scholarly journals Some Advances on the Solution of the Generalized Law of Importation for Fuzzy Implication Functions

2021 ◽  
Author(s):  
Isabel Aguiló ◽  
Sebastia Massanet ◽  
Juan Vicente Riera

The law of importation has attracted the interest of many researchers devoted to fuzzy implication functions in the last decades. This property has several important applications, especially in approximate reasoning and image processing. Several generalizations of this property have been proposed. Specifically, one generalization related to the law of migrativity was recently introduced by Baczyński et al. in which two fuzzy implication functions are involved. In this paper, some advances on the solution of this functional equation for the particular case where the involved fuzzy conjunction is a t-norm are presented. Indeed, a complete characterization of all those pairs of fuzzy implication functions with a strict natural fuzzy negation satisfying the generalized law of importation is achieved.

1987 ◽  
Vol 24 (01) ◽  
pp. 160-169 ◽  
Author(s):  
Enrique Castillo ◽  
Janos Galambos

There are a number of ad hoc regression models for the statistical analysis of lifetime data, but only a few examples exist in which physical considerations are used to characterize the model. In the present paper a complete characterization of a regression model is given by solving a functional equation recurring in the literature for the case of a fatigue problem. The result is that, if the lifetime for given values of the regressor variable and the regressor variable for a given lifetime are both Weibull variables (assumptions which are well founded, at least as approximations, from extreme-value theory in some concrete applications), there are only three families of (conditional) distribution for the lifetime (or for the regressor variable). This model is then applied to a practical problem for illustration.


1987 ◽  
Vol 24 (1) ◽  
pp. 160-169 ◽  
Author(s):  
Enrique Castillo ◽  
Janos Galambos

There are a number of ad hoc regression models for the statistical analysis of lifetime data, but only a few examples exist in which physical considerations are used to characterize the model. In the present paper a complete characterization of a regression model is given by solving a functional equation recurring in the literature for the case of a fatigue problem. The result is that, if the lifetime for given values of the regressor variable and the regressor variable for a given lifetime are both Weibull variables (assumptions which are well founded, at least as approximations, from extreme-value theory in some concrete applications), there are only three families of (conditional) distribution for the lifetime (or for the regressor variable). This model is then applied to a practical problem for illustration.


1982 ◽  
Vol 10 (1) ◽  
pp. 37-54 ◽  
Author(s):  
M. Kumar ◽  
C. W. Bert

Abstract Unidirectional cord-rubber specimens in the form of tensile coupons and sandwich beams were used. Using specimens with the cords oriented at 0°, 45°, and 90° to the loading direction and appropriate data reduction, we were able to obtain complete characterization for the in-plane stress-strain response of single-ply, unidirectional cord-rubber composites. All strains were measured by means of liquid mercury strain gages, for which the nonlinear strain response characteristic was obtained by calibration. Stress-strain data were obtained for the cases of both cord tension and cord compression. Materials investigated were aramid-rubber, polyester-rubber, and steel-rubber.


Author(s):  
G. Meneghesso ◽  
E. Zanoni ◽  
P. Colombo ◽  
M. Brambilla ◽  
R. Annunziata ◽  
...  

Abstract In this work, we present new results concerning electrostatic discharge (ESD) robustness of 0.6 μm CMOS structures. Devices have been tested according to both HBM and socketed CDM (sCDM) ESD test procedures. Test structures have been submitted to a complete characterization consisting in: 1) measurement of the tum-on time of the protection structures submitted to pulses with very fast rise times; 2) ESD stress test with the HBM and sCDM models; 3) failure analysis based on emission microscopy (EMMI) and Scanning Electron Microscopy (SEM).


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