scholarly journals The Effect of Projectile Nose Shape on the Critical Velocity of High-Performance Yarn

Fibers ◽  
2019 ◽  
Vol 7 (4) ◽  
pp. 29 ◽  
Author(s):  
Boon Lim ◽  
Jou-Mei Chu ◽  
Jinling Gao ◽  
Benjamin Claus ◽  
Yizhou Nie ◽  
...  
Keyword(s):  
Critical Velocity ◽  
High Speed ◽  
High Performance ◽  
Failure Process ◽  
Hertzian Contact ◽  
Radius Of Curvature ◽  
Axial Loads ◽  
History Of ◽  
Nose Shape ◽  
Euler Bernoulli Beam

In this study, ballistic experiments were performed to determine the critical velocity of a Twaron® 2040 high-performance yarn transversely impacted by round projectiles. Four different round projectiles possessing a radius of curvature of 2 µm, 20 µm, 200 µm and 2 mm were used in this study. Load cells were mounted to the grips to measure the load history of the yarn upon impact. A high-speed camera was incorporated into the ballistic experimental setup to capture the failure process of the yarn upon impact. A scanning electron microscope was utilized to perform post-mortem failure analysis on the recovered specimens. The results showed that as the radius of curvature of the projectile increased, the critical velocity also increased. The critical velocities for all cases were bounded between those predicted from the Euler–Bernoulli beam and Smith models. Upon impact above the upper limit of the critical velocity, the axial loads revealed a demonstrative reduction. The failure surfaces changed from shear to fibrillation as the radius of curvature increased. For those specimens that failed in shear, Hertzian contact model was used to predict the critical velocity.

scholarly journals Critical Velocity of High-Performance Yarn Transversely Impacted by Razor Blade

Fibers ◽  
2018 ◽  
Vol 6 (4) ◽  
pp. 95 ◽  
Author(s):  
Boon Lim ◽  
Jou-Mei Chu ◽  
Benjamin Claus ◽  
Yizhou Nie ◽  
Wayne Chen
Keyword(s):  
Critical Velocity ◽  
High Speed ◽  
High Performance ◽  
Hertzian Contact ◽  
Beam Model ◽  
Bernoulli Beam ◽  
Razor Blade ◽  
Euler Bernoulli Beam ◽  
Bernoulli Beam Model ◽  
Hertzian Contact Model

A ballistic parameter that influences the ballistic performances of a high-performance yarn is the critical velocity. The critical velocity is defined as the projectile striking velocity that causes instantaneous rupture of the yarn upon impact. In this study, we performed ballistic experiments to determine the critical velocity of a Twaron® yarn transversely impacted by a razor blade. A high-speed camera was integrated into the experimental apparatus to capture the in-situ deformation of the yarn. The experimental critical velocity demonstrated a reduction compared to the critical velocity predicted by the classical theory. The high-speed images revealed the yarn specimen failed from the projectile side toward the free end when impacted by the razor blade. To improve the prediction capability, the Euler–Bernoulli beam and Hertzian contact models were used to predict the critical velocity. For the Euler–Bernoulli beam model, the critical velocity was obtained by assuming the specimen ruptured instantaneously when the maximum flexural strain reached the ultimate tensile strain of the yarn upon impact. On the other hand, for the Hertzian contact model, the yarn was assumed to fail when the indentation depth was equivalent to the diameter of the yarn. The errors between the average critical velocities determined from experiments and the predicted critical velocities were around 19% and 48% for the Euler–Bernoulli beam model and Hertzian contact model, respectively.

Renaissance and Progress in Nitride Semiconductors - My Personal History of Nitride Research -

2000 ◽  
Vol 639 ◽  
Author(s):  
Isamu Akasaki
Keyword(s):  
High Speed ◽  
High Performance ◽  
Green Light ◽  
Blue Laser ◽  
Personal History ◽  
Nitride Semiconductors ◽  
Quarter Century ◽  
Group Iii ◽  
History Of ◽  
Group Iii Nitride

ABSTRACTWide bandgap group-III nitride semiconductors are currently experiencing the most exciting development. High brightness blue and green light emitting diodes (LEDs) are commercialized, and UV and blue laser diodes (LDs), high-speed transistors (TRs) and UV photodetectors (PDs) with low dark current, which will be able to operate in harsh environments, have been demonstrated. In this paper, renaissance and progress in crystal growth and conductivity control of nitride semiconductors in the last quarter century are reviewed as the groundwork for all of those high-performance devices. My personal history of nitride research will be also introduced.

scholarly journals Gas Turbine Development in Sweden After 1945: A Historical Review

1998 ◽  
Author(s):  
Kjell T. E. Thoren
Keyword(s):  
Gas Turbine ◽  
Air Force ◽  
Gas Turbines ◽  
High Speed ◽  
High Performance ◽  
Historical Review ◽  
Propulsion Systems ◽  
Hybrid Propulsion ◽  
History Of ◽  
Industrial Gas Turbine

The gas turbine development history of Sweden is exciting. By international comparison Sweden and its gas turbine manufacturers are small but can nevertheless claim periods with the worlds highest output, or highest efficiency large industrial gas turbine respectively. Sweden has always created its own military aircraft and fitting, high performance engines are developed in Sweden in license cooperation with large international manufacturers. The Swedish Air Force ranked number four in the world during the 60s. Pioneering contributions were also made with small gas turbines, such as high speed turbogenerators in hybrid propulsion systems for cars and trucks. Professionals know that gas turbine development success does not come easy. A lot of setbacks have to be mastered. The size of the crew is not always significant in the process.

