scholarly journals Polarized Reflectance Spectroscopy

2020 ◽  
Author(s):  
Keyword(s):  
Reflectance Spectroscopy ◽  
Polarized Reflectance

scholarly journals Polarized Reflectance Spectroscopy for Pre-Cancer Detection

2004 ◽  
Vol 3 (1) ◽  
pp. 1-14 ◽  
Author(s):  
Konstantin Sokolov ◽  
Linda T. Nieman ◽  
Alexey Myakov ◽  
Ann Gillenwater
Keyword(s):  
Cancer Detection ◽  
Reflectance Spectroscopy ◽  
Polarized Reflectance

Application of Polarized Reflectance Spectroscopy in Biomedical Photonics

2009 ◽  
Vol 46 (10) ◽  
pp. 78-87
Author(s):  
赵庆亮 Zhao Qingliang ◽  
魏华江 Wei Huajiang ◽  
郭周义 Guo Zhouyi ◽  
杨洪钦 Yang Hongqin ◽  
谢树森 Xie Shusen ◽  
...  
Keyword(s):  
Reflectance Spectroscopy ◽  
Polarized Reflectance

Fiber optic probe for polarized reflectance spectroscopy in vivo: Design and performance

2002 ◽  
Vol 7 (3) ◽  
pp. 388 ◽  
Author(s):  
Alexey Myakov ◽  
Linda Nieman ◽  
Lorenz Wicky ◽  
Urs Utzinger ◽  
Rebecca Richards-Kortum ◽  
...  
Keyword(s):  
Fiber Optic ◽  
Reflectance Spectroscopy ◽  
Fiber Optic Probe ◽  
Optic Probe ◽  
And Performance ◽  
Polarized Reflectance

Real-time Optical Monitoring of Epitaxial Growth Processes by p-Polarized Reflectance Spectroscopy

1995 ◽  
Vol 406 ◽  
Author(s):  
Nikolaus Dietz ◽  
Klaus J. Bachmannb
Keyword(s):  
Fine Structure ◽  
Epitaxial Growth ◽  
Real Time ◽  
Dielectric Function ◽  
Reaction Layer ◽  
Surface Reaction ◽  
Optical Probe ◽  
Reflectance Spectroscopy ◽  
Growth Processes ◽  
Polarized Reflectance

AbstractIn this paper we introduce a real-time optical probe technique, p-polarized reflectance spectroscopy (PRS), for the monitoring of epitaxial growth processes. GaP heteroepitaxy by pulsed chemical beam epitaxy (PCBE) is used as an example. PRS allows to follow the deposition process with submonolayer resolution, utilizing a fine structure that is superimposed to the interference oscillations in the reflected intensity. This fine structure is explained by the periodic alteration of the surface reaction chemistry under pulsed chemical precursor supply. In the case of epitaxial GaP growth, it is modeled for a four layer stack, including an ultra-thin surface reaction layer of periodically changing thickness do(t) and dielectric function εo(t) tied to the periodic surface exposure to tertiarybutyl phosphine (TBP) and triethylgallium (TEG) pulses, respectively. The imaginary part of the dielectric function, εO2, of this surface reaction layer can be determined directly from the distance of the inflection points in the fine structure, where the optical response to the first precursor pulse in the cycle sequence changes sign, from the closests interference minimum. The surface reaction kinetics can be studied by analyzing the decay time characteristic in the transients of the fine structure.

Polarized reflectance spectroscopy instrument for the clinical setting

2002 ◽  
Author(s):  
Linda T. Nieman ◽  
Alexey Myakov ◽  
Konstantin Sokolov ◽  
Rebecca Richards-Kortum
Keyword(s):  
Clinical Setting ◽  
Reflectance Spectroscopy ◽  
Polarized Reflectance

Polarized Reflectance Spectroscopy and Spectroscopic Ellipsometry Determination of the Optical Anisotropy of Gallium nitride on Sapphire

1997 ◽  
Vol 36 (Part 2, No. 8A) ◽  
pp. L1029-L1031 ◽  
Author(s):  
Guolin Yu ◽  
Hiroyasu Ishikawa ◽  
Takashi Egawa ◽  
Tetsuo Soga ◽  
Junji Watanabe ◽  
...  
Keyword(s):  
Gallium Nitride ◽  
Spectroscopic Ellipsometry ◽  
Optical Anisotropy ◽  
Reflectance Spectroscopy ◽  
Polarized Reflectance
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