scholarly journals Noble Technique for Studying Secondary Electron Emission from MgO Surface as Protecting Insulator in Plasma Display Panel Cell

Shinku ◽  
2003 ◽  
Vol 46 (4) ◽  
pp. 352-355 ◽  
Author(s):  
Takaharu NAGATOMI ◽  
Yuzuru MIZUHARA ◽  
Takuji TSUJITA ◽  
Yoshizo TAKAI
Keyword(s):  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Plasma Display Panel ◽  
Plasma Display ◽  
Mgo Surface ◽  
Panel Cell

Effect of TiO2 Addition on the Secondary Electron Emission and Discharge Properties of MgO Protective Layer

2000 ◽  
Vol 621 ◽  
Author(s):  
Younghyun Kim ◽  
Rakhwan Kim ◽  
Hee Jae Kim ◽  
Hyeongtag Jeon ◽  
Jong-Wan Park
Keyword(s):  
Band Structure ◽  
Electron Emission ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Film Surface ◽  
Protective Layer ◽  
Discharge Voltage ◽  
Plasma Display Panel ◽  
Plasma Display ◽  
Deposited Films

ABSTRACTSecondary electron emission from a cathode material in AC PDP (Plasma Display Panel) is dominated by potential emission mechanism, which is sensitive to band structure of a protective layer. Therefore, the secondary electron emission property can be modified by a change in the energy band structure of the protective layer. Mg2-2xTixO2 films were prepared by e-beam evaporation method to be used as possible substitutes for the conventional MgO protective layer. The oxygen content in the films and in turn, the ratio of metal to oxygen gradually increased with the increasing TiO2 content in the starting materials. The pure MgO films exhibited the crystallinity with strong (111) orientation. The Mg2-2xTixO2 films, however, had the crystallinity with (311) preferred orientation. The stress relaxation, when the [TiO2/(MgO+TiO2)] ratio in the evaporation starting materials was 0.15, seems to be related to inhomogeneous film surface due to an excessive addition of TiO2 to MgO. When the [TiO2/(MgO+TiO2)] ratios of 0.1 and 0.15 were used, the deposited films exhibited the secondary electron emission yields improved by 50% compared to that of the conventional MgO protective layer, which resulted in reduction in discharge voltage by 12%.

The Effect of CaO Addition on the Microstructural, Mechanical and Dielectric Properties of Pure MgO Ceramic

2007 ◽  
Vol 345-346 ◽  
pp. 1609-1612 ◽  
Author(s):  
Agus Geter E. Sutjipto
Keyword(s):  
Electron Emission ◽  
Electrical Discharge ◽  
Secondary Electron ◽  
Secondary Electron Emission ◽  
Emission Coefficient ◽  
Plasma Display Panel ◽  
Promising Candidate ◽  
Secondary Electron Emission Coefficient ◽  
Surface Breakdown ◽  
Plasma Display

High purity MgO is a common ceramic material used as a protecting layer in an alternating current plasma display panel (AC-PDP). In this work, pure MgO was added by CaO for a better protecting layer. The effect of CaO addition was discussed according to the changes in the microstructure, mechanical strength and the ability of the sample to withstand surface breakdown (flashover) with various CaO addition in the powder mixture. In addition, it was found that 2.5 wt% CaO-addition shows a better electrical discharge. Since secondary electron emission coefficient contributes in the electrical discharge, it could be predicted that the 2.5 wt% CaO added MgO has a higher secondary electron emission constant and becomes a promising candidate for a protecting layer in AC-PDP.

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