scholarly journals Image Sensing Technology. A Level-Conversion Method for Wide-Dynamic-Range Camera System.

2002 ◽  
Vol 56 (3) ◽  
pp. 469-475 ◽  
Author(s):  
Kazuhiko Ueda ◽  
Masami Ogata ◽  
Takashi Tsuchiya ◽  
Takeshi Kubozono
Keyword(s):  
Dynamic Range ◽  
Wide Dynamic Range ◽  
Camera System ◽  
Range Camera ◽  
Image Sensing ◽  
Conversion Method ◽  
Sensing Technology

A wide dynamic range x-ray streak camera system

2008 ◽  
Vol 79 (2) ◽  
pp. 023103 ◽  
Author(s):  
Niu Lihong ◽  
Yang Qinlao ◽  
Niu Hanben ◽  
Liao Hua ◽  
Zhou Junlan ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Streak Camera ◽  
Wide Dynamic Range ◽  
Camera System ◽  
X Ray

Quarter Video Graphics Array Digital Pixel Image Sensing With a Linear and Wide- Dynamic-Range Response by Using Pixel-Wise 3-D Integration

2019 ◽  
Vol 66 (2) ◽  
pp. 969-975 ◽  
Author(s):  
Masahide Goto ◽  
Yuki Honda ◽  
Toshihisa Watabe ◽  
Kei Hagiwara ◽  
Masakazu Nanba ◽  
...  
Keyword(s):  
Dynamic Range ◽  
Wide Dynamic Range ◽  
Image Sensing ◽  
Digital Pixel ◽  
Pixel Image

scholarly journals Observation of Welding Phenomena by Wide Dynamic Range Camera.

2001 ◽  
Vol 70 (7) ◽  
pp. 678-682
Author(s):  
Hideo SEKI ◽  
Atsushi NAKAJIMA ◽  
Kaoru KITAMURA ◽  
Keiji OHTSUKA ◽  
Hitoshi ARAI
Keyword(s):  
Dynamic Range ◽  
Wide Dynamic Range ◽  
Range Camera

Wide-dynamic-range camera using a novel optical beam splitting system

2002 ◽  
Author(s):  
Takayuki Yamashita ◽  
Masayuki Sugawara ◽  
Kohji Mitani ◽  
Fumio Okano
Keyword(s):  
Dynamic Range ◽  
Optical Beam ◽  
Beam Splitting ◽  
Wide Dynamic Range ◽  
Range Camera ◽  
Splitting System

Slow-Scan CCD Observation of Backscattering Patterns in SEM

1992 ◽  
Vol 50 (2) ◽  
pp. 1308-1309
Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Dynamic Range ◽  
High Sensitivity ◽  
Lens System ◽  
Wide Dynamic Range ◽  
Peltier Cooler ◽  
Diffraction Patterns ◽  
Scanning Electron

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).

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