scholarly journals Analysis of Injected Electron Beam Propagation in a Planar Crossed-Field Gap

2021 ◽  
Vol 11 (6) ◽  
pp. 2540
Author(s):  
Ranajoy Bhattacharya ◽  
Adam M. Darr ◽  
Allen L. Garner ◽  
Jim Browning

This paper examines basic crossed-field device physics in a planar configuration, specifically electron beam perturbation and instability as a function of variation in magnetic field, and angle between magnetic and electric field. We perform a three-dimensional (3-D) simulation of electron perturbation in a planar crossed-field system using the full 3-D particle trajectory solver in CST Particle Studio (CST-PS). The structure has a length, height, width and anode-sole gap of 15 cm, 2 cm, 10 cm, and 2 cm, respectively. The anode to sole voltage is fixed at 3 kV, and the magnetic field and injected current varied from 0.01 T to 0.05 T and 1.5 mA to 1 A, respectively. The simulations show that applying a magnetic field of 0.05 T makes the beam stable for a critical current density of 94 mA/cm2 for an anode-sole gap of 20 mm. Above this current density, the beam was unstable, as predicted. Introducing a 1° tilt in the magnetic field destabilizes the beam at a current density of 23 mA/cm2, which is lower than the critical current density for no tilt, as predicted by our theory. The simulation results also agree well with prior one-dimensional (1-D) theory and simulations that predict stable bands of current density for a 5° tilt where the beam is stable at low current density (<13.3 mA/cm2), unstable above this threshold, and then stable again at higher current density, (>33 mA/cm2).

1989 ◽  
Vol 169 ◽  
Author(s):  
M. T. Lanagan ◽  
U. Balachandran ◽  
C. A. Youngdahl ◽  
J. T. Dusek ◽  
J. J. Picciolo ◽  
...  

AbstractBulk YBa2Cu3O7‐x (YBCO) wires and tubes were fabricated by an extrusion technique. Critical current density (Jc) was measured as a function of applied magnetic field at 77 K and was found to decrease significantly in fields below 100 G. Jc was dependent on specimen geometry. In addition, when a concentric magnetic field was generated by passing a current though a copper wire, the external field from the wire could interfere constructively or destructively with the magnetic field produced by current in a YBCO tube. The change in electrical properties with magnetic field has been attributed to weak‐link behavior at the grain boundaries. Batch‐to‐batch differences in the field dependence of Jc imply the possibility of reducing the dependence by processing modifications.


1992 ◽  
Vol 170 (2) ◽  
pp. 549-562 ◽  
Author(s):  
D. Glatzer ◽  
A. Forkl ◽  
H. Theuss ◽  
H. U. Habermeier ◽  
H. Kronmüller

1992 ◽  
Vol 46 (17) ◽  
pp. 10986-10996 ◽  
Author(s):  
L. M. Fisher ◽  
V. S. Gorbachev ◽  
N. V. Il’in ◽  
N. M. Makarov ◽  
I. F. Voloshin ◽  
...  

1994 ◽  
pp. 559-562
Author(s):  
Yuko Yokoyama ◽  
Tomoya Kubo ◽  
Yoshihiko Nakagawa ◽  
Masaithi Umeda ◽  
Yoshishige Suzuki ◽  
...  

1989 ◽  
Vol 169 ◽  
Author(s):  
L. W. Song ◽  
Y. H. Kao ◽  
Q. Y. Ying ◽  
J. P. Zheng ◽  
H. S. Kwok ◽  
...  

AbstractThe variations of critical current density Jc of narrow Y‐Ba‐Cu‐O films as a function of temperature and magnetic field are investigated. Films with thickness of 150‐200 nm and width of 20‐100 urn were prepared by laser ablation and laser etching. For t (=T/TC) < 0.75, the temperature dependence of Jc shows a (1‐1) linear behavior, in sharp contrast to that of a Josephson junction. Near Tc, Jc varies with (1‐ t)n where n=3/2 or 2 depending on the morphology of films. The magnetic field dependence of Jc above a characteristic field value Hc’ can be described by a model based on flux creep.


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