scholarly journals An Advanced Characterization Method for the Elastic Modulus of Nanoscale Thin-Films Using a High-Frequency Micromechanical Resonator

Materials ◽  
2017 ◽  
Vol 10 (7) ◽  
pp. 806 ◽  
Author(s):  
Yun Young Kim
Keyword(s):  
Thin Films ◽  
Elastic Modulus ◽  
High Frequency ◽  
Advanced Characterization

Magnetic properties of FeXNi100-X (X=20, 17, 15 %) thin films: focus on high-frequency sensory applications

2019 ◽  
pp. 20-25
Author(s):  
Anna Chlenova ◽  
◽  
Elizaveta Golubeva ◽  
Iuliia Novoselova ◽  
Ruslan Salikhov ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
High Frequency

scholarly journals Measurement of Electrical Properties of Superconducting YBCO Thin Films in the VHF Range

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3360
Author(s):  
Yakir Dahan ◽  
Eldad Holdengreber ◽  
Elichai Glassner ◽  
Oz Sorkin ◽  
Shmuel E. Schacham ◽  
...  
Keyword(s):  
Thin Films ◽  
Theoretical Model ◽  
Quality Factor ◽  
High Frequency ◽  
Unit Length ◽  
Superconducting Thin Films ◽  
Electrical Parameters ◽  
Very High Frequency ◽  
Production Constraints ◽  
Very High

A new measurement technique of electrical parameters of superconducting thin films at the Very High Frequency (VHF) range is described, based on resonators with microstrip (MS) structures. The design of an optimal resonator was achieved, based on a thorough theoretical analysis, which is required for derivation of the exact configuration of the MS. A theoretical model is presented, from which an expression for the attenuation of a MS line can be derived. Accordingly, simulations were performed, and an optimal resonator for the VHF range was designed and implemented. Production constraints of YBa2Cu3O7 (YBCO) limited the diameter of the sapphire substrate to 3″. Therefore, a meander configuration was formed to fit the long λ/4 MS line on the wafer. By measuring the complex input reflection coefficients of a λ/4 resonator, we extracted the quality factor, which is mainly affected by the dielectric and conductor attenuations. The experimental results are well fitted by the theoretical model. The dielectric attenuation was calculated using the quasi-static analysis of the MS line. An identical copper resonator was produced and measured to compare the properties of the YBCO resonator in reference to the copper one. A quality factor of ~6·105 was calculated for the YBCO resonator, three orders of magnitude larger than that of the copper resonator. The attenuation per unit length of the YBCO layer was smaller by more than five orders of magnitude than that of the copper.

Compositional and phase dependence of elastic modulus of crystalline and amorphous Hf1-xZrxO2 thin films

2021 ◽  
Vol 118 (10) ◽  
pp. 102901
Author(s):  
Shelby S. Fields ◽  
David H. Olson ◽  
Samantha T. Jaszewski ◽  
Chris M. Fancher ◽  
Sean W. Smith ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Modulus ◽  
Phase Dependence

Direct Comparison of Three Buckling-Based Methods to Measure the Elastic Modulus of Nanobiocomposite Thin Films

2021 ◽  
Author(s):  
Taylor C. Stimpson ◽  
Daniel A. Osorio ◽  
Emily D. Cranston ◽  
Jose M. Moran-Mirabal
Keyword(s):  
Thin Films ◽  
Elastic Modulus

Determining the elastic modulus of thin films using a buckling-based method: computational study

2009 ◽  
Vol 42 (17) ◽  
pp. 175506 ◽  
Author(s):  
Xiu-Peng Zheng ◽  
Yan-Ping Cao ◽  
Bo Li ◽  
Xi-Qiao Feng ◽  
Hanqing Jiang ◽  
...  
Keyword(s):  
Thin Films ◽  
Elastic Modulus ◽  
Computational Study

Impact of Surface-Modified Nanoparticles on Glass Transition Temperature and Elastic Modulus of Polymer Thin Films

2007 ◽  
Vol 40 (22) ◽  
pp. 7755-7757 ◽  
Author(s):  
Jong-Young Lee ◽  
Kristin E. Su ◽  
Edwin P. Chan ◽  
Qingling Zhang ◽  
Todd Emrick ◽  
...  
Keyword(s):  
Thin Films ◽  
Glass Transition ◽  
Elastic Modulus ◽  
Transition Temperature ◽  
Glass Transition Temperature ◽  
Polymer Thin Films ◽  
Surface Modified ◽  
Surface Modified Nanoparticles

Growth, Structural and Mechanical Characterization and Reliability of Chemical Vapor Deposited Co and Co3O4 Thin Films as Candidate Materials for Sensing Applications

2011 ◽  
Vol 495 ◽  
pp. 108-111 ◽  
Author(s):  
Vasiliki P. Tsikourkitoudi ◽  
Elias P. Koumoulos ◽  
Nikolaos Papadopoulos ◽  
Costas A. Charitidis
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Elastic Modulus ◽  
Data Storage ◽  
Mechanical Stability ◽  
Chemical Vapor ◽  
Magnetic Sensors ◽  
Functional Coatings ◽  
Sensing Applications ◽  
Chemical Vapor Deposited

The adhesion and mechanical stability of thin film coatings on substrates is increasingly becoming a key issue in device reliability as magnetic and storage technology driven products demand smaller, thinner and more complex functional coatings. In the present study, chemical vapor deposited Co and Co3O4thin films on SiO2and Si substrates are produced, respectively. Chemical vapor deposition is the most widely used deposition technique which produces thin films well adherent to the substrate. Co and Co3O4thin films can be used in innovative applications such as magnetic sensors, data storage devices and protective layers. The produced thin films are characterized using nanoindentation technique and their nanomechanical properties (hardness and elastic modulus) are obtained. Finally, an evaluation of the reliability of each thin film (wear analysis) is performed using the hardness to elastic modulus ratio in correlation to the ratio of irreversible work to total work for a complete loading-unloading procedure.

scholarly journals Defects characterization in thin films photovoltaics materials by correlated high-frequency modulated and time resolved photoluminescence: An application to Cu(In,Ga)Se2

2019 ◽  
Vol 669 ◽  
pp. 520-524
Author(s):  
Baptiste Bérenguier ◽  
Nicolas Barreau ◽  
Alexandre Jaffre ◽  
Daniel Ory ◽  
Jean-François Guillemoles ◽  
...  
Keyword(s):  
Thin Films ◽  
High Frequency ◽  
Time Resolved ◽  
Time Resolved Photoluminescence
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