Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy

Kunyu Zhao; Huizhu Yu; Jian Zou; Huarong Zeng; Guorong Li; Xiaomin Li

doi:10.3390/ma10111258

Influence of Oxygen Pressure on the Domain Dynamics and Local Electrical Properties of BiFe0.95Mn0.05O3 Thin Films Studied by Piezoresponse Force Microscopy and Conductive Atomic Force Microscopy

Materials ◽

10.3390/ma10111258 ◽

2017 ◽

Vol 10 (11) ◽

pp. 1258 ◽

Cited By ~ 2

Author(s):

Kunyu Zhao ◽

Huizhu Yu ◽

Jian Zou ◽

Huarong Zeng ◽

Guorong Li ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Properties ◽

Oxygen Pressure ◽

Piezoresponse Force Microscopy ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Domain Dynamics

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Characterization of local electrical properties of polycrystalline silicon thin films and hydrogen termination effect by conductive atomic force microscopy

Applied Physics Letters ◽

10.1063/1.3130210 ◽

2009 ◽

Vol 94 (18) ◽

pp. 182104 ◽

Cited By ~ 6

Author(s):

Emi Machida ◽

Yukiharu Uraoka ◽

Takashi Fuyuki ◽

Ryohei Kokawa ◽

Takeshi Ito ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Properties ◽

Polycrystalline Silicon ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Silicon Thin Films ◽

Atomic Force ◽

Hydrogen Termination

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Local Electrical Properties of Non-Doped Polycrystalline Silicon Thin-Films Evaluated Using Conductive Atomic Force Microscopy

Solid State Phenomena ◽

10.4028/www.scientific.net/ssp.93.339 ◽

2003 ◽

Vol 93 ◽

pp. 339-344 ◽

Cited By ~ 2

Author(s):

Yoichiro Aya ◽

Atsushi Andoh ◽

Satoshi Yamasaki ◽

Kenichiro Wakisaka

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Properties ◽

Polycrystalline Silicon ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Silicon Thin Films ◽

Atomic Force

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Electron Transport in Thin Films of Polymer and Small-Molecule Acceptors Visualized by Conductive Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.1c03837 ◽

2021 ◽

Author(s):

Anjar Taufik Hidayat ◽

Hiroaki Benten ◽

Toshiki Kawanishi ◽

Noboru Ohta ◽

Azusa Muraoka ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electron Transport ◽

Small Molecule ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Using Conductive Atomic Force Microscopy to the Evaluate Electrical Properties of MoS2 nanoparticles for Device Applications

ECS Transactions ◽

10.1149/10403.0017ecst ◽

2021 ◽

Vol 104 (3) ◽

pp. 17-19

Author(s):

Aisha Alhammadi ◽

Wafa Alnaqbi ◽

Juveiriah Ashraf ◽

Ayman Rezk ◽

Ammar Nayfeh

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Device Applications ◽

Mos2 Nanoparticles

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Electrical characterization of oxygen-induced nanosized ripples on aluminum thin films by conductive atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.07.245 ◽

2006 ◽

Vol 243 (1) ◽

pp. 16-19 ◽

Cited By ~ 12

Author(s):

P. Mishra ◽

P. Karmakar ◽

D. Ghose

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Modification of electrical properties of tungsten oxide nanorods using conductive atomic force microscopy

Surface Science ◽

10.1016/j.susc.2006.12.057 ◽

2007 ◽

Vol 601 (13) ◽

pp. 2684-2687 ◽

Cited By ~ 4

Author(s):

Ph. Guaino ◽

M. Gillet ◽

R. Delamare ◽

E. Gillet

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Tungsten Oxide ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Oxide Nanorods

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Study of the Resistive Switching Effect in Chromium Oxide Thin Films by Use of Conductive Atomic Force Microscopy

Journal of Electronic Materials ◽

10.1007/s11664-015-3889-z ◽

2015 ◽

Vol 44 (10) ◽

pp. 3395-3400 ◽

Cited By ~ 4

Author(s):

Kim Ngoc Pham ◽

Minsu Choi ◽

Cao Vinh Tran ◽

Trung Do Nguyen ◽

Van Hieu Le ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Chromium Oxide ◽

Resistive Switching ◽

Switching Effect ◽

Oxide Thin Films ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Resistive Switching Effect

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Local photoconductivity of microcrystalline silicon thin films excited by 442nm HeCd laser measured by conductive atomic force microscopy

Journal of Non-Crystalline Solids ◽

10.1016/j.jnoncrysol.2012.01.015 ◽

2012 ◽

Vol 358 (17) ◽

pp. 2082-2085 ◽

Cited By ~ 3

Author(s):

Martin Ledinský ◽

Antonín Fejfar ◽

Aliaksei Vetushka ◽

Jiří Stuchlík ◽

Jan Kočka

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Microcrystalline Silicon ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Silicon Thin Films ◽

Atomic Force ◽

Hecd Laser

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Role of the tip induced local anodic oxidation in the conductive atomic force microscopy of mixed phase silicon thin films

physica status solidi (c) ◽

10.1002/pssc.200982777 ◽

2010 ◽

pp. NA-NA ◽

Cited By ~ 3

Author(s):

Aliaksei Vetushka ◽

Antonin Fejfar ◽

Martin Ledinský ◽

Bohuslav Rezek ◽

Jiří Stuchlík ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Anodic Oxidation ◽

Mixed Phase ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Silicon Thin Films ◽

Atomic Force ◽

Local Anodic Oxidation

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Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Materials Research Bulletin ◽

10.1016/j.materresbull.2015.05.002 ◽

2015 ◽

Vol 70 ◽

pp. 373-378 ◽

Cited By ~ 18

Author(s):

N. Muhunthan ◽

Om Pal Singh ◽

Vijaykumar Toutam ◽

V.N. Singh

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Grain Boundaries ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Czts Thin Films ◽

Microscopy Techniques

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