scholarly journals “The saved and the lost.” Attempt to recall on-line. Part II

Sententiae ◽  
2021 ◽  
Vol 40 (1) ◽  
pp. 160-174
Author(s):  
Natalia Viatkina ◽  
◽  
Amina Khelufi ◽  
Kseniia Myroshnyk ◽  
Nataliia Reva ◽  
...  
Keyword(s):  
Line Part ◽  
On Line

Interview of Amina Khelufi, Kseniia Myroshnyk and Nataliia Reva with Natalia Viatkina.

scholarly journals On-line part deformation prediction based on deep learning

2019 ◽  
Vol 31 (3) ◽  
pp. 561-574 ◽  
Author(s):  
Zhiwei Zhao ◽  
Yingguang Li ◽  
Changqing Liu ◽  
James Gao
Keyword(s):  
Deep Learning ◽  
Deformation Prediction ◽  
Line Part ◽  
On Line

Automating ICSI With Rotationally Oscillating Drill (Ros-Drill©) Using Visual Feedback

2010 ◽  
Author(s):  
Jhon Diaz ◽  
Nejat Olgac ◽  
Mehdi Karzar Jeddi ◽  
Tai-Hsi Fan
Keyword(s):  
Real Time ◽  
Visual Feedback ◽  
Oscillation Phase ◽  
The Real ◽  
Rotational Oscillation ◽  
Line Part ◽  
On Line ◽  
Species Specific ◽  
Validation Tests ◽  
Visual Feedback Control

ICSI (Intra-Cytoplasmic Sperm Injection) has attracted research interest from both biological and engineering groups. This technique is used to create genetically identical offsprings of many different species (mice, rats, cattle et al.). We focus on a relatively recent technology for ICSI, called Ros-Drill© (Rotationally Oscillating Drill). In this paper, we present a procedure to automate a critical part of the ICSI operation: initiation of the rotational oscillation phase. (The visual feedback is on the real-time visual monitoring of the tip of the injection pipette. First, the real-time feature extraction in visual feedback is explained). The proposed algorithm which does this is split up into two parts: off-line and on-line. In the off-line part a proper thresholding grey level is determined. In the on-line part a realtime algorithm tracks the tip of the injecting pipette. A predetermined, species-specific penetration depth is used to initiate the rotational oscillation action of the drill. This real-time visual feedback control is compared with an earlier curvature-based analysis. Algorithmic stages as well as the outcomes from the concept validation tests are presented.

scholarly journals Deep Hash-based Relevance-aware Data Quality Assessment for Image Dark Data

2021 ◽  
Vol 2 (2) ◽  
pp. 1-26
Author(s):  
Yu Liu ◽  
Yangtao Wang ◽  
Lianli Gao ◽  
Chan Guo ◽  
Yanzhao Xie ◽  
...  
Keyword(s):  
Data Mining ◽  
Data Quality ◽  
Quality Assessment ◽  
Hamming Distance ◽  
Image Data ◽  
Importance Score ◽  
Assessment Framework ◽  
Line Part ◽  
Data Quality Assessment ◽  
On Line

Data mining can hardly solve but always faces a problem that there is little meaningful information within the dataset serving a given requirement. Faced with multiple unknown datasets, to allocate data mining resources to acquire more desired data, it is necessary to establish a data quality assessment framework based on the relevance between the dataset and requirements. This framework can help the user to judge the potential benefits in advance, so as to optimize the resource allocation to those candidates. However, the unstructured data (e.g., image data) often presents dark data states, which makes it tricky for the user to understand the relevance based on content of the dataset in real time. Even if all data have label descriptions, how to measure the relevance between data efficiently under semantic propagation remains an urgent problem. Based on this, we propose a Deep Hash-based Relevance-aware Data Quality Assessment framework, which contains off-line learning and relevance mining parts as well as an on-line assessing part. In the off-line part, we first design a Graph Convolution Network (GCN)-AutoEncoder hash (GAH) algorithm to recognize the data (i.e., lighten the dark data), then construct a graph with restricted Hamming distance, and finally design a Cluster PageRank (CPR) algorithm to calculate the importance score for each node (image) so as to obtain the relevance representation based on semantic propagation. In the on-line part, we first retrieve the importance score by hash codes and then quickly get the assessment conclusion in the importance list. On the one hand, the introduction of GCN and co-occurrence probability in the GAH promotes the perception ability for dark data. On the other hand, the design of CPR utilizes hash collision to reduce the scale of graph and iteration matrix, which greatly decreases the consumption of space and computing resources. We conduct extensive experiments on both single-label and multi-label datasets to assess the relevance between data and requirements as well as test the resources allocation. Experimental results show our framework can gain the most desired data with the same mining resources. Besides, the test results on Tencent1M dataset demonstrate the framework can complete the assessment with a stability for given different requirements.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Image registration with a computer driven S.T.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 98-99
Author(s):  
A.M.H. Schepman ◽  
J.A.P. van der Voort ◽  
J.E. Mellema
Keyword(s):  
Spot Size ◽  
Scanning Transmission Electron Microscope ◽  
Small Computer ◽  
Structural Studies ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Specimen Area ◽  
On Line ◽  
Minimum Distances

