scholarly journals Image Sensing Technology. A Level-Conversion Method for Wide-Dynamic-Range Camera System.

Author(s):  
Kazuhiko Ueda ◽  
Masami Ogata ◽  
Takashi Tsuchiya ◽  
Takeshi Kubozono
2008 ◽  
Vol 79 (2) ◽  
pp. 023103 ◽  
Author(s):  
Niu Lihong ◽  
Yang Qinlao ◽  
Niu Hanben ◽  
Liao Hua ◽  
Zhou Junlan ◽  
...  

2019 ◽  
Vol 66 (2) ◽  
pp. 969-975 ◽  
Author(s):  
Masahide Goto ◽  
Yuki Honda ◽  
Toshihisa Watabe ◽  
Kei Hagiwara ◽  
Masakazu Nanba ◽  
...  

2001 ◽  
Vol 70 (7) ◽  
pp. 678-682
Author(s):  
Hideo SEKI ◽  
Atsushi NAKAJIMA ◽  
Kaoru KITAMURA ◽  
Keiji OHTSUKA ◽  
Hitoshi ARAI

2002 ◽  
Author(s):  
Takayuki Yamashita ◽  
Masayuki Sugawara ◽  
Kohji Mitani ◽  
Fumio Okano

Author(s):  
F. Ouyang ◽  
D. A. Ray ◽  
O. L. Krivanek

Electron backscattering Kikuchi diffraction patterns (BKDP) reveal useful information about the structure and orientation of crystals under study. With the well focused electron beam in a scanning electron microscope (SEM), one can use BKDP as a microanalysis tool. BKDPs have been recorded in SEMs using a phosphor screen coupled to an intensified TV camera through a lens system, and by photographic negatives. With the development of fiber-optically coupled slow scan CCD (SSC) cameras for electron beam imaging, one can take advantage of their high sensitivity and wide dynamic range for observing BKDP in SEM.We have used the Gatan 690 SSC camera to observe backscattering patterns in a JEOL JSM-840A SEM. The CCD sensor has an active area of 13.25 mm × 8.83 mm and 576 × 384 pixels. The camera head, which consists of a single crystal YAG scintillator fiber optically coupled to the CCD chip, is located inside the SEM specimen chamber. The whole camera head is cooled to about -30°C by a Peltier cooler, which permits long integration times (up to 100 seconds).


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