scholarly journals Undetectable Changes in Image Resolution of Luminance-Contrast Gradients Affect Depth Perception

2016 ◽  
Vol 7 ◽  
Author(s):  
Yoshiaki Tsushima ◽  
Kazuteru Komine ◽  
Yasuhito Sawahata ◽  
Toshiya Morita
Keyword(s):  
Depth Perception ◽  
Luminance Contrast ◽  
Image Resolution

Depth Perception and Manipulation in Projection-Based Spatial Augmented Reality

2020 ◽  
Vol 27 (2) ◽  
pp. 242-256
Author(s):  
Susanne Schmidt ◽  
Gerd Bruder ◽  
Frank Steinicke
Keyword(s):  
Augmented Reality ◽  
Real World ◽  
Depth Perception ◽  
Research Question ◽  
Luminance Contrast ◽  
Color Temperature ◽  
Future Directions ◽  
Practical Applications ◽  
Spatial Augmented Reality ◽  
World Environment

Spatial augmented reality (SAR) technology allows one to change the appearance of objects by projecting directly onto their surface without the requirement of wearing glasses, and therefore can be used in many practical applications. In this article, we present a human–subject study, which investigates the research question whether it is possible to use SAR to change one's perception of depth and spatial relationships among objects and humans in a real-world environment. Such projected illusions could open up new possibilities, for example, supporting people who suffer from poor depth perception by compensating distance and size misperceptions. We present three monoscopic projection-based techniques that we adapted from visual arts: (i) color temperature, (ii) luminance contrast, and (iii) blur, and show that each of them can significantly change depth perception, even in a real-world environment when displayed with other distance cues. We discuss practical implications and individual differences in the perception of depth between observers, and we outline future directions to influence and improve human depth perception in the real world.

scholarly journals Effects of Color and Luminance Contrast on Size Perception—Evidence from a Horizontal Parallel Lines Illusion

Vision ◽  
2018 ◽  
Vol 2 (3) ◽  
pp. 28 ◽  
Author(s):  
Xiaodan Zhang ◽  
Jiehui Qian ◽  
Qiaowei Liang ◽  
Zhengkang Huang
Keyword(s):  
Depth Perception ◽  
Luminance Contrast ◽  
Equal Length ◽  
Size Perception ◽  
Illusory Effect ◽  
Parallel Lines

The present study investigated a size illusion composed of two horizontal lines that were vertically separated and parallel to each other. When the two lines were of equal length, the upper line was consistently perceived to be a little longer than the lower line, therefore it was termed as horizontal parallel lines (HPL) illusion. We investigated the effect of color and luminance contrast on the HPL illusion by manipulating the color and luminance of the two lines. Results indicated the following: (1) differences in color between the two lines reduced the illusion; (2) differences in luminance between the two lines reduced the illusion; (3) Effect 1 was greater than Effect 2; (4) the illusory effect could not be affected as long as both of the lines were of the same color or luminance. The results suggest that the color or luminance contrast may contribute to the overall decrease in the illusory effect for lines with different colors/luminances, but generally the illusion decreases as the two lines are less similar to each other. These findings indicate that the similarity or ‘sameness’ effect dominates the effect of color/luminance contrast on the size illusion over the effect resulted from contrast difference or depth perception.

The Resolution and Contrast in Biological Sections Determined by Inelastic and Elastic Scattering

1973 ◽  
Vol 31 ◽  
pp. 224-225
Author(s):  
D. L. Misell
Keyword(s):  
Electron Microscopy ◽  
Adverse Effect ◽  
Elastic Scattering ◽  
Inelastic Scattering ◽  
Amorphous Carbon ◽  
Polymeric Materials ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Quantitative Estimates ◽  
Elastic Ratio

In the electron microscopy of biological sections the adverse effect of chromatic aberration on image resolution is well known. In this paper calculations are presented for the inelastic and elastic image intensities using a wave-optical formulation. Quantitative estimates of the deterioration in image resolution as a result of chromatic aberration are presented as an alternative to geometric calculations. The predominance of inelastic scattering in the unstained biological and polymeric materials is shown by the inelastic to elastic ratio, I/E, within an objective aperture of 0.005 rad for amorphous carbon of a thickness, t=50nm, typical of biological sections; E=200keV, I/E=16.

