scholarly journals The Attachment of Carbon Nanotubes to Atomic Force Microscopy Tips Using the Pick-Up Method

2020 ◽  
Vol 10 (16) ◽  
pp. 5575
Author(s):  
Christopher T. Gibson
Keyword(s):  
Carbon Nanotubes ◽  
Data Storage ◽  
Small Diameter ◽  
Chemical Vapor ◽  
High Strength ◽  
Image Resolution ◽  
Contact Mode ◽  
Tapping Mode ◽  
Atomic Force ◽  
Afm Tips

In the last 30 years research has shown that the resolution and reproducibility of data acquired using the atomic force microscope (AFM) can be improved through the development of new imaging modes or by modifying the AFM tip. One method that has been explored since the 1990s is to attach carbon nanotubes (CNT) to AFM tips. CNTs possess a small diameter, high aspect ratio, high strength and demonstrate a high degree of wear resistance. While early indications suggested the widespread use of these types of probes would be routine this has not been the case. A number of methods for CNT attachment have been proposed and explored including chemical vapor deposition (CVD), dielectrophoresis and manual attachment inside a scanning electron microscope (SEM). One of the earliest techniques developed is known as the pick-up method and involves adhering CNTs to AFM tips by simply scanning the AFM tip, in tapping mode, across a CNT-covered surface until a CNT attaches to the AFM tip. In this work we will further investigate how, for example, high force tapping mode imaging can improve the stability and success rate of the pick-up method. We will also discuss methods to determine CNT attachment to AFM probes including changes in AFM image resolution, amplitude versus distance curves and SEM imaging. We demonstrate that the pick-up method can be applied to a range of AFM probes, including contact mode probes with relatively soft spring constants (0.28 N/m). Finally, we demonstrate that the pick-up method can be used to attach CNTs to two AFM tips simultaneously. This is significant as it demonstrates the techniques potential for attaching CNTs to multiple AFM tips which could have applications in AFM-based data storage, devices such as the Snomipede, or making CNT-AFM tips more commercially viable.

Effects of deformation of electron-beam-grown microtips on measurements taken with the Atomic-Force Microscope

1994 ◽  
Vol 52 ◽  
pp. 1072-1073
Author(s):  
C. B. Mooney ◽  
J. T. Thornton ◽  
P. E. Russell
Keyword(s):  
Thin Film ◽  
Electron Beam ◽  
Atomic Force Microscope ◽  
Complex Function ◽  
Carbonaceous Material ◽  
Image Resolution ◽  
Contact Mode ◽  
Atomic Force ◽  
Afm Tips ◽  
Sem Micrograph

When imaging with an Atomic-Force Microscope (AFM), the image resolution is a complex function of the relative tip and sample geometries. When imaging or measuring high aspect ratio features, sharp and slender tips offer the possibility of probing down into extremely small topographical features. The most commonly used contact mode AFM tips are thin film cantilevers of Si3N4 with an integrated pyramidal structure used as the tip. It has been shown that microtips, which are fabricated by electron beam induced growth of carbonaceous material on the apex of the pyramid, can reduce the artifacts associated with integrated pyramidal AFM tips. A SEM micrograph of a microtip grown on the apex of an integrated pyramid is shown in Figure 1. Use of grown microtips in metrology demands an understanding of the dynamics of microtip deformation while scanning.

A Review of Recent Developments in Atomic Force Microscopy Systems With Application to Manufacturing and Biological Processes

2003 ◽  
Author(s):  
Karthik Laxminarayana ◽  
Nader Jalili
Keyword(s):  
Resonance Frequency ◽  
Intermolecular Forces ◽  
Minimal Amount ◽  
Contact Mode ◽  
Tapping Mode ◽  
Atomic Force ◽  
Natural Resonance ◽  
Target Sample ◽  
Recent Developments ◽  
Natural Resonance Frequency

The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of microstructural parameters and intermolecular forces at nanoscale level with atomic-resolution characterization. Typically, these microcantilever systems are operated in three open-loop modes; non-contact mode, contact mode, and tapping mode. In order to probe electric, magnetic, and/or atomic forces of a selected sample, the non-contact mode is utilized by moving the cantilever slightly away from the sample surface and oscillating the cantilever at or near its natural resonance frequency. Alternatively, the contact mode acquires sample attributes by monitoring interaction forces while the cantilever tip remains in contact with the target sample. The tapping mode of operation combines qualities of both the contact and non-contact modes by gleaning sample data and oscillating the cantilever tip at or near its natural resonance frequency while allowing the cantilever tip to impact the target sample for a minimal amount of time. Recent research on AFM systems has focused on many fabrication and manufacturing processes at molecular levels due to its tremendous surface microscopic capabilities. This paper provides a review of such recent developments in AFM imaging systems with emphasis on operational modes, microcantilever dynamic modeling and control. Due to the important contributions of AFM systems to manufacturing, this paper also provides a comprehensive review of recent applications of different AFM systems in these important areas.

