scholarly journals Microwave Spectroscopic Detection of Human Hsp70 Protein on Annealed Gold Nanostructures on ITO Glass Strips

Biosensors ◽  
2018 ◽  
Vol 8 (4) ◽  
pp. 118
Author(s):  
Rodica Ionescu ◽  
Raphael Selon ◽  
Nicolas Pocholle ◽  
Lan Zhou ◽  
Anna Rumyantseva ◽  
...  

Conductive indium-tin oxide (ITO) and non-conductive glass substrates were successfully modified with embedded gold nanoparticles (AuNPs) formed by controlled thermal annealing at 550 °C for 8 h in a preselected oven. The authors characterized the formation of AuNPs using two microscopic techniques: scanning electron microscopy (SEM) and atomic force microscopy (AFM). The analytical performances of the nanostructured-glasses were compared regarding biosensing of Hsp70, an ATP-driven molecular chaperone. In this work, the human heat-shock protein (Hsp70), was chosen as a model biomarker of body stress disorders for microwave spectroscopic investigations. It was found that microwave screening at 4 GHz allowed for the first time the detection of 12 ng/µL/cm2 of Hsp70.

2013 ◽  
Vol 537 ◽  
pp. 109-113
Author(s):  
Xi Wei Qi ◽  
Xiao Yan Zhang ◽  
Xuan Wang ◽  
Hai Bin Sun ◽  
Jian Quan Qi

A series of Dy doped La and Sc solution of BiFeO3 thin films have been prepared by using spin-coating process on conductive indium tin oxide (ITO)/glass substrates, which a simple sol-gel possess is applied and annealed at 500°C. With the increase of content of Dy, the strongest peak (110) of La and Sc solution BiFeO3 film tends to further broaden. There is no second phase existence within the present Dy doping level. Cross section scanning electron microscope (SEM) pictures revealed that the thickness of BiFeO3 film was about 370 nm. For Dy doping level is 0.05, the maximum double remanent polarization 2Pr of as-prepared BiFeO3 thin film is15.44 μC/cm2. Image of atomic force microscopy indicated that the root-mean-square surface roughness value of as-prepared BiFeO3 thin film is 2.11 nm. The dielectric constant of as-prepared films tends to firstly increase and then decrease with the increase of Dy content


2011 ◽  
Vol 492 ◽  
pp. 202-205 ◽  
Author(s):  
Xi Wei Qi ◽  
Xiao Yan Zhang ◽  
Xuan Wang ◽  
Hai Bin Sun ◽  
Jian Quan Qi

BiFeO3 thin films were spin-coated on conductive indium tin oxide (ITO)/glass substrates by a simple sol-gel possess annealed at 470-590°C. The crystal structure of as-prepared BiFeO3 thin films annealed at different temperature was determined to be rhombohedral of R3m space and free of secondary phases was also confirmed. Cross section scanning electron microscope (SEM) pictures revealed that the thickness of BiFeO3 thin film was about 320 nm. The double remanent polarization 2Pr of BiFeO3 thin film annealed at 500°C is 2.5 μC/cm2 without applied field at room temperature. Image of atomic force microscopy indicated that the root-mean-square surface roughness value of BiFeO3 thin film was 6.13 nm.


2020 ◽  
Vol 2 ◽  
Author(s):  
Indra Sulania ◽  
R. Blessy Pricilla ◽  
G. B. V. S. Lakshmi

Nanocomposite materials are multi-phase materials, usually solids, which have two or more component materials having different chemical and physical properties. When blended together, a newer material is formed with distinctive properties which make them an eligible candidate for many important applications. In the present study, thin films of nafion (polymer) and hematite or α-Fe2O3 (nanoparticles) nanocomposite is fabricated on indium tin oxide (ITO) coated glass substrates, due to its enhanced ionic conductivity, for cholesterol biosensor applications. Scanning electron microscopy and Atomic force microscopy revealed the formation of nanorod structured α-Fe2O3 in the films. The cyclic voltammetry (CV) studies of nafion-α-Fe2O3/ITO revealed the redox properties of the nanocomposites. The sensing studies were performed on nafion-α-Fe2O3/CHOx/ITO bioelectrode using differential pulse voltammetry (DPV) at various concentrations of cholesterol. The enzyme immobilization leaded to the selective detection of cholesterol with a sensitivity of 64.93 × 10−2 μA (mg/dl)−1 cm−2. The enzyme substrate interaction (Michaelis–Menten) constant Km, was obtained to be 19 mg/dl.


Micromachines ◽  
2021 ◽  
Vol 12 (3) ◽  
pp. 275
Author(s):  
Pengcheng Wang ◽  
Rodica Elena Ionescu

Round, small-sized coverslips were coated for the first time with thin layers of indium tin oxide (ITO, 10–40 nm)/gold (Au, 2–8 nm) and annealed at 550 °C for several hours. The resulting nanostructures on miniaturized substrates were further optimized for the localized surface plasmon resonance (LSPR) chemosensing of a model molecule—1,2-bis-(4-ppyridyl)-ethene (BPE)—with a detection limit of 10−12 M BPE in an aqueous solution. All the fabrication steps of plasmonic-annealed platforms were characterized using scanning electron microscopy (SEM) and atomic force microscopy (AFM).


