scholarly journals Flat Field Soft X-ray Spectrometry with Reflection Zone Plates on a Curved Substrate

2020 ◽  
Vol 10 (20) ◽  
pp. 7210
Author(s):  
Jürgen Probst ◽  
Christoph Braig ◽  
Alexei Erko
Keyword(s):  
High Resolution ◽  
Optical Element ◽  
Resolving Power ◽  
X Ray ◽  
The Core ◽  
Zone Plates ◽  
Flat Field ◽  
Curved Substrate ◽  
Absolute Quantum ◽  
Upper Boundary

We report on the first experimental results obtained with a newly designed instrument for high-resolution soft X-ray spectroscopy, using reflection zone plates (RZPs) on a spherical substrate. The spectrometer was tested with a fluorescence source. High-resolution flat field spectra within ±50% around the design energies were measured at an interval of 150–750 eV, using only two RZPs: the first RZP, with its design energy of 277 eV, covered the band of 150–370 eV, and the second RZP, with a design energy of 459 eV, covered the band of 350–750 eV, where the upper boundary of this energy range was defined by the Ni coating of the RZPs. The absolute quantum efficiency of the spectrometer, including the optical element and the detector, was, on average, above 10%, and reached 20% at the designed energies of the RZPs. The resolving power E/∆E exceeded 600 for energies E inside the core range of 200–550 eV.

scholarly journals Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

2010 ◽  
Vol 2010 ◽  
pp. 1-10 ◽  
Author(s):  
Michael J. Haugh ◽  
Richard Stewart
Keyword(s):  
High Resolution ◽  
Resolving Power ◽  
Inertial Confinement ◽  
High Resolution Imaging ◽  
Doppler Broadening ◽  
X Ray Diffraction ◽  
High Quality ◽  
Reflectivity Curve ◽  
X Ray ◽  
Resolution Imaging

This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.

scholarly journals An innovative optical and chemical drill core scanner

2015 ◽  
Vol 19 ◽  
pp. 13-16 ◽  
Author(s):  
A. S. L. Sjöqvist ◽  
M. Arthursson ◽  
A. Lundström ◽  
E. Calderón Estrada ◽  
A. Inerfeldt ◽  
...  
Keyword(s):  
High Resolution ◽  
Sample Preparation ◽  
Fluorescence Spectrometry ◽  
Drill Core ◽  
X Ray ◽  
Xrf Analysis ◽  
The Core ◽  
Single Person ◽  
Scanning Path ◽  
Drill Cores

Abstract. We describe a new innovative drill core scanner that semi-automatedly analyses drill cores directly in drill core trays with X-ray fluorescence spectrometry, without the need for much sample preparation or operator intervention. The instrument is fed with entire core trays, which are photographed at high resolution and scanned by a 3-D profiling laser. Algorithms recognise the geometry of the core tray, number of slots, location of the drill cores, calculate the optimal scanning path, and execute a continuous XRF analysis of 2 cm width along the core. The instrument is equipped with critical analytical components that allow an effective QA/QC routine to be implemented. It is a mobile instrument that can be manoeuvred by a single person with a manual pallet jack.

High-Resolution Particle Size Analysis from Nanometres to Microns

Clay Minerals ◽  
1993 ◽  
Vol 28 (4) ◽  
pp. 531-537 ◽  
Author(s):  
P. McFadyen ◽  
D. Fairhurst
Keyword(s):  
Particle Size ◽  
Light Scattering ◽  
High Resolution ◽  
Size Range ◽  
Optical Detection ◽  
Particle Size Analysis ◽  
Laser Diffraction ◽  
Resolving Power ◽  
Size Analysis ◽  
X Ray

AbstractModem disc centrifuge technology has extended the range of application of sedimentation particle size analysis to include the submicron region. An overall size range of approximately 10 nm to 100 pm is now accessible. The principles of both the disc centrifuge photosedimentometer, which employs optical detection with full Mie light scattering corrections, and the X-ray disc centrifuge are described. Examples of their application to a variety of samples are given to illustrate the performance characteristics of the instruments including a direct comparison of resolving power with that of the laser diffraction technique.

