation of CoPtCr grains, corresponding to the increase of coercivity and the decrease of loop slope. Moreover, it was also revealed that the addition of SiO 2 to CoPtCr effectively isolated the CoPtCr grains without disturbing the epitaxial growth of CoPtCr grains on the Ru seed layer.

A thermally stable three-dimensional cobalt(II) coordination polymer based on the V-shaped ligand 4-(4-carboxyphenoxy)isophthalate

2018 ◽  
Vol 74 (9) ◽  
pp. 1032-1037 ◽  
Author(s):  
Shao-Dong Li ◽  
Li-Ping Lu ◽  
Miao-Li Zhu
Keyword(s):  
Thermal Stability ◽  
Magnetic Properties ◽  
Coordination Polymer ◽  
Room Temperature ◽  
Three Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Good Thermal Stability ◽  
Secondary Building Units ◽  
Point Symbol

A new cobalt(II) coordination polymer (CP), poly[[bis[μ6-4-(4-carboxylatophenoxy)benzene-1,3-dicarboxylato-κ6 O 1:O 1:O 3:O 3′:O 4:O 4′]bis(1,10-phenanthroline-κ2 N,N′)tricobalt(II)] 0.72-hydrate], {[Co3(C15H7O7)2(C12H8N2)2]·0.72H2O} n , (I), is constructed from CoII ions and 4-(4-carboxyphenoxy)isophthalate (cpoia3−) and 1,10-phenanthroline (phen) ligands. Based on centrosymmetric trinuclear [Co3(phen)2(COO)6] secondary building units (SBUs), the structure of (I) is a three-dimensional CP with a (3,6)-connected net and point symbol (42.6)2(44.62.87.102). The positions of four [Co3(phen)2(COO)6] SBUs and four cpoia3− ligands reproduce a Chinese-knot-shaped arrangement along the ab plane. (I) has been characterized by single-crystal X-ray diffraction, IR spectroscopy, powder X-ray diffraction (PXRD) and thermostability analysis. It shows a good thermal stability from room temperature to 673 K. In addition, the temperature dependence of the magnetic properties was measured.

scholarly journals Influence of Li2CO3 addition on electrical and magnetic properties of Ni0.6Mg0.4Fe2O4

2020 ◽  
Vol 10 (03) ◽  
pp. 2050003
Author(s):  
M. R. Hassan ◽  
M. T. Islam ◽  
M. N. I. Khan
Keyword(s):  
Magnetic Properties ◽  
Single Phase ◽  
Low Frequency ◽  
Solid State Reaction Method ◽  
Charge Carriers ◽  
X Ray Diffraction ◽  
X Ray ◽  
Electrical And Magnetic Properties ◽  
Frequency Regime ◽  
Xrd Patterns

In this research, influence of adding Li2CO3 (at 0%, 2%, 4%, 6%) on electrical and magnetic properties of [Formula: see text][Formula: see text]Fe2O4 (with 60% Ni and 40% Mg) ferrite has been studied. The samples are prepared by solid state reaction method and sintered at 1300∘C for 6[Formula: see text]h. X-ray diffraction (XRD) patterns show the samples belong to single-phase cubic structure without any impurity phase. The magnetic properties (saturation magnetization and coercivity) of the samples have been investigated by VSM and found that the higher concentration of Li2CO3 reduces the hysteresis loss. DC resistivity increases with Li2CO3 contents whereas it decreases initially and then becomes constant at lower value with temperature which indicates that the studied samples are semiconductor. The dielectric dispersion occurs at a low-frequency regime and the loss peaks are formed in a higher frequency regime, which are due to the presence of resonance between applied frequency and hopping frequency of charge carriers. Notably, the loss peaks are shifted to the lower frequency with Li2CO3 additions.

Thermal stability and miscibility of co-evaporated methyl ammonium lead halide (MAPbX3, X = I, Br, Cl) thin films analysed by in situ X-ray diffraction

2018 ◽  
Vol 6 (24) ◽  
pp. 11496-11506 ◽  
Author(s):  
Paul Pistor ◽  
Thomas Burwig ◽  
Carlo Brzuska ◽  
Björn Weber ◽  
Wolfgang Fränzel
Keyword(s):  
Thin Films ◽  
Thermal Stability ◽  
Thermal Treatment ◽  
Phase Evolution ◽  
X Ray Diffraction ◽  
Crystalline Phases ◽  
X Ray ◽  
Subsequent Thermal Treatment ◽  
Lead Halide

We present the identification of crystalline phases by in situ X-ray diffraction during growth and monitor the phase evolution during subsequent thermal treatment of CH3NH3PbX3 (X = I, Br, Cl) perovskite thin films.

Microstructure and Properties of (Tb,Sm)CoSi/Cr Series Thin Films for Permanent Magnets

2007 ◽  
Vol 121-123 ◽  
pp. 267-270 ◽  
Author(s):  
X. Wang ◽  
Z.Y. Li ◽  
X. Yu ◽  
S. Su ◽  
J. Li
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Permanent Magnets ◽  
Magnetic Layer ◽  
Lattice Matching ◽  
Microstructure And Properties ◽  
N2 Atmosphere ◽  
Magnetic Layers

The microstructures and properties of (Tb,Sm)CoSi/Cr series films have been investigated. All the samples were sputtered and annealed at 500 °C for 25 min in pure N2 atmosphere, and their microstructures and properties were examined. The effect on the magnetic properties of partial Sm substituted by Tb is discussed. The lattice matching media were examined. And the mechanisms of interactions among the grains and between the magnetic layers have been analyzed by comparing multi magnetic layer with the mono magnetic layer.

