scholarly journals Multi-Wavelength Digital-Phase-Shifting Moiré Based on Moiré Wavelength

2019 ◽  
Vol 9 (9) ◽  
pp. 1917 ◽  
Author(s):  
Fatemeh Mohammadi ◽  
Jonathan Kofman

Multi-wavelength digital-phase-shifting moiré was demonstrated using multiple moiré wavelengths determined by system calibration over the full working depth. The method uses the extended noisy phase map as a reference to unwrap the phase map with a shorter wavelength, and thus achieve a less noisy and more accurate continuous phase map. The moiré wavelength calibration determines a moiré-wavelength to height relationship that permits pixelwise refinement of the moiré wavelength and height during 3D reconstruction. Only a single pattern has to be projected and, thus, a single image captured to compute each phase map with a different wavelength to perform digital-phase-shifting moiré temporal phase unwrapping. Only two captured images are required for two-wavelength phase unwrapping and three captured images for three-wavelength phase unwrapping. The method has been demonstrated in the 3D surface-shape measurement of an object with surface discontinuities and spatially isolated objects.

2012 ◽  
Vol 6-7 ◽  
pp. 76-81
Author(s):  
Yong Liu ◽  
Ding Fa Huang ◽  
Yong Jiang

Phase-shifting interferometry on structured light projection is widely used in 3-D surface measurement. An investigation shows that least-squares fitting can significantly decrease random error by incorporating data from the intermediate phase values, but it cannot completely eliminate nonlinear error. This paper proposes an error-reduction method based on double three-step phase-shifting algorithm and least-squares fitting, and applies it on the temporal phase unwrapping algorithm using three-frequency heterodyne principle. Theoretical analyses and experiment results show that this method can greatly save data acquisition time and improve the precision.


Optik ◽  
2001 ◽  
Vol 112 (11) ◽  
pp. 515-520 ◽  
Author(s):  
R.A. Martínez-Celorio ◽  
A. Dávila ◽  
B. Barrientos ◽  
J.H. Puga ◽  
Luis Martí López

1998 ◽  
Vol 14 (1) ◽  
pp. 31-39 ◽  
Author(s):  
C. W. Chen ◽  
H. Y. Chang ◽  
C. K. Lee

ABSTRACTPhase shifting technique is one of the most important technologies in the metrology field. Simply by performing an interferogram measurement, and then adopting the phase shifting technique to unwrap the interferogram into a phase map, tasks such as object surface profile reconstruction, holographic interferometry, electronic speckle pattern interferometry, etc., can all be easily accomplished. An innovative phase shifting system, which uses piezoelectric actuators to execute phase shifting first and then implementing a cellular automata algorithm to unwrap phase data, was designed, built, and tested. Since cellular automata is a true parallel process, and noise appearing within the interferogram will not get propagated, this novel system is far more robust than the systems based on the traditional path following phase-unwrapping algorithm. In addition, this new algorithm also provides us with a way to adopt phase-masks within the cellular automata implementations of the phase unwrap operations. All these newly developed techniques make this newly developed system adaptable to many metrology applications, even when high noise is present or when lateral shear exists within the image field. The successful incorporation of the phase-mask approach into the cellular automata phase unwrapping algorithm essentially makes this newly developed system adaptable to take phase map measurements in many practical applications.


1994 ◽  
Vol 33 (29) ◽  
pp. 6725 ◽  
Author(s):  
J. A. Quiroga ◽  
E. Bernabeu

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