Residual Stress Characterization of Thick PECVD TEOS Film for Power MEMS Applications
2013 ◽
Vol 205-206
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pp. 284-289
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2014 ◽
Vol 29
(17)
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pp. 1978-1986
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2015 ◽
Vol 647
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pp. 313-321
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2006 ◽
Vol 25
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pp. 107-122
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2015 ◽
Vol 46
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pp. 3943-3959
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