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

The bright future of digital imaging in scanning electron microscopy

1993 ◽  
Vol 51 ◽  
pp. 768-769
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Digital Imaging ◽  
High Speed ◽  
High Performance ◽  
Mass Storage ◽  
Analog To Digital ◽  
Central Processing ◽  
Digital Imaging Technology ◽  
Scanning Electron

One of the major advancements applied to scanning electron microscopy (SEM) during the past 10 years has been the development and application of digital imaging technology. Advancements in technology, notably the availability of less expensive, high-density memory chips and the development of high speed analog-to-digital converters, mass storage and high performance central processing units have fostered this revolution. Today, most modern SEM instruments have digital electronics as a standard feature. These instruments, generally have 8 bit or 256 gray levels with, at least, 512 × 512 pixel density operating at TV rate. In addition, current slow-scan commercial frame-grabber cards, directly applicable to the SEM, can have upwards of 12-14 bit lateral resolution permitting image acquisition at 4096 × 4096 resolution or greater. The two major categories of SEM systems to which digital technology have been applied are:In the analog SEM system the scan generator is normally operated in an analog manner and the image is displayed in an analog or "slow scan" mode.

Multiple phase transitions investigated by high-speed TEM

1990 ◽  
Vol 48 (4) ◽  
pp. 550-551
Author(s):  
Oleg Bostanjoglo ◽  
Peter Thomsen-Schmidt
Keyword(s):  
Phase Transitions ◽  
High Speed ◽  
Short Exposure ◽  
Semiconductor Film ◽  
Time Resolved ◽  
Short Exposure Time ◽  
Multiple Phase ◽  
Model Substance ◽  
History Of ◽  
Electron Image

Thin GexTe1-x (x = 0.15-0.8) were studied as a model substance of a composite semiconductor film, in addition being of interest for optical storage material. Two complementary modes of time-resolved TEM were used to trace the phase transitions, induced by an attached Q-switched (50 ns FWHM) and frequency doubled (532 nm) Nd:YAG laser. The laser radiation was focused onto the specimen within the TEM to a 20 μm spot (FWHM). Discrete intermediate states were visualized by short-exposure time doubleframe imaging /1,2/. The full history of a transformation was gained by tracking the electron image intensity with photomultiplier and storage oscilloscopes (space/time resolution 100 nm/3 ns) /3/. In order to avoid radiation damage by the probing electron beam to detector and specimen, the beam is pulsed in this continuous mode of time-resolved TEM,too.Short events ( <2 μs) are followed by illuminating with an extended single electron pulse (fig. 1c)

Performance Analysis of Various Multipliers Using 8T-full Adder with 180nm Technology

2020 ◽  
Vol 13 (6) ◽  
pp. 864-870
Author(s):  
Sai Venkatramana Prasada G.S ◽  
G. Seshikala ◽  
S. Niranjana
Keyword(s):  
Low Power ◽  
Power Dissipation ◽  
High Speed ◽  
High Performance ◽  
Full Adder ◽  
Fundamental Operation ◽  
Wallace Tree ◽  
Power Delay Product ◽  
The Comparative Study ◽  
Wallace Tree Multiplier

Background: This paper presents the comparative study of power dissipation, delay and power delay product (PDP) of different full adders and multiplier designs. Methods: Full adder is the fundamental operation for any processors, DSP architectures and VLSI systems. Here ten different full adder structures were analyzed for their best performance using a Mentor Graphics tool with 180nm technology. Results: From the analysis result high performance full adder is extracted for further higher level designs. 8T full adder exhibits high speed, low power delay and low power delay product and hence it is considered to construct four different multiplier designs, such as Array multiplier, Baugh Wooley multiplier, Braun multiplier and Wallace Tree multiplier. These different structures of multipliers were designed using 8T full adder and simulated using Mentor Graphics tool in a constant W/L aspect ratio. Conclusion: From the analysis, it is concluded that Wallace Tree multiplier is the high speed multiplier but dissipates comparatively high power. Baugh Wooley multiplier dissipates less power but exhibits more time delay and low PDP.

scholarly journals Laser Lens Size Measurement Using Swept-Source Optical Coherence Tomography

2020 ◽  
Vol 10 (14) ◽  
pp. 4936
Author(s):  
Pingping Jia ◽  
Hong Zhao ◽  
Yuwei Qin
Keyword(s):  
Optical Coherence Tomography ◽  
High Speed ◽  
Wave Number ◽  
Radius Of Curvature ◽  
Optical Coherence ◽  
Swept Source ◽  
Laser Focusing ◽  
Fitting Algorithm ◽  
Laser Confocal Microscope ◽  
Focusing Lens

A high-speed, high-resolution swept-source optical coherence tomography (SS-OCT) is presented for focusing lens imaging and a k-domain uniform algorithm is adopted to find the wave number phase equalization. The radius of curvature of the laser focusing lens was obtained using a curve-fitting algorithm. The experimental results demonstrate that the measuring accuracy of the proposed SS-OCT system is higher than the laser confocal microscope. The SS-OCT system has great potential for surface topography measurement and defect inspection of the focusing lens.

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