Effect of annealing conditions on structural and magnetic properties of laser ablated copper ferrite thin films

2012 ◽  
Vol 324 (10) ◽  
pp. 1814-1817 ◽  
Author(s):  
A.T. Raghavender ◽  
Nguyen Hoa Hong ◽  
Chulkwon Park ◽  
Myung-Hwa Jung ◽  
Kyu Joon Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Copper Ferrite ◽  
Annealing Conditions ◽  
Structural And Magnetic Properties ◽  
Ferrite Thin Films

Co3Pt Nanocomposite Films for Perpendicular Magnetic Recording Media

2010 ◽  
Vol 123-125 ◽  
pp. 27-30 ◽  
Author(s):  
Chih Long Shen ◽  
Po Cheng Kuo ◽  
S.C. Chen ◽  
C.D. Chen ◽  
S.L. Hsu ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Process Parameters ◽  
Magnetic Recording ◽  
Magnetic Layer ◽  
Nanocomposite Films ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Perpendicular Magnetic Recording ◽  
Significant Potential

The Co3Pt magnetic layer with thickness of 7~28 nm was deposited onto the Pt underlayer. The as-deposited Co3Pt/Pt double-layered films with or without a 5 nm Pt capped layer were annealed at temperatures between 275 and 375 °C in vacuum of 1 mTorr. The influences of process parameters on perpendicular magnetic properties of Co3Pt thin films were investigated. The Co3Pt film with perpendicular coercivity (Hc⊥) value of 3620 Oe and the perpendicular squareness (S⊥) of 0.7 could be achieved from the Co3Pt(18 nm)/Pt(100 nm) double-layered films by annealing at 300°C. Further added Tb30Co70 film on the Co3Pt/Pt double-layered film could greatly enhance the perpendicular magnetic properties of the film. The Hc⊥ and S⊥ of the Tb30Co70/Co3Pt/Pt film were as high as 6560 Oe and 0.88, respectively, which has significant potential to be applied in perpendicular magnetic recording media.

TEM Study of FePt and FePt:C/FePt Composite Double-Layered Thin Films

2013 ◽  
Vol 275-277 ◽  
pp. 1952-1955
Author(s):  
Ling Fang Jin ◽  
Xing Zhong Li
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Grain Size ◽  
Magnetic Properties ◽  
Composite Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

New functional nanocomposite FePt:C thin films with FePt underlayers were synthesized by noneptaxial growth. The effect of the FePt layer on the ordering, orientation and magnetic properties of the composite layer has been investigated by adjusting FePt underlayer thickness from 2 nm to 14 nm. Transmission electron microscopy (TEM), together with x-ray diffraction (XRD), has been used to check the growth of the double-layered films and to study the microstructure, including the grain size, shape, orientation and distribution. XRD scans reveal that the orientation of the films was dependent on FePt underlayer thickness. In this paper, the TEM studies of both single-layered nonepitaxially grown FePt and FePt:C composite L10 phase and double-layered deposition FePt:C/FePt are presented.

scholarly journals Structural and Magnetic Properties of FePd Thin Film Synthesized by Electrodeposition Method

Materials ◽  
2020 ◽  
Vol 13 (6) ◽  
pp. 1454
Author(s):  
Gabriele Barrera ◽  
Federico Scaglione ◽  
Matteo Cialone ◽  
Federica Celegato ◽  
Marco Coïsson ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Magnetic Properties ◽  
Deposition Time ◽  
Magnetic Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fundamental Properties ◽  
Magnetic Features ◽  
Application Fields

Bimetallic nanomaterials in the form of thin film constituted by magnetic and noble elements show promising properties in different application fields such as catalysts and magnetic driven applications. In order to tailor the chemical and physical properties of these alloys to meet the applications requirements, it is of great importance scientific interest to study the interplay between properties and morphology, surface properties, microstructure, spatial confinement and magnetic features. In this manuscript, FePd thin films are prepared by electrodeposition which is a versatile and widely used technique. Compositional, morphological, surface and magnetic properties are described as a function of deposition time (i.e., film thickness). Chemical etching in hydrochloric acid was used to enhance the surface roughness and help decoupling crystalline grains with direct consequences on to the magnetic properties. X-ray diffraction, SEM/AFM images, contact angle and magnetic measurements have been carried out with the aim of providing a comprehensive characterisation of the fundamental properties of these bimetallic thin films.

Impact of Heat Treatment on the Electrical Properties of LaNiO3 Conductive Thin Films

2007 ◽  
Vol 280-283 ◽  
pp. 873-876
Author(s):  
Sheng Guo Lu ◽  
Haydn Chen
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
Good Adhesion ◽  
Electrode Layer ◽  
Annealing Conditions ◽  
Post Annealing ◽  
Conductive Thin Films ◽  
The Ideal

LaNiO3 (LNO) has been used as bottom electrode layer for ferroelectric and antiferroelectric thin films due to its good conduction, preferred (100) orientation, same crystalline structure as many perovskite ferroelectrics and antiferroelectrics, good adhesion and compatibility with the Pt/Ti/SiO2/Si template. In this study we have investigated the ideal optimal post - annealing conditions for LaNiO3 thin films deposited at 450°C using a magnetron sputtering method. Heat treatment from 500 to 1200°C was performed. Scanning electron microscopy (SEM), x-ray diffraction (XRD) and electrical measurements were carried out to characterize the morphology, structure, and macroscopic properties. Results indicated that the LNO film had the best quality when annealed at about 800°C. Above this temperature, the morphology, structure and associated properties would deteriorate.

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