scholarly journals Angular X-ray Cross-Correlation Analysis (AXCCA): Basic Concepts and Recent Applications to Soft Matter and Nanomaterials

Materials ◽  
2019 ◽  
Vol 12 (21) ◽  
pp. 3464 ◽  
Author(s):  
Ivan Zaluzhnyy ◽  
Ruslan Kurta ◽  
Marcus Scheele ◽  
Frank Schreiber ◽  
Boris Ostrovskii ◽  
...  
Keyword(s):  
Correlation Analysis ◽  
Soft Matter ◽  
Quantitative Measurement ◽  
Cross Correlation ◽  
Orientational Order ◽  
X Ray Diffraction ◽  
X Ray ◽  
Cross Correlation Analysis ◽  
Diffraction Patterns ◽  
Recent Experimental Work

Angular X-ray cross-correlation analysis (AXCCA) is a technique which allows quantitative measurement of the angular anisotropy of X-ray diffraction patterns and provides insights into the orientational order in the system under investigation. This method is based on the evaluation of the angular cross-correlation function of the scattered intensity distribution on a two-dimensional (2D) detector and further averaging over many diffraction patterns for enhancement of the anisotropic signal. Over the last decade, AXCCA was successfully used to study the anisotropy in various soft matter systems, such as solutions of anisotropic particles, liquid crystals, colloidal crystals, superlattices composed by nanoparticles, etc. This review provides an introduction to the technique and gives a survey of the recent experimental work in which AXCCA in combination with micro- or nanofocused X-ray microscopy was used to study the orientational order in various soft matter systems.

Application of Cross-correlation Analysis Method for Measurement of the Fluid Flow Rate Based on X-ray Radiation

2019 ◽  
Vol 11 (1) ◽  
pp. 01025-1-01025-5 ◽  
Author(s):  
N. A. Borodulya ◽  
◽  
R. O. Rezaev ◽  
S. G. Chistyakov ◽  
E. I. Smirnova ◽  
...  
Keyword(s):  
Fluid Flow ◽  
Correlation Analysis ◽  
Flow Rate ◽  
Cross Correlation ◽  
Fluid Flow Rate ◽  
Analysis Method ◽  
X Ray ◽  
Cross Correlation Analysis ◽  
Correlation Analysis Method

scholarly journals X-Ray Cross-Correlation Analysis of Disordered Ensembles of Particles: Potentials and Limitations

2013 ◽  
Vol 2013 ◽  
pp. 1-15 ◽  
Author(s):  
R. P. Kurta ◽  
M. Altarelli ◽  
I. A. Vartanyants
Keyword(s):  
Correlation Analysis ◽  
Disordered Systems ◽  
Cross Correlation ◽  
Structural Information ◽  
Three Dimensional ◽  
X Ray ◽  
X Ray Scattering ◽  
Cross Correlation Analysis ◽  
2D And 3D ◽  
Ray Scattering

Angular X-ray cross-correlation analysis (XCCA) is an approach to study the structure of disordered systems using the results of X-ray scattering experiments. In this paper we summarize recent theoretical developments related to the Fourier analysis of the cross-correlation functions. Results of our simulations demonstrate the application of XCCA to two- and three-dimensional (2D and 3D) disordered ensembles of particles. We show that the structure of a single particle can be recovered using X-ray data collected from a 2D disordered system of identical particles. We also demonstrate that valuable structural information about the local structure of 3D systems, inaccessible from a standard small-angle X-ray scattering experiment, can be resolved using XCCA.

Reliability of Orientational Order Parameters Determined from Two-dimensional X-ray Diffraction Patterns: A Simulation Study

ChemPhysChem ◽  
2016 ◽  
Vol 17 (11) ◽  
pp. 1568-1572 ◽  
Author(s):  
Frank Jenz ◽  
Stefan Jagiella ◽  
Matthew A. Glaser ◽  
Frank Giesselmann
Keyword(s):  
Simulation Study ◽  
Orientational Order ◽  
Order Parameters ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns

scholarly journals Detecting orientational order in model systems by X-ray cross-correlation methods

2014 ◽  
Vol 47 (4) ◽  
pp. 1315-1323 ◽  
Author(s):  
Felix Lehmkühler ◽  
Gerhard Grübel ◽  
Christian Gutt
Keyword(s):  
Correlation Functions ◽  
Cross Correlation ◽  
Orientational Order ◽  
Model Systems ◽  
X Ray ◽  
New Correlation ◽  
Cross Correlation Analysis ◽  
Model Structures ◽  
Polygonal Model ◽  
Vector Magnitude

The results of a computational X-ray cross-correlation analysis (XCCA) study on two-dimensional polygonal model structures are presented. This article shows how to detect and identify the orientational order of such systems, demonstrates how to eliminate the influence of the `computational box' on the XCCA results and develops new correlation functions that reflect the sample's orientational order only. For this purpose, the dependence of the correlation functions on the number of polygonal clusters and scattering vector magnitudeqis studied for various types of polygons, including mixtures of polygons and randomly placed particles. An order parameter that describes the orientational order within the sample is defined. Finally, the influence of detector noise and nonplanar wavefronts on the XCCA data is determined, both of which appear to affect the results significantly and have thus to be considered in real experiments.

scholarly journals Secondary Structure Elucidation via X-Ray Cross Correlation Analysis

2014 ◽  
Vol 106 (2) ◽  
pp. 384a
Author(s):  
Thomas Lane ◽  
Derek Mendez ◽  
Jongmin Sung ◽  
Daniel Ratner ◽  
Herschel Watkins ◽  
...  
Keyword(s):  
Secondary Structure ◽  
Correlation Analysis ◽  
Structure Elucidation ◽  
Cross Correlation ◽  
X Ray ◽  
Cross Correlation Analysis

scholarly journals X-ray cross-correlation analysis of the low-mass X-ray binary 4U 1636-53

2014 ◽  
Vol 10 (S306) ◽  
pp. 397-399
Author(s):  
Ya-Juan Lei
Keyword(s):  
Correlation Function ◽  
Correlation Analysis ◽  
Cross Correlation ◽  
X Rays ◽  
X Ray ◽  
Cross Correlation Analysis ◽  
Low Mass ◽  
Cross Correlations ◽  
The Cross ◽  
Positive Correlations

AbstractWe analyze the cross-correlation function of the soft and hard X-rays of the atoll source 4U 1636-53 with RXTE data. The results show that the cross-correlations evolve along the different branches of the color-color diagram. At the lower left banana states, we have both positive and ambiguous correlations, and positive correlations are dominant for the lower banana and the upper banana states. The anti-correlation is detected at the top of the upper banana states. The cross-correlations of two atoll sources 4U 1735-44 and 4U 1608-52 have been studied in previous work, and the anti-correlations are detected at the lower left banana or the top of the upper banana states. Our results show that, in the 4U 1636-53, the distribution of the cross-correlations in the color-color diagram is similar to those of 4U 1735-44 and 4U 1608-52, and confirm further that the distribution of cross-correlations in color-color diagram could be correlated with the luminosity of the source.

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