scholarly journals High Resolution STEM Images of the Human Tooth Enamel Crystals

2021 ◽  
Vol 11 (16) ◽  
pp. 7477
Author(s):  
José Reyes-Gasga ◽  
Etienne F. Brès
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Tooth Enamel ◽  
Dark Field ◽  
Human Tooth ◽  
Dark Line ◽  
Human Tooth Enamel ◽  
Transmission Electron ◽  
Annular Dark Field

High-resolution scanning transmission electron microscopy (STEM) images of human tooth enamel crystals, mainly in the high-angle annular dark-field (STEM-HAADF) mode, are presented in this work along the [1000], [10-11]. and [1-210] directions. These images allow knowing some structural details at the nanometric level of the human tooth enamel crystals and of the central dark line (CDL) observed at their centers. The transmission electron microscopy (TEM) and high-resolution TEM (HRTEM) images of the CDL showed the Fresnel contrast. In the STEM bright-field (STEM-BF) and annular-dark-field (STEM-ADF) images, the CDL was observed as an unstrain hydroxyapatite (HAP)-like zone but surrounded by a strained zone. In the STEM-HAADF images, the CDL appeared with a weak contrast, and its contrasts’ thickness was registered between 3 and 8 Å. The arrangement obtained in the STEM-HAADF images by identifying the bright points with the Ca atoms produced the superposition of the HAP atomic sites, mainly along the [0001] direction. The findings provide further information on the structure details at the center of enamel crystals, which favors the anisotropic carious dissolution at the CDL.

Aberration-Corrected Transmission Electron Microscopic Study of the Central Dark Line Defect in Human Tooth Enamel Crystals

2016 ◽  
Vol 22 (5) ◽  
pp. 1047-1055 ◽  
Author(s):  
José Reyes-Gasga ◽  
Joseph Hémmerlé ◽  
Etienne F. Brès
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tooth Enamel ◽  
Dark Field ◽  
Human Tooth ◽  
Dark Line ◽  
Human Tooth Enamel ◽  
Transmission Electron ◽  
Annular Dark Field ◽  
Aberration Corrected

AbstractAngstrom resolution images of human tooth enamel (HTE) crystallites were obtained using aberration-corrected high-resolution transmission electron microscopy and atomic-resolution scanning transmission electron microscopy in the modes of bright field, annular dark field, and high-angle annular dark-field. Images show that the central dark line (CDL) defect observed around the center of the HTE crystals is a site for caries formation in the HTE and has a thickness of ~0.2 nm. Results also suggest that the CDL goes through one of the OH− planes.

scholarly journals De los micrómetros a los picómetros: evolución de las técnicas de microscopia para el estudio de nanomateriales

2019 ◽  
Vol 12 (23) ◽  
pp. 1
Author(s):  
Margarita Rivera Hernandez ◽  
Jesús Arenas-Alatorre
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
High Angle ◽  
Scanning Transmission Electron ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field

Sin lugar a duda, las técnicas de microscopía electrónica (ME) y microscopia de sonda de barrido (SPM) han contribuido enormemente al estudio de nanomateriales, dando información de propiedades morfológicas, estructurales, de superficie, eléctricas y magnéticas, entre muchas otras. Las técnicas más empleadas para estudios a nanoescala han sido las microscopías electrónicas de transmisión y barrido, y por otro lado, las de efecto túnel y de fuerza atómica, respectivamente. Los avances tecnológicos en los últimos años de estas técnicas han permitido límites de resolución que hace 25 años era inimaginables, siendo los últimos valores alcanzados de decenas de picómetros (10<sup>-12</sup> m). Cabe señalar, que más allá de esto, las técnicas de microscopia mencionadas han crecido en sus capacidades de análisis en el campo de las nanociencias y nanotecnología, dando lugar a otras técnicas como microscopía electrónica de barrido por transmisión (STEM, del inglés Scanning Transmission Electron Microscopy), Imagen en campo obscuro a ángulo grande en alta resolución (HR-HAADF, del inglés High Resolution - High Angle Annular Dark Field), Crio-Microscopía Electrónica, Tomografía electrónica, Espectroscopía de tunelamiento, Tunelamiento inelástico, Curvas de fuerza, etc. Lo anterior, no solo ha complementado la información morfológica y estructural, sino que también, ha contribuido al entendimiento de fenómenos de interacción y propiedades fisicoquímicas a escalas atómicas y moleculares. En este artículo se hace un análisis de la trascendencia actual que tienen las técnicas de microscopía electrónica, así como las de microscopia de sonda de barrido (SPM), y se menciona brevemente el alcance de estas técnicas como métodos de modificación de superficies a ultra alta resolución, como el caso de la nanolitografía y nanomanipulación, que estan abriendo un panorama enorme en el desarrollo de las  tecnologías del futuro.

