Novel Approaches of Using of Spirulina Platensis in Natural Rubber Based Composites

Ewa Głowińska; Janusz Datta; Paulina Parcheta and Natalia Kaźmierczak

doi:10.32604/jrm.2018.00003

Novel Approaches of Using of Spirulina Platensis in Natural Rubber Based Composites

JOURNAL OF RENEWABLE MATERIALS ◽

10.32604/jrm.2018.00003 ◽

2018 ◽

Vol 6 (7) ◽

pp. 680-687

Author(s):

Ewa Głowińska ◽

Janusz Datta ◽

Paulina Parcheta and Natalia Kaźmierczak

Keyword(s):

Natural Rubber ◽

Spirulina Platensis ◽

Novel Approaches

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Extraction and identification of fillers and pigments from pyrolyzed rubber and tire samples

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100163332 ◽

1996 ◽

Vol 54 ◽

pp. 174-175

Author(s):

P. Sadhukhan ◽

J. B. Zimmerman

Keyword(s):

Zinc Oxide ◽

Electron Microscope ◽

Carbon Black ◽

Natural Rubber ◽

Transmission Electron Microscope ◽

Rolling Resistance ◽

Synthetic Polymers ◽

Nitrogen Atmosphere ◽

Transmission Electron ◽

Curing Agents

Rubber stocks, specially tires, are composed of natural rubber and synthetic polymers and also of several compounding ingredients, such as carbon black, silica, zinc oxide etc. These are generally mixed and vulcanized with additional curing agents, mainly organic in nature, to achieve certain “designing properties” including wear, traction, rolling resistance and handling of tires. Considerable importance is, therefore, attached both by the manufacturers and their competitors to be able to extract, identify and characterize various types of fillers and pigments. Several analytical procedures have been in use to extract, preferentially, these fillers and pigments and subsequently identify and characterize them under a transmission electron microscope.Rubber stocks and tire sections are subjected to heat under nitrogen atmosphere to 550°C for one hour and then cooled under nitrogen to remove polymers, leaving behind carbon black, silica and zinc oxide and 650°C to eliminate carbon blacks, leaving only silica and zinc oxide.

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Novel Approaches to Low-Voltage Scanning Electron Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100180586 ◽

1990 ◽

Vol 48 (1) ◽

pp. 366-367

Author(s):

Arthur V. Jones

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Low Voltage ◽

Electron Optics ◽

Current Interest ◽

New Concepts ◽

Opportune Time ◽

Novel Approaches ◽

Voltage Scanning ◽

Scanning Electron

In comparison with the developers of other forms of instrumentation, scanning electron microscope manufacturers are among the most conservative of people. New concepts usually must wait many years before being exploited commercially. The field emission gun, developed by Albert Crewe and his coworkers in 1968 is only now becoming widely available in commercial instruments, while the innovative lens designs of Mulvey are still waiting to be commercially exploited. The associated electronics is still in general based on operating procedures which have changed little since the original microscopes of Oatley and his co-workers.The current interest in low-voltage scanning electron microscopy will, if sub-nanometer resolution is to be obtained in a useable instrument, lead to fundamental changes in the design of the electron optics. Perhaps this is an opportune time to consider other fundamental changes in scanning electron microscopy instrumentation.

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