scholarly journals Nanocrystallization in FINEMET-Type Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 Thin Films

Materials ◽  
2020 ◽  
Vol 13 (2) ◽  
pp. 348 ◽  
Author(s):  
Evgeniya A. Mikhalitsyna ◽  
Vasiliy A. Kataev ◽  
Aitor Larrañaga ◽  
Vladimir N. Lepalovskij ◽  
Galina V. Kurlyandskaya
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetic Thin Films ◽  
X Ray Diffraction ◽  
Magnetic Field Sensors ◽  
X Ray ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Low Dimensional ◽  
20 Nm

A growing variety of microelectronic devices and magnetic field sensors as well as a trend of miniaturization demands the development of low-dimensional magnetic materials and nanostructures. Among them, soft magnetic thin films of Finemet alloys are appropriate materials for sensor and actuator devices. Therefore, one of the important directions of the research is the optimization of thin film magnetic properties. In this study, the structural transformations of the Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 films of 100, 150 and 200 nm thicknesses were comparatively analyzed together with their magnetic properties and magnetic anisotropy. The thin films were prepared using the ion-plasma sputtering technique. The crystallization process was studied by certified X-ray diffraction (XRD) methods. The kinetics of crystallization was observed due to the temperature X-ray diffraction (TDX) analysis. Magnetic properties of the films were studied by the magneto-optical Kerr microscopy. Based on the TDX data the delay of the onset crystallization of the films with its thickness decreasing was shown. Furthermore, the onset crystallization of the 150 and 200 nm films began at the temperature of about 400–420 °C showing rapid grain growth up to the size of 16–20 nm. The best magnetic properties of the films were formed after crystallization after the heat treatment at 350–400 °C when the stress relaxation took place.

Effects of ZnO layer on anisotropy magnetoresistance of Ni81Fe19 films

2014 ◽  
Vol 28 (06) ◽  
pp. 1450043 ◽  
Author(s):  
Shuyun Wang ◽  
Yuanmei Gao ◽  
Tiejun Gao ◽  
Yuan He ◽  
Hui Zhang ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Magnetron Sputtering ◽  
Substrate Temperature ◽  
Layer Thickness ◽  
Magnetic Thin Films ◽  
Anisotropic Magnetoresistance ◽  
Experimental Conditions ◽  
Method Effects ◽  
20 Nm

A series of Ta (4 nm)/ ZnO (t nm )/ Ni 81 Fe 19 (20 nm)/ ZnO (t nm )/ Ta (3 nm) magnetic thin films were prepared on lower experimental conditions by magnetron sputtering method. Effects of ZnO layer thickness and substrate temperature on anisotropic magnetoresistance and magnetic properties of these Ni 81 Fe 19 films have been investigated. The experiment results show that the anisotropic magnetoresistance value of the Ni 81 Fe 19 film is enhanced with the increasing of the inserted ZnO layer thickness. When the ZnO thickness is 2 nm, the anisotropic magnetoresistance value achieves the maximum. In addition, the anisotropic magnetoresistance of the Ni 81 Fe 19 film is also enhanced with the increasing of substrate temperature, and when the temperature is 450°C, the anisotropic magnetoresistance reaches the maximum. The anisotropic magnetoresistance value of 20 nm Ni 81 Fe 19 films with 2 nm ZnO layer can achieve 3.63% at 450°C which is enhanced 11.6% compare with the films without ZnO layer.

TEM Study of FePt and FePt:C/FePt Composite Double-Layered Thin Films

2013 ◽  
Vol 275-277 ◽  
pp. 1952-1955
Author(s):  
Ling Fang Jin ◽  
Xing Zhong Li
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Grain Size ◽  
Magnetic Properties ◽  
Composite Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

New functional nanocomposite FePt:C thin films with FePt underlayers were synthesized by noneptaxial growth. The effect of the FePt layer on the ordering, orientation and magnetic properties of the composite layer has been investigated by adjusting FePt underlayer thickness from 2 nm to 14 nm. Transmission electron microscopy (TEM), together with x-ray diffraction (XRD), has been used to check the growth of the double-layered films and to study the microstructure, including the grain size, shape, orientation and distribution. XRD scans reveal that the orientation of the films was dependent on FePt underlayer thickness. In this paper, the TEM studies of both single-layered nonepitaxially grown FePt and FePt:C composite L10 phase and double-layered deposition FePt:C/FePt are presented.