A Scanning Transmission Electron Microscope (STEM) was coupled to a small computer. The system (see Fig. 1) has been built using a Philips EM400, equipped with a scanning attachment and a DEC PDP11/34 computer with 34K memory. The gun (Fig. 2) consists of a continuously renewed tip of radius 0.2 to 0.4 μm of a tungsten wire heated just below its melting point by a focussed laser beam (1). On-line operation procedures were developped aiming at the reduction of the amount of radiation of the specimen area of interest, while selecting the various imaging parameters and upon registration of the information content. Whereas the theoretical limiting spot size is 0.75 nm (2), routine resolution checks showed minimum distances in the order 1.2 to 1.5 nm between corresponding intensity maxima in successive scans. This value is sufficient for structural studies of regular biological material to test the performance of STEM over high resolution CTEM.

Design and calibration of an IVEM for general 3-dimensional imaging of non-diffracting materials

1992 ◽  
Vol 50 (2) ◽  
pp. 1040-1041
Author(s):  
Neil Rowlands ◽  
Jeff Price ◽  
Michael Kersker ◽  
Seichi Suzuki ◽  
Steve Young ◽  
...  
Keyword(s):  
3D Imaging ◽  
Tomographic Reconstruction ◽  
Three Dimensional ◽  
3 Dimensional ◽  
3D Microstructure ◽  
Image Translation ◽  
Digital Correlation ◽  
On Line ◽  
Mechanical Stage ◽  
Projection Angle

Three-dimensional (3D) microstructure visualization on the electron microscope requires that the sample be tilted to different positions to collect a series of projections. This tilting should be performed rapidly for on-line stereo viewing and precisely for off-line tomographic reconstruction. Usually a projection series is collected using mechanical stage tilt alone. The stereo pairs must be viewed off-line and the 60 to 120 tomographic projections must be aligned with fiduciary markers or digital correlation methods. The delay in viewing stereo pairs and the alignment problems in tomographic reconstruction could be eliminated or improved by tilting the beam if such tilt could be accomplished without image translation.A microscope capable of beam tilt with simultaneous image shift to eliminate tilt-induced translation has been investigated for 3D imaging of thick (1 μm) biologic specimens. By tilting the beam above and through the specimen and bringing it back below the specimen, a brightfield image with a projection angle corresponding to the beam tilt angle can be recorded (Fig. 1a).

Software pattern recognition applied to nanodiffraction patterns from a STEM instrument

1986 ◽  
Vol 44 ◽  
pp. 694-695
Author(s):  
G.Y. Fan ◽  
J.M. Cowley
Keyword(s):  
Image Processing ◽  
Pattern Recognition ◽  
Computer Software ◽  
Processing System ◽  
Light Level ◽  
Host Computer ◽  
Low Light ◽  
Image Processing System ◽  
Recent Developments ◽  
On Line

In recent developments, the ASU HB5 has been modified so that the timing, positioning, and scanning of the finely focused electron probe can be entirely controlled by a host computer. This made the asynchronized handshake possible between the HB5 STEM and the image processing system which consists of host computer (PDP 11/34), DeAnza image processor (IP 5000) which is interfaced with a low-light level TV camera, array processor (AP 400) and various peripheral devices. This greatly facilitates the pattern recognition technique initiated by Monosmith and Cowley. Software called NANHB5 is under development which, instead of employing a set of photo-diodes to detect strong spots on a TV screen, uses various software techniques including on-line fast Fourier transform (FFT) to recognize patterns of greater complexity, taking advantage of the sophistication of our image processing system and the flexibility of computer software.

