scholarly journals Analysis of Si(001)c(4*4)-Sn using Scanning Tunneling Microscopy and Coaxial Impact-Collision Ion Scattering Spectroscopy

Shinku ◽  
2003 ◽  
Vol 46 (3) ◽  
pp. 162-165 ◽  
Author(s):  
Hideyuki SHIBATA ◽  
Toshu AN ◽  
Masamichi YOSHIMURA ◽  
Kazuyuki UEDA
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