A Semi-Analytical Extraction Method for Interface and Bulk Density of States in Metal Oxide Thin-Film Transistors
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2016 ◽
Vol 12
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pp. 888-891
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Vol 4
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pp. 5416-5421
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2020 ◽
Vol 35
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pp. 1103-1109
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2021 ◽
Vol 10
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pp. 025003
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2019 ◽
Vol 40
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pp. 228-231
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