D-61 Grazing-Incident X-ray Diffraction Analyses of Novel Magnetic Thin Films—Invited

2004 ◽  
Vol 19 (2) ◽  
pp. 195-195
Author(s):  
K. Inaba ◽  
Y. Ito ◽  
K. Omote ◽  
H. Toraya
Keyword(s):  
Thin Films ◽  
Magnetic Thin Films ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Structural and Magnetic Properties of FePd Thin Film Synthesized by Electrodeposition Method

Materials ◽  
2020 ◽  
Vol 13 (6) ◽  
pp. 1454
Author(s):  
Gabriele Barrera ◽  
Federico Scaglione ◽  
Matteo Cialone ◽  
Federica Celegato ◽  
Marco Coïsson ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Magnetic Properties ◽  
Deposition Time ◽  
Magnetic Measurements ◽  
X Ray Diffraction ◽  
X Ray ◽  
Fundamental Properties ◽  
Magnetic Features ◽  
Application Fields

Bimetallic nanomaterials in the form of thin film constituted by magnetic and noble elements show promising properties in different application fields such as catalysts and magnetic driven applications. In order to tailor the chemical and physical properties of these alloys to meet the applications requirements, it is of great importance scientific interest to study the interplay between properties and morphology, surface properties, microstructure, spatial confinement and magnetic features. In this manuscript, FePd thin films are prepared by electrodeposition which is a versatile and widely used technique. Compositional, morphological, surface and magnetic properties are described as a function of deposition time (i.e., film thickness). Chemical etching in hydrochloric acid was used to enhance the surface roughness and help decoupling crystalline grains with direct consequences on to the magnetic properties. X-ray diffraction, SEM/AFM images, contact angle and magnetic measurements have been carried out with the aim of providing a comprehensive characterisation of the fundamental properties of these bimetallic thin films.

Fine Tuning Magnetic Properties of FePt:C Thin Films by FePt UnderLayers

2013 ◽  
Vol 313-314 ◽  
pp. 254-257
Author(s):  
Ling Fang Jin ◽  
Hong Zhuang
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Magnetic Properties ◽  
Fine Tuning ◽  
Nanocomposite Films ◽  
Nanocomposite Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

Nonepitaxially grown FePt (x)/FePt:C thin films were synthesized, where FePt (x) (x=2, 5, 8, 11, 14 nm) layers were served as underlayers and FePt:C layer was nanocomposite with thickness of 5 nm. The effect of FePt underlayer on the ordering, orientation and magnetic properties of FePt:C thin films has been investigated by adjusting FePt underlayer thicknesses from 2 nm to 14 nm. X-ray diffraction (XRD), together with transmission electron microscopy (TEM) confirmed that the desired L10 phase was formed and films were (001) textured with FePt underlayer thickness decreased less 5 nm. For 5 nm FePt:C nanocomposite thin film with 2 nm FePt underlayer, the coercivity was 8.2 KOe and the correlation length of FePt:C nanocomposite film was 67 nm. These results reveal that the better orientation and magnetic properties for FePt:C nanocomposite films can be tuned by decreasing FePt underlayer thickness.

Research on Structural Properties of FePt: C Thin Films with FePt Underlayers

2013 ◽  
Vol 385-386 ◽  
pp. 7-10
Author(s):  
Ling Fang Jin ◽  
Hong Zhuang
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Magnetic Properties ◽  
Structural Properties ◽  
Composite Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron

Nonepitaxially grown double-layered films were synthesized with a FePt: C composite layer on top of continuous FePt underlayer. The thickness of FePt was changed from 2 nm to 14 nm. Nanostructures, crystalline orientations and the effect of FePt underlayer on the ordering, orientation and magnetic properties of the thin films were investigated by transmission electron microscopy (TEM) and x-ray diffraction (XRD). XRD confirmed the formation of the ordered L10phase for 5 nm FePt: C film with FePt thickness decreased to 5 nm. TEM studies of FePt:C composite L10phase and double-layered deposition FePt:C/FePt were presented.

scholarly journals Resonant Soft X-ray Reflectivity in the Study of Magnetic Properties of Low-Dimensional Systems

