scholarly journals Effect of Annealing on Innovative CsPbI3-QDs Doped Perovskite Thin Films

Crystals ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 101
Author(s):  
Pao-Hsun Huang ◽  
Yu-Hao Chen ◽  
Shui-Yang Lien ◽  
Kuan-Wei Lee ◽  
Na-Fu Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Full Width Half Maximum ◽  
Annealing Temperature ◽  
Full Width ◽  
Half Maximum ◽  
Lead Iodide ◽  
High Quality ◽  
Peak Fitting ◽  
Hot Injection ◽  
Different Temperatures

In this study, a simple hot-injection method to synthesize high-quality inorganic perovskite cesium lead iodide (CsPbI3) quantum-dots (QDs) was demonstrated. Adding CsPbI3 QDs into the organic perovskite methylamine lead triiodide (CH3NH3PbI3) to form a composite perovskite film, annealed by different temperatures, was found to be effectively enhanced by the perovskite crystallization. The intensity of the preferred peak (110) of MAPbI3 was enhanced by increasing the size of the crystal and reducing the cluster crystal. The densest film can be found at annealing temperature of 140 °C. The full width half maximum of MAPbI3 and CsPbI3 was analyzed through XRD peak fitting. This was a huge breakthrough for QDs doped perovskite films.

scholarly journals micro-Raman and micro-Photoluminescence study of ZnO thin films

2021 ◽  
Vol 24 (1) ◽  
pp. 1-8
Author(s):  
M.A. Urbina-Yarupetan ◽  
J.C. González
Keyword(s):  
Thin Films ◽  
Full Width Half Maximum ◽  
Laser Light ◽  
Experimental Results ◽  
Zno Thin Films ◽  
Full Width ◽  
Half Maximum ◽  
Optical Analysis ◽  
Photoluminescence Study ◽  
Commercial Glass

We present the experimental results of optical analysis of nanostructured ZnO thin films grown onto commercial glass by reactive sputtering. Films with 20, 50, and 100 nm in thickness were analyzed by micro-Raman and micro-photoluminescence spectroscopies. Raman and photoluminescence bands were deconvoluted with Lorentzian profiles, in order to obtain information about response of films to excitation with laser light, occurring changes in position, full width half maximum (FWHM), and area of each phonon and emission bands of ZnO, correlating them with its nanostructure nature, and packing morphology of ZnO nanocolumns.

Strain in Epitaxial BaTiO3 Thin Films Prepared by MOCVD

1998 ◽  
Vol 541 ◽  
Author(s):  
S. Chattopadhyay ◽  
A. Teren ◽  
B.W. Wessels
Keyword(s):  
Thin Films ◽  
Film Thickness ◽  
Full Width Half Maximum ◽  
Diffraction Peak ◽  
Full Width ◽  
Half Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Diffraction Peaks

AbstractThe microstrain in epitaxial BaTiO3 thin films has been investigated using x-ray diffraction. The full width half maximum of the (001) diffraction peaks ranged from 0.12 to 0.49 deg. From the analysis of the angular dependence of the diffraction peak broadening, it is concluded that the broadening is due predominantly to strain. The magnitude of the microstrain decreases sharply with increasing film thickness.

scholarly journals Optimizing the Properties of La0.8Sr0.2CrO3 Thin Films through Post-Annealing for High-Temperature Sensing

Nanomaterials ◽  
2021 ◽  
Vol 11 (7) ◽  
pp. 1802
Author(s):  
Dan Liu ◽  
Peng Shi ◽  
Yantao Liu ◽  
Yijun Zhang ◽  
Bian Tian ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Annealing Temperature ◽  
Rf Sputtering ◽  
Maximum Size ◽  
Cross Sectional ◽  
Post Annealing ◽  
Maximum Conductivity ◽  
Different Temperatures ◽  
Post Annealing Temperature

La0.8Sr0.2CrO3 (0.2LSCO) thin films were prepared via the RF sputtering method to fabricate thin-film thermocouples (TFTCs), and post-annealing processes were employed to optimize their properties to sense high temperatures. The XRD patterns of the 0.2LSCO thin films showed a pure phase, and their crystallinities increased with the post-annealing temperature from 800 °C to 1000 °C, while some impurity phases of Cr2O3 and SrCr2O7 were observed above 1000 °C. The surface images indicated that the grain size increased first and then decreased, and the maximum size was 0.71 μm at 1100 °C. The cross-sectional images showed that the thickness of the 0.2LSCO thin films decreased significantly above 1000 °C, which was mainly due to the evaporation of Sr2+ and Cr3+. At the same time, the maximum conductivity was achieved for the film annealed at 1000 °C, which was 6.25 × 10−2 S/cm. When the thin films post-annealed at different temperatures were coupled with Pt reference electrodes to form TFTCs, the trend of output voltage to first increase and then decrease was observed, and the maximum average Seebeck coefficient of 167.8 µV/°C was obtained for the 0.2LSCO thin film post-annealed at 1100 °C. Through post-annealing optimization, the best post-annealing temperature was 1000 °C, which made the 0.2LSCO thin film more stable to monitor the temperatures of turbine engines for a long period of time.

