scholarly journals Characterization of GaAs Solar Cells under Supercontinuum Long-Time Illumination

Materials ◽  
2021 ◽  
Vol 14 (2) ◽  
pp. 461
Author(s):  
Nikola Papež ◽  
Rashid Dallaev ◽  
Pavel Kaspar ◽  
Dinara Sobola ◽  
Pavel Škarvada ◽  
...  
Keyword(s):  
Solar Cells ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Electrical Characteristics ◽  
Continuous Laser ◽  
X Ray ◽  
Long Time ◽  
Degradation Test ◽  
Secondary Ion

This work is dedicated to the description of the degradation of GaAs solar cells under continuous laser irradiation. Constant and strong exposure of the solar cell was performed over two months. Time-dependent electrical characteristics are presented. The structure of the solar cells was studied at the first and last stages of degradation test. The data from Raman spectroscopy, reflectometry, and secondary ion mass spectrometry confirm displacement of titanium and aluminum atoms. X-ray photoelectron spectroscopy showed a slight redistribution of oxygen bonds in the anti-corrosion coating.

Static time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy characterization of adsorbed albumin and fibronectin films

2001 ◽  
Vol 31 (8) ◽  
pp. 724-733 ◽  
Author(s):  
Caren D. Tidwell ◽  
David G. Castner ◽  
Stephen L. Golledge ◽  
Buddy D. Ratner ◽  
Klaus Meyer ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Characterization of hydrogenated graphite powder by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

RSC Advances ◽  
2016 ◽  
Vol 6 (84) ◽  
pp. 80649-80654 ◽  
Author(s):  
Wenjing Xie ◽  
Kai Mo Ng ◽  
Lu-Tao Weng ◽  
Chi-Ming Chan
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Time Of Flight ◽  
Graphite Powder ◽  
X Ray ◽  
Tof Sims ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

Hydrogenated graphite powder was obtained through Birch reduction of graphite powder and characterized by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) at 500 °C.

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