scholarly journals Single-Shot near Edge X-ray Fine Structure (NEXAFS) Spectroscopy Using a Laboratory Laser-Plasma Light Source

Materials ◽  
2018 ◽  
Vol 11 (8) ◽  
pp. 1303 ◽  
Author(s):  
Przemysław Wachulak ◽  
Martin Duda ◽  
Tomasz Fok ◽  
Andrzej Bartnik ◽  
Zhanshan Wang ◽  
...  
Keyword(s):  
Ascorbic Acid ◽  
Fine Structure ◽  
Absorption Spectra ◽  
Light Source ◽  
Laser Plasma ◽  
Nanosecond Laser Pulse ◽  
Nanosecond Laser ◽  
Single Shot ◽  
X Ray ◽  
Nexafs Spectroscopy

We present a proof of principle experiment on single-shot near edge soft X-ray fine structure (NEXAFS) spectroscopy with the use of a laboratory laser-plasma light source. The source is based on a plasma created as a result of the interaction of a nanosecond laser pulse with a double stream gas puff target. The laser-plasma source was optimized for efficient soft X-ray (SXR) emission from the krypton/helium target in the wavelength range from 2 nm to 5 nm. This emission was used to acquire simultaneously emission and absorption spectra of soft X-ray light from the source and from the investigated sample using a grazing incidence grating spectrometer. NEXAFS measurements in a transmission mode revealed the spectral features near the carbon K-α absorption edge of thin polyethylene terephthalate (PET) film and L-ascorbic acid in a single-shot. From these features, the composition of the PET sample was successfully obtained. The NEXAFS spectrum of the L-ascorbic acid obtained in a single-shot exposure was also compared to the spectrum obtained a multi-shot exposure and to numerical simulations showing good agreement. In the paper, the detailed information about the source, the spectroscopy system, the absorption spectra measurements and the results of the studies are presented and discussed.

scholarly journals Compact system for near edge X-ray fine structure (NEXAFS) spectroscopy using a laser-plasma light source

2018 ◽  
Vol 26 (7) ◽  
pp. 8260 ◽  
Author(s):  
Przemysław Wachulak ◽  
Martin Duda ◽  
Andrzej Bartnik ◽  
Antoni Sarzyński ◽  
Łukasz Węgrzyński ◽  
...  
Keyword(s):  
Fine Structure ◽  
Light Source ◽  
Laser Plasma ◽  
X Ray ◽  
Nexafs Spectroscopy

X-Ray Absorption Fine Structure Study in FeTiO3

1997 ◽  
Vol 11 (16n17) ◽  
pp. 745-748 ◽  
Author(s):  
Rebekah Min-Fang Hsu ◽  
Kai-Jan Lin ◽  
Cheng Tien ◽  
Lin-Yan Jang
Keyword(s):  
Absorption Spectrum ◽  
Fine Structure ◽  
Absorption Spectra ◽  
Mixed Valence ◽  
Structure Study ◽  
X Ray ◽  
Xafs Spectroscopy ◽  
Absorption Fine ◽  
Trivalent State ◽  
X Ray Absorption

X-ray absorption fine structure XAFS spectroscopy has been used to determine the valence system for the Fe atom in ilmenite, FeTiO3 . This is the first XAFS data in FeTiO3 to our knowledge. The α- Fe2O3 data served as the standard in determining the ionization of the Fe atom in FeTiO3 . Observation of intensity and k-space are consistent. There was no evidence of mixed valence on comparing the FeTiO3 near edge X-ray absorption spectrum with α- Fe2O3 data. The absorption spectra suggest that iron is in the trivalent state in ilmenite.

scholarly journals Near-Edge X-Ray Absorption Fine Structure Spectroscopy of Agarose with a Compact Laser Plasma Soft X-Ray Source

2020 ◽  
Vol 137 (1) ◽  
pp. 51-53
Author(s):  
T. Fok ◽  
P. Wachulak ◽  
K. Janulewicz ◽  
M. Duda ◽  
Ł. Węgrzyński ◽  
...  
Keyword(s):  
Fine Structure ◽  
Laser Plasma ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

Note: Construction of x-ray scattering and x-ray absorption fine structure beamline at the Pohang Light Source

2010 ◽  
Vol 81 (2) ◽  
pp. 026103 ◽  
Author(s):  
Ik-Jae Lee ◽  
Chung-Jong Yu ◽  
Young-Duck Yun ◽  
Chae-Soon Lee ◽  
In Deuk Seo ◽  
...  
Keyword(s):  
Fine Structure ◽  
Light Source ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Scattering ◽  
Pohang Light Source ◽  
X Ray Absorption ◽  
Ray Scattering

scholarly journals Demonstration of Transmission Mode Soft X-ray NEXAFS Using Third- and Fifth-Order Harmonics of FEL Radiation at SACLA BL1

2020 ◽  
Vol 10 (21) ◽  
pp. 7852
Author(s):  
Hiroshi Iwayama ◽  
Masanari Nagasaka ◽  
Ichiro Inoue ◽  
Shigeki Owada ◽  
Makina Yabashi ◽  
...  
Keyword(s):  
Fine Structure ◽  
Free Electron ◽  
Free Electron Laser ◽  
Transmission Mode ◽  
Pump Probe ◽  
X Ray ◽  
The Third ◽  
Nexafs Spectroscopy ◽  
Fifth Order ◽  
X Ray Absorption

We demonstrate the applicability of third- and fifth-order harmonics of free-electron laser (FEL) radiation for soft X-ray absorption spectroscopy in the transmission mode at SACLA BL1, which covers a photon energy range of 20 to 150 eV in the fundamental FEL radiation. By using the third- and fifth-order harmonics of the FEL radiation, we successfully recorded near-edge X-ray absorption fine structure (NEXAFS) spectra for Ar 2p core ionization and CO2 C 1s and O 1s core ionizations. Our results show that the utilization of third- and fifth-order harmonics can significantly extend the available photon energies for NEXAFS spectroscopy using an FEL and opens the door to femtosecond pump-probe NEXAFS using a soft X-ray FEL.

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

Tomographic imaging using a compact soft X-ray microscope based on a laser plasma light source

2019 ◽  
Author(s):  
Przemysław W. Wachulak ◽  
Alfio Torrisi ◽  
Wojciech Krauze ◽  
Andrzej S. Bartnik ◽  
Jerzy Kostecki ◽  
...  
Keyword(s):  
Light Source ◽  
Laser Plasma ◽  
Tomographic Imaging ◽  
X Ray

Investigating the structure of boron nitride nanotubes by near-edge X-ray absorption fine structure (NEXAFS) spectroscopy

2005 ◽  
Vol 7 (6) ◽  
pp. 1103 ◽  
Author(s):  
Tirandai Hemraj-Benny ◽  
Sarbajit BanerjeeCurrent address: Department ◽  
Sharadha Sambasivan ◽  
Daniel A. Fischer ◽  
Weiqiang Han ◽  
...  
Keyword(s):  
Fine Structure ◽  
Boron Nitride ◽  
Boron Nitride Nanotubes ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
X Ray Absorption
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