Thickness Measurement in the AEM by Macintosh-Based Analysis of Two-Beam Convergent Beam Patterns

1990 ◽  
Vol 48 (2) ◽  
pp. 504-505
Author(s):  
John F. Mansfield ◽  
Douglas C. Crawford
Keyword(s):  
Electron Microscope ◽  
Video Camera ◽  
Thickness Measurement ◽  
Specimen Thickness ◽  
Crystalline Materials ◽  
Beam Dynamic ◽  
Line Measurement ◽  
On Line ◽  
Image Position ◽  
Convergent Beam

A method has been developed that allows on-line measurement of the thickness of crystalline materials in the analytical electron microscope. Two-beam convergent beam electron diffraction (CBED) patterns are digitized from a JEOL 2000FX electron microscope into an Apple Macintosh II microcomputer via a Gatan #673 CCD Video Camera and an Imaging Systems Technology Video 1000 frame-capture board. It is necessary to know the lattice parameters of the sample since measurements are made of the spacing of the diffraction discs in order to calibrate the pattern. The sample thickness is calculated from measurements of the spacings of the fringes that are seen in the diffraction discs. This technique was pioneered by Kelly et al, who used the two-beam dynamic theory of MacGillavry relate the deviation parameter (Si) of the ith fringe from the exact Bragg condition to the specimen thickness (t) with the equation:Where ξg, is the extinction distance for that reflection and ni is an integer.

Recent developments in automated Transmission Electron MI

1989 ◽  
Vol 47 ◽  
pp. 46-47
Author(s):  
W.J. de Ruijter ◽  
P. Rez ◽  
David J. Smith
Keyword(s):  
Image Analysis ◽  
Computer Image ◽  
Lens Design ◽  
Computer Image Analysis ◽  
Transmission Electron ◽  
Resolution Electron ◽  
Recent Developments ◽  
On Line ◽  
Routine Procedures ◽  
Near Future

There is growing interest in the on-line use of computers in high-resolution electron n which should reduce the demands on highly skilled operators and thereby extend the r of the technique. An on-line computer could obviously perform routine procedures hand, or else facilitate automation of various restoration, reconstruction and enhan These techniques are slow and cumbersome at present because of the need for cai micrographs and off-line processing. In low resolution microscopy (most biologic; primary incentive for automation and computer image analysis is to create a instrument, with standard programmed procedures. In HREM (materials researc computer image analysis should lead to better utilization of the microscope. Instru (improved lens design and higher accelerating voltages) have improved the interpretab the level of atomic dimensions (approximately 1.6 Å) and instrumental resolutior should become feasible in the near future.

Remote On-Line Control of a High-Voltage in situ Transmission Electron Microscope with A Rational User Interface

1996 ◽  
Vol 54 ◽  
pp. 384-385
Author(s):  
M.A. O’Keefe ◽  
J. Taylor ◽  
D. Owen ◽  
B. Crowley ◽  
K.H. Westmacott ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
User Interface ◽  
Transmission Electron Microscope ◽  
High Voltage ◽  
Materials Science ◽  
Transmission Electron ◽  
On Line ◽  
Electron Microscopes

Remote on-line electron microscopy is rapidly becoming more available as improvements continue to be developed in the software and hardware of interfaces and networks. Scanning electron microscopes have been driven remotely across both wide and local area networks. Initial implementations with transmission electron microscopes have targeted unique facilities like an advanced analytical electron microscope, a biological 3-D IVEM and a HVEM capable of in situ materials science applications. As implementations of on-line transmission electron microscopy become more widespread, it is essential that suitable standards be developed and followed. Two such standards have been proposed for a high-level protocol language for on-line access, and we have proposed a rational graphical user interface. The user interface we present here is based on experience gained with a full-function materials science application providing users of the National Center for Electron Microscopy with remote on-line access to a 1.5MeV Kratos EM-1500 in situ high-voltage transmission electron microscope via existing wide area networks. We have developed and implemented, and are continuing to refine, a set of tools, protocols, and interfaces to run the Kratos EM-1500 on-line for collaborative research. Computer tools for capturing and manipulating real-time video signals are integrated into a standardized user interface that may be used for remote access to any transmission electron microscope equipped with a suitable control computer.

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