Comparison of the distributions of galactic y-radiation and radio synchrotron radiation

1981 ◽  
Vol 301 (1462) ◽  
pp. 573-575 ◽  
Keyword(s):  
Radio Emission ◽  
Full Width Half Maximum ◽  
Detailed Comparison ◽  
Full Width ◽  
Half Maximum ◽  
Brightness Temperatures ◽  
Point Spread ◽  
Sky Survey ◽  
Spread Function ◽  
Continuum Radio

We have used the new all-sky survey of continuum radio emission at 408 MHz of Haslam et al. (1981 a, b ) to compare the distribution of radio emission in a band along the galactic equator for [ b ] < 20° with the COS-B y-ray distribution of Mayer-Hasselwander et al. (1980). The radio survey has resolution with full width half-maximum (f.w.h.m.) of 51 arc min and the data are brightness temperatures at 20' intervals in galactic coordinates. Such comparisons have been made before (see, for example, Jakel et al. 1975; Paul et al. 1976; Higdon 1979) with earlier y-ray data but this is the first in which the radio data have been in a form allowing a detailed comparison after convolution with the point spread function of the y-ray detector.

scholarly journals Chemical Solution Deposition of BaxSr1-xTiO3 Thin Films for Energy Storage Applications

Proceedings ◽  
2020 ◽  
Vol 56 (1) ◽  
pp. 9
Author(s):  
Federica Benes ◽  
Mirela Dragomir ◽  
Barbara Malič ◽  
Marco Deluca
Keyword(s):  
Thin Films ◽  
Crystal Growth ◽  
Chemical Solution Deposition ◽  
Annealing Temperature ◽  
Chemical Solution ◽  
Solution Deposition ◽  
Annealing Conditions ◽  
Different Temperatures ◽  
Energy Storage Applications ◽  
Xrd Techniques

Highly textured Ba0.5Sr0.5TiO3 and Ba0.6Sr0.4TiO3 thin films have been successfully processed using chemical solution deposition (CSD) techniques and annealed at different temperatures to investigate the influence on crystal growth. Microstructure and texture have been evaluated using SEM and XRD techniques. The films showed a homogeneous thickness of ~120 nm and the grain growth seemed to be highly influenced by the annealing temperature. Moreover, by tuning the deposition and annealing conditions, an almost epitaxial growth of Ba0.6Sr0.4TiO3 on the platinized silicon substrate has been achieved. Nevertheless, the samples showed severe cracking due to the strain imposed by the substrate or due to the growing direction.

On the problem of overlapping ω scans measured on thin films deposited on monocrystal substrates

1999 ◽  
Vol 32 (4) ◽  
pp. 736-743 ◽  
Author(s):  
D. Machajdík ◽  
A. Pevala ◽  
A. Rosová ◽  
K. Fröhlich ◽  
J. Šouc ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Spectral Characteristics ◽  
Full Width ◽  
X Ray Diffraction ◽  
Resolution Function ◽  
High Quality ◽  
Experimental Procedure ◽  
X Ray ◽  
Crystallographic Planes

CeO2thin films deposited on sapphire monocrystal substrates were used for an experimental study of the nature of extremely narrow overlapped maxima on X-ray diffraction ω scans. Full width at half-maximum (FWHM) values of such maxima typically reached the resolution function of the diffractometer. A comparative study of the influence of various diffractometer set-ups on the spectral characteristics of the X-ray beam in relation to the above-mentioned phenomenon was carried out. A surrounding (λmin− λmax) or (2θmin− 2θmax) of the strong substrate reflection was obtained, where a substrate contribution to an ω scan measured on thin-film reflection can be expected. Two possible origins of the narrow maxima are discussed: (a) a contribution of a part of the X-ray beam having λ ≠ λKαthat diffracts on a set of substrate crystallographic planes parallel to the thin-film crystallographic planes used for the ω-scan measurement; and (b) the presence in part of the thin film of a perfect monocrystal-like quality with practically no mosaicity. The principles of this approach and experimental procedure are reported, and on this basis it is possible to distinguish between the two possible origins of the narrow overlapped maxima. It is shown that under appropriate conditions, an extremely high quality CeO2thin film can be grown. The FWHM value of its ω scan can reach the value of diffractometer instrumental broadening obtained for a perfect monocrystal.

Change in yhe Optical Properties of Sapphire Induced by Ion Implantation

1997 ◽  
Vol 504 ◽  
Author(s):  
D. Ila ◽  
E. K. Williams ◽  
S. Sarkisov ◽  
D. B. Poker ◽  
D. K. Hensley
Keyword(s):  
Optical Properties ◽  
Optical Absorption ◽  
Full Width Half Maximum ◽  
Rutherford Backscattering Spectrometry ◽  
Full Width ◽  
Half Maximum ◽  
Transmission Electron ◽  
Before And After ◽  
Linear Optical Properties ◽  
Average Size

ABSTRACTWe have studied the formation of nano-crystals, after implantation of 2.0 MeV gold, 1.5 MeV silver, 160 keV copper and 160 keV tin into single crystal of A12O3. We also studied the change in the linear optical properties of the implanted Al2O3 before and after subsequent annealing by measuring the increase in resonance optical absorption. Applying Doyle's theory and the results obtained from Rutherford backscattering spectrometry (RBS) as well as the full width half maximum of the absorption band from Optical Absorption Photospectrometry (OAP), we measured the average size of the metallic clusters for each sample after heat treatment. The formation and crystallinity of the nanoclusters were also confirmed using transmission electron microscopy (TEM) technique.

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