scholarly journals Synthesis and high-resolution structural and chemical analysis of iron-manganese-oxide core-shell nanocubes

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Aladin Ullrich ◽  
Mohammad Mostafizar Rahman ◽  
Paolo Longo ◽  
Siegfried Horn
Keyword(s):  
High Resolution ◽  
Core Shell ◽  
Bright Field ◽  
X Ray ◽  
The Core ◽  
Transmission Electron ◽  
High Boiling Solvent ◽  
Iron Manganese ◽  
Electron Energy Loss ◽  
Shell Region

AbstractWe have investigated the structure and chemical composition of nanoparticles synthesized by thermal decomposition of a mixture of iron oleate and manganese oleate in a high-boiling solvent in the presence of Na-oleate and oleic acid as surfactants by analytical transmission electron microscopy (TEM). The particles appear core-shell like in bright field TEM images. Higher spatial resolution TEM (HRTEM) analysis reveals a FeO/MnO like structure in the core and a spinel like structure in the shell. With high-resolution analytical methods like energy dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS), the distribution of the metals Mn and Fe was investigated. Differences in the oxidation state of these metals were found between the core and the shell region. The presence of sodium from the used surfactant (Na-oleate) on the surface of the particles has been proved.

A high-resolution X-ray diffractometer for the study of imperfect materials

2002 ◽  
Vol 35 (5) ◽  
pp. 606-614 ◽  
Author(s):  
A. Boulle ◽  
O. Masson ◽  
R. Guinebretière ◽  
A. Lecomte ◽  
A. Dauger
Keyword(s):  
High Resolution ◽  
Optical Element ◽  
Strong Increase ◽  
Rocking Curve ◽  
One Dimensional ◽  
X Ray ◽  
Rapid Acquisition ◽  
Order Of Magnitude ◽  
Position Sensitive ◽  
The One

A high-resolution X-ray diffractometer devoted to the study of imperfect materials (mainly oxides and ceramics) is presented. It is based on a rotating anode generator, a four-bounce monochromator, a five-movement sample holder and a curved position-sensitive detector (PSD). This setup allows rapid acquisition of a reciprocal-space map (in less than 10 h) even for very poorly diffracting materials. The two-dimensional instrumental profile is calculated taking into account each optical element in the beam path. The one-dimensional instrumental profiles corresponding to widely used scans (ω scan, θ–2θ scan, rocking curve and powder scan) are also calculated. In the three former cases, the setup exhibits an excellent angular resolution (0.003°), whereas in the latter case the resolution is lowered by one order of magnitude at the benefit of a strong increase in the collected intensity. The possibilities of this diffractometer are illustrated with three examples: an epitaxic layer, a microstructured single crystal and a powder.

scholarly journals X-Ray Optics: 3D Nanofabrication of High-Resolution Multilayer Fresnel Zone Plates (Adv. Sci. 9/2018)

2018 ◽  
Vol 5 (9) ◽  
pp. 1870052
Author(s):  
Umut Tunca Sanli ◽  
Chengge Jiao ◽  
Margarita Baluktsian ◽  
Corinne Grévent ◽  
Kersten Hahn ◽  
...  
Keyword(s):  
High Resolution ◽  
Fresnel Zone ◽  
Ray Optics ◽  
Fresnel Zone Plates ◽  
X Ray ◽  
Zone Plates

Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam ion trap

2004 ◽  
Vol 75 (10) ◽  
pp. 3723-3726 ◽  
Author(s):  
P. Beiersdorfer ◽  
E. W. Magee ◽  
E. Träbert ◽  
H. Chen ◽  
J. K. Lepson ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
Extreme Ultraviolet ◽  
X Ray ◽  
Grating Spectrometer ◽  
Electron Beam Ion Trap ◽  
Flat Field
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