2018 ◽  
Vol 1 (1) ◽  
pp. 565-571
Author(s):  
Zouaoui Ahmed

In this paper, we report on an analysis carried out by using cyclic voltammetric (CV) and chronoamperometric (CA) techniques on the reaction and nucleation mechanisms of electrodeposited copper on indium-doped tin oxide (ITO)-coated glass substrates from sulfate solutions. The present investigation has been performed in an acid solution at pH 5. The Scharifker and Hills model were used to analyze current transients. At relatively low overpotentials, the copper deposition can be described by a model involving instantaneous nucleation on active sites and diffusion-controlled 3D growth. The values of diffusion coefficient D for Cu2+ ions are estimated. Atomic force microscopy (AFM) has been used to check on the samples’ surface morphology.


2014 ◽  
Vol 970 ◽  
pp. 102-105
Author(s):  
Jian Wei Hoon ◽  
Kah Yoong Chan ◽  
Cheng Yang Low

In this work, silicon dioxide (SiO2) films were fabricated on indium tin oxide (ITO) coated glass substrates by radio frequency (RF) magnetron sputtering deposition technique. The deposition rate of the magnetron sputtered SiO2 films was investigated. The SiO2 films were characterized with the atomic force microscopy (AFM) for their surface topology. In addition, the electrical insulating strength of the magnetron sputtered SiO2 was examined.


2014 ◽  
Vol 894 ◽  
pp. 381-385 ◽  
Author(s):  
Siti Zairyn Fakurol Rodzi ◽  
Yusairie Mohd

Nickel oxide thin films were electrodeposited onto ITO glass substrates by a two-step method: i) electrodeposition of nickel and ii) further thermal oxidation at 300 °C. The surface morphology of the NiO thin films was characterized by atomic force microscopy (AFM) and the transmittance in the coloured and bleached states were analysed using UV-Visible (UV-Vis) spectroscopy. The electrochemical properties of NiO films were measured in 1 M KOH electrolyte by cyclic voltammetry (CV). A good optical quality and highly improved electrochromic performances NiO film was successfully synthesized.


2010 ◽  
Vol 75 ◽  
pp. 118-123
Author(s):  
Elena Dilonardo ◽  
Maria M. Giangregorio ◽  
Maria Losurdo ◽  
Pio Capezzuto ◽  
Giovanni Bruno ◽  
...  

There has been growing interest in developing new semiconducting polymers for applications in optoelectronics (OLEDs) due to their exceptional processability and appealing characteristic of manipulating electronic and optical properties by tuning of molecular structure and self-assembling. This study is an investigation on the interplay among supermolecular organization and optical properties of thin films of the poly[2-(2-ethylhexyloxy)-5-methoxy]-1, 4-phenylenedifluorovinylene (MEH-PPDFV) conjugated polymer, which has fluorinated vinylene units. This interplay is elucidated exploiting atomic force microscopy, spectroscopy ellipsometry, photoluminescence and electroluminescence. Thin films of MEH-PPDFV have been deposited by drop casting on indium-tin-oxide (ITO), quartz and glass substrates. The dependence of polymer chains self-organization and morphology on substrate surface is presented. Furthermore, it is demonstrated that the presence of F-atoms in the vinylene units of the MEH-PPDFV yields a blue optical band gap with the maximum of the fundamental HOMO-LUMO transition at 331 nm and photoluminescence at 458 nm. The OLED built with the above polymer shows a very stable blue-greenish electroluminescence that is also achieved at 504 nm.


Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3307
Author(s):  
Flavia P. N. Inbanathan ◽  
Pawan Kumar ◽  
Kiran Dasari ◽  
Ram S. Katiyar ◽  
Jixin Chen ◽  
...  

Cadmium selenide (CdSe) thin films were deposited on indium tin oxide (ITO) coated glass substrates using pulsed laser deposition (PLD) technique under different growth temperatures. Samples were investigated for their structural, morphological, and optical properties through X-ray diffraction (XRD), atomic force microscopy (AFM), and UV-Vis-NIR spectroscopy. AFM analysis revealed that the surface roughness of the as-grown CdSe thin films increased with the increase in deposition temperature. The optical constants and film thickness were obtained from spectroscopic ellipsometry analysis and are discussed in detail. The optical band gap of the as-grown CdSe thin films, calculated from the Tauc plot analysis, matched with the ellipsometry measurements, with a band gap of ~1.71 eV for a growth temperature range of 150 °C to 400 °C. The CdSe thin films were found to have a refractive index of ~3.0 and extinction coefficient of ~1.0, making it a suitable candidate for photovoltaics.


2018 ◽  
Vol 786 ◽  
pp. 373-383
Author(s):  
Heba R. Abd El-Aaty ◽  
Osama Tobail ◽  
Madiha A. Shoeib ◽  
Iman El-Mahallawi

Thin films of mixed amorphous/ microcrystalline-phases have been researched during the last decade, for manufacturing silicon solar cells. In this work the Plasma Enhanced Chemical Vapor Deposition PECVD process parameters; namely dilution ratios and substrate temperature, were controlled to build i-layer at low dilution ratios with moderate substrate temperatures. In this work an intrinsic layer was deposited on Indium Tin Oxide ITO glass by PECVD technique, with different dilution ratios of silane in hydrogen to study the transition from amorphous to microcrystalline phase. The Si:H thin film was evaluated by field emission scanning electron microscopy, x-ray diffraction and atomic force microscopy. The structural transition between a-Si:H to μc-Si:H achieved at dilution ratio 13.3 and substrate temperature 250°C with surface roughness 22.5 nm.


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