Statistical 3D Analysis and Modeling of Complex Particle Systems based on Tomographic Image Data

2019 ◽  
Vol 56 (12) ◽  
pp. 787-796
Author(s):  
O. Furat ◽  
B. Prifling ◽  
D. Westhoff ◽  
M. Weber ◽  
V. Schmidt
Keyword(s):  
Image Data ◽  
Particle Systems ◽  
3D Analysis ◽  
Tomographic Image ◽  
Complex Particle

On the accuracy of triple phase boundary lengths calculated from tomographic image data

2014 ◽  
Vol 261 ◽  
pp. 198-205 ◽  
Author(s):  
Peter S. Jørgensen ◽  
Kyle Yakal-Kremski ◽  
James Wilson ◽  
Jacob R. Bowen ◽  
Scott Barnett
Keyword(s):  
Phase Boundary ◽  
Image Data ◽  
Tomographic Image ◽  
Triple Phase Boundary

Statistical Comparison of Various Reconstruction Algorithms with respect to Missing Wedge Artifacts in Computed Tomography

2012 ◽  
Vol 1421 ◽  
Author(s):  
Sebastian Lueck ◽  
Andreas Kupsch ◽  
Axel Lange ◽  
Manfred P. Hentschel ◽  
Volker Schmidt
Keyword(s):  
Computed Tomography ◽  
Quantitative Analysis ◽  
Spatial Statistics ◽  
Image Data ◽  
Reconstruction Technique ◽  
Tomographic Image ◽  
Reconstruction Algorithms ◽  
Phase Boundaries ◽  
Statistical Comparison

ABSTRACTThe presence of elongation, streak and blurring artifacts in tomograms recorded under a missing wedge of rotation angles presents a major challenge for the quantitative analysis of tomographic image data. We show that the missing wedge artifacts of standard reconstruction algorithms may be reduced by the innovative reconstruction technique DIRECTT. For the comparison of missing wedge artifacts we apply techniques from spatial statistics, which have been specifically designed to investigate the shape of phase boundaries in tomograms.

scholarly journals Machine Learning Techniques for the Segmentation of Tomographic Image Data of Functional Materials

2019 ◽  
Vol 6 ◽  
Author(s):  
Orkun Furat ◽  
Mingyan Wang ◽  
Matthias Neumann ◽  
Lukas Petrich ◽  
Matthias Weber ◽  
...  
Keyword(s):  
Machine Learning ◽  
Image Data ◽  
Functional Materials ◽  
Machine Learning Techniques ◽  
Tomographic Image ◽  
Learning Techniques

scholarly journals Fitting Laguerre tessellation approximations to tomographic image data

2016 ◽  
Vol 96 (2) ◽  
pp. 166-189 ◽  
Author(s):  
A. Spettl ◽  
T. Brereton ◽  
Q. Duan ◽  
T. Werz ◽  
C. E. Krill ◽  
...  
Keyword(s):  
Image Data ◽  
Tomographic Image

Dynamical Scattering in Crystalline Biological Specimens. I. Criteria of Validity for Scattering Approximations

1975 ◽  
Vol 33 ◽  
pp. 192-193
Author(s):  
Robert M. Glaeser ◽  
Bing K. Jap
Keyword(s):  
Biological Sciences ◽  
Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Born Approximation ◽  
Materials Science ◽  
Image Data ◽  
Dynamical Effect ◽  
Crystallographic Structure ◽  
Electron Microscope Image

The dynamical scattering effect, which can be described as the failure of the first Born approximation, is perhaps the most important factor that has prevented the widespread use of electron diffraction intensities for crystallographic structure determination. It would seem to be quite certain that dynamical effects will also interfere with structure analysis based upon electron microscope image data, whenever the dynamical effect seriously perturbs the diffracted wave. While it is normally taken for granted that the dynamical effect must be taken into consideration in materials science applications of electron microscopy, very little attention has been given to this problem in the biological sciences.

Application of an image management system in microscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1052-1053
Author(s):  
Richard S. Chemock
Keyword(s):  
Data Storage ◽  
Cost Savings ◽  
Image Data ◽  
Analytical Techniques ◽  
Operational Mode ◽  
Fine Grained ◽  
Image Recording ◽  
Primary Output ◽  
Capacity Data ◽  
Image Management System

One of the most common tasks in a typical analysis lab is the recording of images. Many analytical techniques (TEM, SEM, and metallography for example) produce images as their primary output. Until recently, the most common method of recording images was by using film. Current PS/2R systems offer very large capacity data storage devices and high resolution displays, making it practical to work with analytical images on PS/2s, thereby sidestepping the traditional film and darkroom steps. This change in operational mode offers many benefits: cost savings, throughput, archiving and searching capabilities as well as direct incorporation of the image data into reports.The conventional way to record images involves film, either sheet film (with its associated wet chemistry) for TEM or PolaroidR film for SEM and light microscopy. Although film is inconvenient, it does have the highest quality of all available image recording techniques. The fine grained film used for TEM has a resolution that would exceed a 4096x4096x16 bit digital image.

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