Oxidation-Induced Changes of Work Function and Interfacial Electronic States on Si(001) Surfaces Studied by Real-Time Ultraviolet Photoelectron Spectroscopy
2005 ◽
Vol 44
(No. 33)
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pp. L1048-L1051
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1974 ◽
Vol 70
(0)
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pp. 1810-1817
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1995 ◽
Vol 02
(05)
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pp. 573-577
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1998 ◽
Vol 88-91
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pp. 707-710
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2011 ◽
Vol 134
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pp. 084309
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1988 ◽
Vol 84
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pp. 299
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