scholarly journals Dynamic Analyses of a Simply Supported Double-Beam System Subject to a Moving Mass with Fourier Transform Technique

2019 ◽  
Vol 121 (1) ◽  
pp. 291-314
Author(s):  
Lizhong Jiang ◽  
Xilin Chai ◽  
Zhihua Tan ◽  
Wangbao Zhou ◽  
Yulin Feng ◽  
...  
2019 ◽  
Vol 9 (10) ◽  
pp. 2162 ◽  
Author(s):  
Lizhong Jiang ◽  
Yuntai Zhang ◽  
Yulin Feng ◽  
Wangbao Zhou ◽  
Zhihua Tan

The dynamic response of a simply supported double-beam system under moving loads was studied. First, in order to reduce the difficulty of solving the equation, a finite sin-Fourier transform was used to transform the infinite-degree-of-freedom double-beam system into a superimposed two-degrees-of-freedom system. Second, Duhamel’s integral was used to obtain the analytical expression of Fourier amplitude spectrum function considering the initial conditions. Finally, based on finite sin-Fourier inverse transform, the analytical expression of dynamic response of a simply supported double-beam system under moving loads was deduced. The dynamic response under successive moving loads was calculated by the analytical method and the general FEM software ANSYS. The analysis results show that the analytical method calculation results are consistent with ANSYS’ calculation, thus validating the analytical calculation method. The simply supported double-beam system had multiple critical speeds, and the flexural rigidity significantly affected both peak vertical displacement and critical speed.


1976 ◽  
Vol 30 (6) ◽  
pp. 593-601 ◽  
Author(s):  
R. R. Willey

This paper describes a new Fourier transform infrared spectrophotometer with the capability to measure diffuse reflectance (DR) from 5000 to 500 cm−1 (2 to 20 µm) in addition to the normal transmittance measurements. The instrument has a true simultaneous double beam measurement mode and a high speed single beam mode. The system also takes advantage of many data manipulation and display features due to the built-in computer and 2.5 million word storage system. One of the objectives of this work was to produce a practical instrument which includes the DR capability; another was to introduce the qualitative and quantitative measurements of DR in the infrared to the analytical community. DR has been commonly available in the visible and near ir spectrum, but until this new instrument, has not been available in the ir. A brief survey of the background and history of DR and emittance measurements in the ir is given. The design details and operation of the instrument are generally examined. Brief examples are provided for a few transmittance, trace analysis, and microsampling applications, and a variety of DR results are shown. The addition of diffuse reflectance as a tool in the infrared opens new avenues for investigation and application in many fields.


1963 ◽  
Author(s):  
J. M. Seelig ◽  
II Hoppmann ◽  
W. H.
Keyword(s):  

2021 ◽  
Vol 228 ◽  
pp. 111585
Author(s):  
Insub Choi ◽  
JunHee Kim ◽  
Jisang Jang ◽  
Hakjong Chang ◽  
Gisung Kang
Keyword(s):  

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