scholarly journals Evidence of a minority monoclinic LaNiO2.5 phase in lanthanum nickelate thin films

2017 ◽  
Vol 19 (13) ◽  
pp. 9137-9142 ◽  
Author(s):  
L. López-Conesa ◽  
J. M. Rebled ◽  
D. Pesquera ◽  
N. Dix ◽  
F. Sánchez ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Dark Field ◽  
High Angle ◽  
Transmission Electron ◽  
Lanthanum Nickelate ◽  
Annular Dark Field

LaNiO3 (LNO) thin films of 14 nm and 35 nm thicknesses grown epitaxially on LaAlO3 (LAO) and (LaAlO3)0.3(Sr2TaAlO6)0.7 (LSAT) substrates are studied using High Resolution Transmission Electron Microscopy (HRTEM) and High Angle Annular Dark Field (HAADF) imaging.

Atomic-scale structural and compositional analyses of Ruddlesden-Popper planar faults in AO-excess SrTiO3 (A = Sr2+, Ca2+, Ba2+) ceramics

2009 ◽  
Vol 24 (8) ◽  
pp. 2596-2604 ◽  
Author(s):  
Sašo Šturm ◽  
Makoto Shiojiri ◽  
Miran Čeh
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Dark Field ◽  
Atomic Scale ◽  
Transmission Electron ◽  
Initial Stage ◽  
Final Microstructure ◽  
Scanning Transmission ◽  
The Matrix ◽  
Annular Dark Field

The microstructure in AO-excess SrTiO3 (A = Sr2+, Ca2+, Ba2+) ceramics is strongly affected by the formation of Ruddlesden-Popper fault–rich (RP fault) lamellae, which are coherently intergrown with the matrix of the perovskite grains. We studied the structure and chemistry of RP faults by applying quantitative high-resolution transmission electron microscopy and high-angle annular dark-field scanning transmission electron microscopy analyses. We showed that the Sr2+ and Ca2+ dopant ions form RP faults during the initial stage of sintering. The final microstructure showed preferentially grown RP fault lamellae embedded in the central part of the anisotropic perovskite grains. In contrast, the dopant Ba2+ ions preferably substituted for Sr2+ in the SrTiO3 matrix by forming a BaxSr1−xTiO3 solid solution. The surplus of Sr2+ ions was compensated structurally in the later stages of sintering by the formation of SrO-rich RP faults. The resulting microstructure showed RP fault lamellae located at the surface of equiaxed BaxSr1-xTiO3 perovskite grains.

scholarly journals Analytical High-resolution Electron Microscopy Reveals Organ-specific Nanoceria Bioprocessing

2017 ◽  
Vol 46 (1) ◽  
pp. 47-61 ◽  
Author(s):  
Uschi M. Graham ◽  
Robert A. Yokel ◽  
Alan K. Dozier ◽  
Lawrence Drummy ◽  
Krishnamurthy Mahalingam ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Analytical Electron Microscopy ◽  
High Resolution Electron Microscopy ◽  
Dark Field ◽  
Transmission Electron ◽  
Analytical Electron ◽  
Organ Specific

This is the first utilization of advanced analytical electron microscopy methods, including high-resolution transmission electron microscopy, high-angle annular dark field scanning transmission electron microscopy, electron energy loss spectroscopy, and energy-dispersive X-ray spectroscopy mapping to characterize the organ-specific bioprocessing of a relatively inert nanomaterial (nanoceria). Liver and spleen samples from rats given a single intravenous infusion of nanoceria were obtained after prolonged (90 days) in vivo exposure. These advanced analytical electron microscopy methods were applied to elucidate the organ-specific cellular and subcellular fate of nanoceria after its uptake. Nanoceria is bioprocessed differently in the spleen than in the liver.

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