scholarly journals 3D Strain Mapping of Opaque Materials Using an Improved Digital Volumetric Speckle Photography Technique with X-Ray Microtomography

2019 ◽  
Vol 9 (7) ◽  
pp. 1418 ◽  
Author(s):  
Lingtao Mao ◽  
Haizhou Liu ◽  
Ying Zhu ◽  
Ziyan Zhu ◽  
Rui Guo ◽  
...  
Keyword(s):  
Composite Beam ◽  
Speckle Photography ◽  
Woven Composite ◽  
Strain Mapping ◽  
Strain Fields ◽  
X Ray ◽  
Red Sandstone ◽  
Three Point Bending ◽  
Multi Scale ◽  
Calculation Process

Digital volumetric speckle photography (DVSP) method has been used to strain investigation in opaque materials. In this paper, an improved DVSP algorithm is introduced, in which a multi-scale coarse–fine subset calculation process and a subvoxel shifting technique are applied to increase accuracy. We refer to the new algorithm as Multi-scale and Subvoxel shifting Digital Volumetric Speckle Photography (MS-DVSP). The displacement and strain fields of a red sandstone cylinder exposed to uniaxial compression and a woven composite beam under three-point bending are mapped in detail. The characteristics of the interior deformation of the specimens are clearly depicted, thus elucidating the failure mechanism of the materials.

Interior 3D-Strain Mapping in Opaque Materials Using Digital Volumetric Speckle Photography and X-Ray Micro Computer Tomography

2015 ◽  
Vol 782 ◽  
pp. 345-348
Author(s):  
Ling Tao Mao ◽  
Qian Wen Sun ◽  
Fu Pen Chiang
Keyword(s):  
Computer Tomography ◽  
Solid Mechanics ◽  
Strain Analysis ◽  
Speckle Photography ◽  
Micro Ct ◽  
Strain Mapping ◽  
X Ray ◽  
Red Sandstone ◽  
Experimental Stress Analysis ◽  
Analysis Technique

Developing a true 3D experimental stress analysis technique has been the holy grail of solid mechanics researchers since the genesis of the field. Combined the high-resolution x-ray computer tomography (Micro CT) with the 2D speckle photography technique developed by one of us (Chiang), we recently proposed a new 3D strain analysis technique called Digital Volumetric Speckle Photography (DVSP). The elements of DVSP technique are as follows. A reference volumetric image of the specimen is recorded by a Micro-CT scan and stored as a reference. Under load the deformed CT image of the specimen is also recorded. Both volume images are divided into subimages of certain voxel arrays. Each corresponding pair of the subimages are ‘compared’ via a two-step 3D Fourier Transform analysis. The result is a 3D map of displacement vectors representing the collective displacement experienced by all the speckles within the subset of voxels. Strain distribution of the entire specimen can then be calculated using appropriate displacement strain relations. Application of this technique to strain mapping of red sandstone and composite are presented.

scholarly journals Strain mapping on gold thin film buckling and silicon blistering

2005 ◽  
Vol 875 ◽  
Author(s):  
P. Goudeau ◽  
N. Tamura ◽  
G. Parry ◽  
J. Colin ◽  
C. Coupeau ◽  
...  
Keyword(s):  
Thin Film ◽  
X Ray Diffraction ◽  
Crystal Surfaces ◽  
Strain Mapping ◽  
Strain Fields ◽  
Single Crystal Surfaces ◽  
X Ray ◽  
Gold Thin Film ◽  
Compressive Stresses ◽  
Strain Stress

AbstractStress/Strain fields associated with thin film buckling induced by compressive stresses or blistering due to the presence of gas bubbles underneath single crystal surfaces are difficult to measure owing to the microscale dimensions of these structures. In this work, we show that micro Scanning X-ray diffraction is a well suited technique for mapping the strain/stress tensor of these damaged structures.

Multi-scale Investigation of Heterogeneous Swift Heavy Ion Tracks in Stannate Pyrochlore

2021 ◽  
Author(s):  
Eric O'Quinn ◽  
Cameron Tracy ◽  
William F. Cureton ◽  
Ritesh Sachan ◽  
Joerg C. Neuefeind ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
X Ray ◽  
Structural Modifications ◽  
Multi Scale ◽  
Ion Tracks ◽  
Swift Heavy Ion ◽  
Transmission Electron

Er2Sn2O7 pyrochlore was irradiated with swift heavy Au ions (2.2 GeV), and the induced structural modifications were systematically examined using complementary characterization techniques including transmission electron microscopy (TEM), X-ray diffraction...

Multi-Scale Modeling of Neural Structure in X-Ray Imagery

2021 ◽  
Author(s):  
Aishwarya Balwani ◽  
Joseph Miano ◽  
Ran Liu ◽  
Lindsey Kitchell ◽  
Judy A. Prasad ◽  
...  
Keyword(s):  
Neural Structure ◽  
X Ray ◽  
Multi Scale ◽  
Scale Modeling ◽  
Multi Scale Modeling

scholarly journals Multi-Scale Studies of 3D Printed Mn–Na–W/SiO2 Catalyst for Oxidative Coupling of Methane

Catalysts ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 290
Author(s):  
Tim Karsten ◽  
Vesna Middelkoop ◽  
Dorota Matras ◽  
Antonis Vamvakeros ◽  
Stephen Poulston ◽  
...  
Keyword(s):  
Oxidative Coupling ◽  
Oxidative Coupling Of Methane ◽  
Operating Conditions ◽  
Homogeneous Distribution ◽  
Silica Support ◽  
X Ray Diffraction ◽  
Cross Sectional ◽  
X Ray ◽  
Multi Scale ◽  
3D Printed

This work presents multi-scale approaches to investigate 3D printed structured Mn–Na–W/SiO2 catalysts used for the oxidative coupling of methane (OCM) reaction. The performance of the 3D printed catalysts has been compared to their conventional analogues, packed beds of pellets and powder. The physicochemical properties of the 3D printed catalysts were investigated using scanning electron microscopy, nitrogen adsorption and X-ray diffraction (XRD). Performance and durability tests of the 3D printed catalysts were conducted in the laboratory and in a miniplant under real reaction conditions. In addition, synchrotron-based X-ray diffraction computed tomography technique (XRD-CT) was employed to obtain cross sectional maps at three different positions selected within the 3D printed catalyst body during the OCM reaction. The maps revealed the evolution of catalyst active phases and silica support on spatial and temporal scales within the interiors of the 3D printed catalyst under operating conditions. These results were accompanied with SEM-EDS analysis that indicated a homogeneous distribution of the active catalyst particles across the silica support.

Use of coherent X-ray diffraction to map strain fields in nanocrystals

2001 ◽  
Vol 182 (3-4) ◽  
pp. 186-191 ◽  
Author(s):  
I.K. Robinson ◽  
I.A. Vartanyants
Keyword(s):  
X Ray Diffraction ◽  
Strain Fields ◽  
X Ray
Sign in / Sign up

Export Citation Format

Share Document