scholarly journals X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe3

Crystals ◽  
2019 ◽  
Vol 9 (11) ◽  
pp. 588
Author(s):  
Hui Yan ◽  
Nozomi Shirato ◽  
Xiangde Zhu ◽  
Daniel Rosenmann ◽  
Xiao Tong ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Materials Science ◽  
Real Space ◽  
Current Status ◽  
Scanning Tunneling ◽  
X Rays ◽  
Tunneling Microscopy ◽  
X Ray ◽  
First Results ◽  
Specific Mapping

Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized through excitation of core electrons by incident X-rays when their energy is tuned to an absorption edge of a particular atom during raster scanning, as is done in the conventional STM experiments. In this work, we provide a brief summary and the current status of SX-STM and discuss its applications for material science. In particular, we discuss instrumentation challenges associated with the SX-STM technique and present early experiments on Cu doped ZrTe3 single crystals.

Hard X-ray beam damage study of monolayer Ni islands using SX-STM

2015 ◽  
Vol 1754 ◽  
pp. 135-140 ◽  
Author(s):  
Nozomi Shirato ◽  
Marvin Cummings ◽  
Heath Kersell ◽  
Yang Li ◽  
Dean Miller ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
X Rays ◽  
Tunneling Microscopy ◽  
X Ray ◽  
Induced Changes ◽  
Metal Islands ◽  
Beam Damage ◽  
Damage Study

ABSTRACTX-ray beam-induced damage in nanoscale metal islands was investigated. Monolayer-high Ni islands were prepared on a Cu(111) substrate. High brilliance X-rays with photon energies between 8.45 and 8.85 keV illuminated the sample for about 11 hours. In order to track changes in the morphology of the islands, the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique was utilized. The result shows that X-ray illumination onto Ni islands does not induce noticeable damage. The study demonstrates that local beam-induced changes can be studied using SX-STM.

scholarly journals XTIP – the world's first beamline dedicated to the synchrotron X-ray scanning tunneling microscopy technique

2020 ◽  
Vol 27 (3) ◽  
pp. 836-843 ◽  
Author(s):  
Volker Rose ◽  
Nozomi Shirato ◽  
Michael Bartlein ◽  
Alex Deriy ◽  
Tolulope Ajayi ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
National Laboratory ◽  
Argonne National Laboratory ◽  
Scanning Tunneling ◽  
X Rays ◽  
Tunneling Microscopy ◽  
X Ray ◽  
Microscopy Technique ◽  
Insertion Device ◽  
Photon Source

In recent years, there have been numerous efforts worldwide to develop the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique. Here, the inauguration of XTIP, the world's first beamline fully dedicated to SX-STM, is reported. The XTIP beamline is located at Sector 4 of the Advanced Photon Source at Argonne National Laboratory. It features an insertion device that can provide left- or right-circular as well as horizontal- and vertical-linear polarization. XTIP delivers monochromatic soft X-rays of between 400 and 1900 eV focused into an environmental enclosure that houses the endstation instrument. This article discusses the beamline system design and its performance.

A study on α-RuCl3 crystal structure by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 30-31
Author(s):  
H.-J. Cantow ◽  
H. Hillebrecht ◽  
S. Magonov ◽  
H. W. Rotter ◽  
G. Thiele
Keyword(s):  
Crystal Structure ◽  
Density Distribution ◽  
Scanning Tunneling Microscopy ◽  
Electron Density ◽  
Structure Determination ◽  
Electron Density Distribution ◽  
Scanning Tunneling ◽  
Monoclinic Space Group ◽  
Tunneling Microscopy ◽  
X Ray

From X-ray analysis, the conclusions are drawn from averaged molecular informations. Thus, limitations are caused when analyzing systems whose symmetry is reduced due to interatomic interactions. In contrast, scanning tunneling microscopy (STM) directly images atomic scale surface electron density distribution, with a resolution up to fractions of Angstrom units. The crucial point is the correlation between the electron density distribution and the localization of individual atoms, which is reasonable in many cases. Thus, the use of STM images for crystal structure determination may be permitted. We tried to apply RuCl3 - a layered material with semiconductive properties - for such STM studies. From the X-ray analysis it has been assumed that α-form of this compound crystallizes in the monoclinic space group C2/m (AICI3 type). The chlorine atoms form an almost undistorted cubic closed package while Ru occupies 2/3 of the octahedral holes in every second layer building up a plane hexagon net (graphite net). Idealizing the arrangement of the chlorines a hexagonal symmetry would be expected. X-ray structure determination of isotypic compounds e.g. IrBr3 leads only to averaged positions of the metal atoms as there exist extended stacking faults of the metal layers.

scholarly journals Interface morphology of a Cr(001)/Fe(001) superlattice determined by scanning tunneling microscopy and x-ray diffraction: A comparison

2001 ◽  
Vol 89 (1) ◽  
pp. 181-187 ◽  
Author(s):  
C. M. Schmidt ◽  
D. E. Bürgler ◽  
D. M. Schaller ◽  
F. Meisinger ◽  
H.-J. Güntherodt ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Scanning Tunneling ◽  
Interface Morphology ◽  
X Ray Diffraction ◽  
Tunneling Microscopy ◽  
X Ray

scholarly journals Structural determination of the Si(111) √3×√3-Bi surface by x-ray standing waves and scanning tunneling microscopy

1994 ◽  
Vol 50 (16) ◽  
pp. 12246-12249 ◽  
Author(s):  
J. C. Woicik ◽  
G. E. Franklin ◽  
Chien Liu ◽  
R. E. Martinez ◽  
I.-S. Hwong ◽  
...  
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Standing Waves ◽  
Scanning Tunneling ◽  
Structural Determination ◽  
Tunneling Microscopy ◽  
X Ray
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