Adhesive and Mechanical Properties of Carbon Nanotube Probes Contacting Chemically-Treated Surfaces

2011 ◽  
Author(s):  
Kane M. Barker ◽  
Al Ferri ◽  
Lawrence A. Bottomley
Keyword(s):  
Carbon Nanotubes ◽  
Carbon Nanotube ◽  
Mechanical Response ◽  
Tensile Load ◽  
Image Resolution ◽  
Adhesive Properties ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Walled Carbon Nanotubes ◽  
Static Coefficient Of Friction

Carbon nanotubes are useful in a variety of measurement applications. In the case of Atomic Force Microscopes (AFMs), carbon nanotubes can be affixed to the tip of the AFM cantilever to improve image resolution and enable images of surfaces with deep crevices and trench structures. In this paper, the mechanical response of long, straight, small walled carbon nanotubes (SWNTs) under compressive and tensile load is examined with an atomic force microscope. Multi-dimensional force spectroscopy (MDFS) is used to simultaneously measure the cantilever resonant frequency, deflection, and scanner motion. The acquired force curves reveal that the SWNT buckles shortly after contact is initiated. As the scanner continues to rise and then reverses direction, the SWNT undergoes a number of adhesion/sticking episodes, buckling, and slip events. The bulk properties of the nanotube are estimated by measuring the shift in natural frequency during tension. Finally, the carbon nanotube is modeled as an elastica in order to predict the post-buckled shape of the SWNT. By comparing the model results with MDFS results, the static coefficient of friction between the SWNT and a variety of surfaces is estimated. The study suggests that MDFS has a wide applicability for studying the mechanical and adhesive properties of various nanotubes, nanorods and nanofibers.

Probe-Tip Induced Damage in Compliant Substrates

2010 ◽  
Vol 132 (3) ◽  
Author(s):  
Michael Chandross ◽  
Christian D. Lorenz ◽  
Mark J. Stevens ◽  
Gary S. Grest
Keyword(s):  
Data Storage ◽  
Realistic Model ◽  
Experimental Measurements ◽  
Material Transfer ◽  
Force Microscopy ◽  
Compliant Substrates ◽  
Atomic Force ◽  
Low Load ◽  
Afm Tips ◽  
Dynamics Simulations

Nanofabrication using arrays of modified atomic force microscopy (AFM) tips can drastically reduce feature sizes and increase data storage densities. Additionally, AFM experiments are valuable tools for characterizing the tribological properties of surfaces. In order to maximize the potential of nanofabrication techniques, it is necessary to understand fully the interactions between AFM tips and substrates, particularly when the latter is compliant and more damage-prone. To address this issue, we have carried out extensive molecular dynamics simulations of the nanotribological properties of self-assembled alkylsilane monolayers (SAMs) on amorphous silica with a realistic model of an AFM tip. Our simulations demonstrate that for fully physisorbed SAMs, even low load contacts can damage the SAM and cause material transfer to the probe tip. This effect, which is commonly ignored, can have a strong effect on the interpretation of experimental measurements. Partial chemisorption of the SAM lowers, but does not remove the possibility of damage.

scholarly journals Structural Evidence for α-Synuclein Fibrils Using in Situ Atomic Force Microscopy

2005 ◽  
Vol 37 (2) ◽  
pp. 113-118
Author(s):  
Feng Zhang ◽  
Li-Na Ji ◽  
Lin Tang ◽  
Jun Hu ◽  
Hong-Yu Hu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Guanidine Hydrochloride ◽  
Indirect Evidence ◽  
Contact Mode ◽  
Microscopy Imaging ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Abstract Human α-synuclein is a presynaptic terminal protein and can form insoluble fibrils that are believed to play an important role in the pathogenesis of several neurodegenerative diseases such as Parkinson's disease, dementia with Lewy bodies and Lewy body variant of Alzheimer's disease. In this paper, in situ atomic force microscopy has been used to study the structural properties of α-synuclein fibrils in solution using two different atomic force microscopy imaging modes: tapping mode and contact mode. In the in situ contact mode atomic force microscopy experiments α-synuclein fibrils quickly broke into fragments, and a similar phenomenon was found using tapping mode atomic force microscopy in which α-synuclein fibrils were incubated with guanidine hydrochloride (0.6 M). The α-synuclein fibrils kept their original filamentous topography for over 1 h in the in situ tapping mode atomic force microscopy experiments. The present results provide indirect evidence on how β-sheets assemble into α-synuclein fibrils on a nanometer scale.