In situ REM imaging of surface processes on ceramic bulk crystals from 300 to 1670 K in a conventional TEM

1991 ◽  
Vol 49 ◽  
pp. 660-661
Author(s):  
Z. L. Wang ◽  
J. Bentley
Keyword(s):  
High Temperatures ◽  
Image Resolution ◽  
Atomic Processes ◽  
Crystal Surfaces ◽  
Beam Radiation ◽  
Surface Areas ◽  
Transmission Electron ◽  
Reflection Electron Microscopy ◽  
Gas Reactions

Studying the behavior of surfaces at high temperatures is of great importance for understanding the properties of ceramics and associated surface-gas reactions. Atomic processes occurring on bulk crystal surfaces at high temperatures can be recorded by reflection electron microscopy (REM) in a conventional transmission electron microscope (TEM) with relatively high resolution, because REM is especially sensitive to atomic-height steps.Improved REM image resolution with a FEG: Cleaved surfaces of a-alumina (012) exhibit atomic flatness with steps of height about 5 Å, determined by reference to a screw (or near screw) dislocation with a presumed Burgers vector of b = (1/3)<012> (see Fig. 1). Steps of heights less than about 0.8 Å can be clearly resolved only with a field emission gun (FEG) (Fig. 2). The small steps are formed by the surface oscillating between the closely packed O and Al stacking layers. The bands of dark contrast (Fig. 2b) are the result of beam radiation damage to surface areas initially terminated with O ions.

Magnetic Domain Observation of an Amorphous Fe-Si-B Ribbon by Means of a High Voltage Scanning Electron Microscope

1981 ◽  
Vol 39 ◽  
pp. 320-321
Author(s):  
K. Tsuno ◽  
Y. Harada ◽  
T. Sato
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Voltage ◽  
Amorphous Ribbon ◽  
Image Resolution ◽  
Objective Lens ◽  
Magnetic Domains ◽  
Scattered Electron ◽  
Voltage Scanning ◽  
Scanning Electron

Magnetic domains of ferromagnetic amorphous ribbon have been observed using Bitter powder method. However, the domains of amorphous ribbon are very complicated and the surface of ribbon is not flat, so that clear domain image has not been obtained. It has been desired to observe more clear image in order to analyze the domain structure of this zero magnetocrystalline anisotropy material. So, we tried to observe magnetic domains by means of a back-scattered electron mode of high voltage scanning electron microscope (HVSEM).HVSEM method has several advantages compared with the ordinary methods for observing domains: (1) high contrast (0.9, 1.5 and 5% at 50, 100 and 200 kV) (2) high penetration depth of electrons (0.2, 1.5 and 8 μm at 50, 100 and 200 kV). However, image resolution of previous HVSEM was quite low (maximum magnification was less than 100x), because the objective lens cannot be excited for avoiding the application of magnetic field on the specimen.

Low-voltage, high-resolution scanning electron microscopy of polymers

1987 ◽  
Vol 45 ◽  
pp. 466-467 ◽  
Author(s):  
S. J. Krause ◽  
W.W. Adams ◽  
S. Kumar ◽  
T. Reilly ◽  
T. Suziki
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Low Voltage ◽  
Chromatic Aberration ◽  
Image Resolution ◽  
Resolution Limit ◽  
Crossover Point ◽  
New Generation ◽  
Beam Damage ◽  
Scanning Electron

Scanning electron microscopy (SEM) of polymers at routine operating voltages of 15 to 25 keV can lead to beam damage and sample image distortion due to charging. Imaging polymer samples with low accelerating voltages (0.1 to 2.0 keV), at or near the “crossover point”, can reduce beam damage, eliminate charging, and improve contrast of surface detail. However, at low voltage, beam brightness is reduced and image resolution is degraded due to chromatic aberration. A new generation of instruments has improved brightness at low voltages, but a typical SEM with a tungsten hairpin filament will have a resolution limit of about 100nm at 1keV. Recently, a new field emission gun (FEG) SEM, the Hitachi S900, was introduced with a reported resolution of 0.8nm at 30keV and 5nm at 1keV. In this research we are reporting the results of imaging coated and uncoated polymer samples at accelerating voltages between 1keV and 30keV in a tungsten hairpin SEM and in the Hitachi S900 FEG SEM.

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