2021 ◽  
Vol 7 (10) ◽  
pp. 136
Author(s):  
Adriano Verna ◽  
Raffaella Capelli ◽  
Luca Pasquali
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Transition Metals ◽  
Exchange Bias ◽  
Theoretical Background ◽  
Proximity Effects ◽  
X Ray ◽  
Buried Interfaces ◽  
Low Dimensional

In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimensional systems is discussed. This technique is particularly appealing in the study of magnetization at buried interfaces and to discriminate single elemental contributions to magnetism, even when this is ascribed to few atoms. The major fields of application are described, including magnetic proximity effects, thin films of transition metals and related oxides, and exchange-bias systems. The fundamental theoretical background leading to dichroism effects in reflectivity is also briefly outlined.

Thermal Evolution of Magnetic Properties and Crystal Structure in Compositionally Modulated Al/Ni Thin Films

1991 ◽  
Vol 232 ◽  
Author(s):  
A. Waknis ◽  
E. Haftek ◽  
M. Tan ◽  
J. A. Barnard ◽  
E. Tsang
Keyword(s):  
Crystal Structure ◽  
Thin Films ◽  
Magnetic Properties ◽  
Thermal Evolution ◽  
Dead Layer ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
The Individual ◽  
Deposited Films

ABSTRACTPeriodic multilayer thin films of the form (xAl/yNi)n were grown by alternate deposition of pure Al and Ni using dc-magnetron sputtering. The thicknesses of the individual Al and Ni layers are given by x and y, respectively, and the total number of bilayer units is n. For this set of experiments, x was fixed at 3.5 nm while y was systematically varied from 2.4 to 154 nm. The films were tested in as-deposited and annealed states for magnetic properties using a vibrating sample magnetometer and for crystal structure by x-ray diffraction. In both the as-deposited and annealed samples the magnetization per unit volume of Ni declined as the Ni layer thickness decreased. This result can be interpreted in terms of a magnetically ‘dead’ layer at the Al/Ni interfaces. The width of the dead layer increased from 2.9 nm to 5.8 nm on annealing. Magnetic properties were correlated with crystal structure experiments by x-ray diffraction. As-deposited films yielded a Ni(111) texture. The Ni (111) peak decreased in intensity and broadened as the Ni thickness declined. Annealing produced evidence for the growth of the intermetallic NiAl3.

Structural and Magnetic Properties of CoFe2O4 / Si (001) Thin Films via Sol-Gel Method

2013 ◽  
Vol 744 ◽  
pp. 315-318
Author(s):  
Wei Rao ◽  
Ding Guo Li ◽  
Hong Chun Yan
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Exchange Coupling ◽  
Cobalt Ferrite ◽  
Sol Gel ◽  
Magnetic Hysteresis ◽  
Vibrating Sample Magnetometer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Calcined Temperature

Cobalt ferrite (CoFe2O4) thin films have been prepared on Si (001) substrates, with different calcined temperatures (Tcal=400°C~800°C). The films structure was studied by X-ray diffraction (XRD) and their surface was examined by scanning electron microscopy (SEM). The magnetic properties were measured with a vibrating sample magnetometer (VSM). For low calcined temperatures, the films presented a mixture of a CoFe2O4phase, with the cubic spinel structure, and cobalt and iron antiferromagnet oxides with CoO and FeO stoichiometries. As the calcined temperature increased, the CoO and FeO relative content strongly decreased, so that for Tcal=800°Cthe films were composed mainly by polycrystalline CoFe2O4. The magnetic hysteresis cycles measured in the films were horizontally shifted due to an exchange coupling field originated by the presence of the antiferromagnetic phases.

Structural and magnetic properties of the low-dimensional fluoride β-FeF3(H2O)2·H2O

2015 ◽  
Vol 44 (31) ◽  
pp. 14130-14138 ◽  
Author(s):  
Gwilherm Nénert ◽  
Oscar Fabelo ◽  
Kerstin Forsberg ◽  
Claire V. Colin ◽  
Juan Rodríguez-Carvajal
Keyword(s):  
Crystal Structure ◽  
Magnetic Properties ◽  
High Resolution ◽  
Diffraction Data ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural And Magnetic Properties ◽  
Low Dimensional

We have reinvestigated the crystal structure of the low-dimensional fluoride β-FeF3(H2O)2·H2O using high resolution neutron and X-ray diffraction data.

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