Influence of Ammonia on the Fabrication of Aligned Carbon Nanotubes Using Thermal CVD

2011 ◽  
Vol 467-469 ◽  
pp. 312-315
Author(s):  
Gang Li ◽  
Wen Ming Cheng
Keyword(s):  
Carbon Nanotubes ◽  
Chemical Vapor ◽  
X Ray Diffraction ◽  
Vertical Alignment ◽  
X Ray ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force ◽  
Aligned Carbon Nanotubes ◽  
20 Nm

Ultra-thin (20 nm) nickel catalyst films were deposited by sputtering on SiO2/Si substrates. At the pretreatments, ammonia (NH3) was conducted for different time in a thermal chemical vapor deposition (CVD) system. Pretreated samples were characterized using atomic force microscopy (AFM). After the pretreatment, acetylene was introduced into the chamber for 10 min, samples were characterized using scanning electron micrograph (SEM) and X-ray diffraction (XRD). It was concluded that NH3 pretreatment was very crucial to control the surface morphology of catalytic metals and thus to achieve the vertical alignment of carbon nanotubes (CNTs). With higher density of the Ni particles, better alignment of the CNTs can be obtained due to steric hindrance effect between neighboring CNTs.

scholarly journals Analysis of Vibration Frequency of Carbon Nanotubes used as Nano-Force Sensors Considering Clamped Boundary Condition

Electronics ◽  
2019 ◽  
Vol 8 (10) ◽  
pp. 1082 ◽  
Author(s):  
Toshiaki Natsuki ◽  
Kairi Urakami
Keyword(s):  
Carbon Nanotubes ◽  
Elastic Medium ◽  
Vibration Frequency ◽  
Small Diameter ◽  
Axial Direction ◽  
Force Sensor ◽  
Beam Model ◽  
Atomic Force ◽  
Buckling Stability ◽  
Euler Bernoulli Beam

Carbon nanotubes (CNTs) can be used as atomic force microscope (AFM) probes since they are ideal tip materials with a small diameter, high aspect ratio, and stiffness. In this study, a model of CNTs clamped in an elastic medium is proposed as nanoscale force sensing AFM probes. The relationship between vibration frequency and axial force of the CNT probe clamped in an elastic medium is analyzed based on the Euler-Bernoulli beam model and the Whitney-Riley model. The clamped length of CNTs, and the elastic modulus of elastic medium affect largely on the vibration and the buckling stability of a CNT AFM probe. The result showed that the sensitivity to vibration increases as the applied loads increase. The critical load in which the vibration frequency decreases rapidly, moving to large ones with decreasing ratio of length to diameter of CNTs. The theoretical investigation on the vibration frequency of CNT loaded in the axial direction would give a useful reference for designing a CNT used as a nano-force sensor.

Effect of Electron Beam Bombarding of the Catalyst Layer on the Growth of Carbon Nanostructures by TCVD Method

2011 ◽  
Vol 264-265 ◽  
pp. 1324-1328
Author(s):  
A. Mahmoodi ◽  
M. Ghoranneviss ◽  
D. Hanifeh ◽  
K. Mehrani ◽  
M. Rahbar Zareh
Keyword(s):  
Carbon Nanotubes ◽  
Electron Beam ◽  
Carbon Nanostructures ◽  
Chemical Vapor ◽  
Catalyst Layer ◽  
Sio2 Substrate ◽  
Force Microscopy ◽  
Fe Catalyst ◽  
Atomic Force ◽  
Before And After

The growth behavior of carbon nanotubes (CNTs) grown on electron bombarded catalyst layer has been investigated in this paper. A hot cathodic electron beam facility was employed to electron bombarding of catalyst layer before stage of CNTs growth. The growth of carbon nanotubes was performed on the Fe catalyst layer with sio2 substrate in an environment of different mixed gases (H2, NH3 and C2H2) by Thermal Chemical Vapor Deposition (TCVD) system. The pretreated substrates were probed by Atomic Force Microscopy (AFM) and CNTs grown was confirmed by Raman spectroscopy. Moreover, all samples were analyzed by Scanning Electron Microscopy (SEM) before and after growth of CNTs. SEM analyzes clarified that the catalyst grains has been smaller under effect of electron beam bombardment.

Nanomechanical Peeling of Carbon Nanotubes and Nanocoils Studied Using the Atomic Force Microscope

2008 ◽  
Author(s):  
Mark C. Strus ◽  
Arvind Raman ◽  
Luis Zalamea ◽  
R. Byron Pipes
Keyword(s):  
Carbon Nanotubes ◽  
Atomic Force Microscope ◽  
High Strength ◽  
One Dimensional ◽  
Nanoelectronic Devices ◽  
Interfacial Energies ◽  
Geometric Configurations ◽  
Atomic Force ◽  
Sequential Release ◽  
Opening Up

The physics of adhesion of one-dimensional nanostructures such as nanotubes, nanocoils, and nanowires is of great interest to the functioning and reliability of nanoelectronic devices and the development of high-strength, lightweight nanocomposites. Here, we extend previous work using the Atomic Force Microscope (AFM) to investigate quantitatively the physics of nanomechanical peeling of carbon nanotubes (CNTs) and nanocoils on different substrates. We summarize previous modeling results which predict that an initially straight nanotube peeled from a surface may transition suddenly between different geometric configurations with vastly different interfacial energies. In contrast, nanocoils display a sawtooth peeling force curve indicating the sequential release of discrete pinning points. We resolve differences in nanotube peeling energies at attoJoule levels on different materials, thus opening up the possibility of sensitive screening of fiber coatings or material surfaces for improved adhesion in nanocomposites.

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