In-situ studies of the TGO growth stresses and the martensitic transformation in the B2 phase in commercial Pt-modified NiAl and NiCoCrAlY bond coat alloys

2007 ◽  
Vol 98 (12) ◽  
pp. 1209-1213 ◽  
Author(s):  
D. Hovis ◽  
L. Hu ◽  
A. Reddy ◽  
A. H. Heuer ◽  
A. P. Paulikas ◽  
...  
Keyword(s):  
Martensitic Transformation ◽  
Bond Coat ◽  
Growth Stresses ◽  
In Situ Studies ◽  
B2 Phase ◽  
Bond Coat Alloys ◽  
Tgo Growth

In situ studies of the martensitic transformation in epitaxial Ni–Mn–Ga films

2009 ◽  
Vol 57 (8) ◽  
pp. 2516-2526 ◽  
Author(s):  
J. Buschbeck ◽  
R. Niemann ◽  
O. Heczko ◽  
M. Thomas ◽  
L. Schultz ◽  
...  
Keyword(s):  
Martensitic Transformation ◽  
In Situ Studies

scholarly journals In-situ studies on martensitic transformation and high-temperature shape memory in small volume zirconia

2017 ◽  
Vol 134 ◽  
pp. 257-266 ◽  
Author(s):  
Xiao Mei Zeng ◽  
Zehui Du ◽  
Nobumichi Tamura ◽  
Qing Liu ◽  
Christopher A. Schuh ◽  
...  
Keyword(s):  
High Temperature ◽  
Martensitic Transformation ◽  
Shape Memory ◽  
Small Volume ◽  
In Situ Studies

In Situ Study of Stress-Induced Martensitic Transformation in Ni47Ti44Nb9 Shape-Memory Alloys

2013 ◽  
Vol 652-654 ◽  
pp. 1096-1101 ◽  
Author(s):  
Hong Tao Liu ◽  
Guang Ai Sun ◽  
Yan Dong Wang ◽  
Bo Chen ◽  
Xiao Lin Wang ◽  
...  
Keyword(s):  
Martensitic Transformation ◽  
Driving Force ◽  
Lattice Strain ◽  
X Ray Diffraction ◽  
Irreversible Strain ◽  
X Ray ◽  
Loading And Unloading ◽  
B2 Phase ◽  
Xrd Patterns

The stress-induced martensitic transformation in Ni47Ti44Nb9was examined using X-ray diffraction (XRD) during in situ uniaxial loading and unloading. A new martensitic (020) peak in XRD patterns is observed under strain from 10% to 12%. It indicates that the martensitic texture has reached the optimum orientation. After unloading, approximately 8% irreversible strain still remains. It is associated with the reorientation of martensites and the plastic deformation of the B2-phase. In addition, the deformed β-Nb particles would also reduce the driving force for the reverse transformation. The details of lattice-strain and shared applied stress (SAS) in the B2-phase and β-Nb phase are also discussed in this work.

In situ observation of the martensitic transformation in (Mg,Y)-PSZ

1986 ◽  
Vol 44 ◽  
pp. 500-501
Author(s):  
R-R. Lee
Keyword(s):  
Martensitic Transformation ◽  
High Strength ◽  
Nucleation And Growth ◽  
In Situ Observation ◽  
Considerable Potential ◽  
Transmission Electron ◽  
Structural Applications ◽  
Applied Stresses ◽  
Kinetics Of

Partially-stabilized ZrO2 (PSZ) ceramics have considerable potential for advanced structural applications because of their high strength and toughness. These properties derive from small tetragonal ZrO2 (t-ZrO2) precipitates in a cubic (c) ZrO2 matrix, which transform martensitically to monoclinic (m) symmetry under applied stresses. The kinetics of the martensitic transformation is believed to be nucleation controlled and the nucleation is always stress induced. In situ observation of the martensitic transformation using transmission electron microscopy provides considerable information about the nucleation and growth aspects of the transformation.

Preparation of integrated circuits for TEM electromigration in situ studies

1986 ◽  
Vol 44 ◽  
pp. 882-883
Author(s):  
J. V. Maskowitz ◽  
W. E. Rhoden ◽  
D. R. Kitchen ◽  
R. E. Omlor ◽  
P. F. Lloyd
Keyword(s):  
Integrated Circuits ◽  
Crystallographic Orientation ◽  
Silicon Wafers ◽  
Minimum Size ◽  
Test Vehicle ◽  
In Situ Studies ◽  
Boron Doped ◽  
Doped Silicon ◽  
Drill Holes

The fabrication of the aluminum bridge test vehicle for use in the crystallographic studies of electromigration involves several photolithographic processes, some common, while others quite unique. It is most important to start with a clean wafer of known orientation. The wafers used are 7 mil thick boron doped silicon. The diameter of the wafer is 1.5 inches with a resistivity of 10-20 ohm-cm. The crystallographic orientation is (111).Initial attempts were made to both drill and laser holes in the silicon wafers then back fill with photoresist or mounting wax. A diamond tipped dentist burr was used to successfully drill holes in the wafer. This proved unacceptable in that the perimeter of the hole was cracked and chipped. Additionally, the minimum size hole realizable was > 300 μm. The drilled holes could not be arrayed on the wafer to any extent because the wafer would not stand up to the stress of multiple drilling.

Tailoring martensitic transformation and mechanical properties of Ti–Ni composite reinforced by network structure of in-situ TiB and La2O3 phase

Vacuum ◽  
2021 ◽  
Vol 184 ◽  
pp. 109894 ◽  
Author(s):  
Xiaoyang Yi ◽  
Haizhen Wang ◽  
Kuishan Sun ◽  
Guijuan Shen ◽  
Xianglong Meng ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Martensitic Transformation ◽  
Network Structure
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