scholarly journals Dual Ion Beam Irradiation System for In situ Observation with Electron Microscope.

Shinku ◽  
1993 ◽  
Vol 36 (7) ◽  
pp. 603-609
Author(s):  
Tetuo TSUKAMOTO ◽  
Kiiti HOJOU ◽  
Sigemi FURUNO ◽  
Hitosi OTSU ◽  
Kazuhiko IZUI
Keyword(s):  
Electron Microscope ◽  
Ion Beam ◽  
In Situ Observation ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Irradiation System

scholarly journals Low-Energy Ion Beam Irradiation System for In-Situ Observation with Electron Microscope.

Shinku ◽  
1994 ◽  
Vol 37 (2) ◽  
pp. 62-68
Author(s):  
Tetsuo TSUKAMOTO ◽  
Takeo MUROGA ◽  
Naoaki YOSHIDA
Keyword(s):  
Electron Microscope ◽  
Ion Beam ◽  
Low Energy ◽  
In Situ Observation ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Irradiation System

A new system for in-situ observation of dynamic process of structural and chemical changes during dual ion beam irradiation in a 400 Kv Electron Microscope

1990 ◽  
Vol 48 (4) ◽  
pp. 538-539
Author(s):  
Shigemi Furuno ◽  
Kiichi Hojou ◽  
Hitoshu Otsu ◽  
Kazuhiko Izui ◽  
Teikichi Sasaki ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Dynamic Process ◽  
Ion Beam ◽  
Ion Beams ◽  
Observation System ◽  
In Situ Observation ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Chemical Changes

In order to simulate radiation damage of fusion reactor materials, we have developed an in-situ observation system in 1986, which consisted of an electron microscope of JEM-100C type combined with a 10 keV ion gun and parallel EELS. Using this system, we have observed dynamic processes of structural and chemical changes of materials during ion irradiation. In this paper, we have developed a new in-situ observation system, with which it is possible to observe dynamic process of structural and chemical changes of materials during dual ion beam irradiation.This system consists of an analytical electron microscope of 4000FX type linked with two 40 keV ion beam accelerators, as shown in fig. 1. The maximum possible ion current on the specimen is 50μA/cm2 for 40keV He ion. Ion beams emmitted from duo-plasmatron ion guns are deflected downward by an angle of 30° with selecting magnet and are introduced into the specimen chamber. Ion beams are deflected downward again by an angle of 30° with electrostatic plism and are incident finally at an angle of 60° with the surface of the specimen, as shown in fig. 2. The images of electron microscope during irradiation are recorded with a VTR through a TV camera. It is possible to control the temperature of the specimen during irradiation within the range from 10 K to 1575 K by using both low and high temperature specimen holders. Test of tension for the specimen under irradiation is also possible. The in-situ chemical analysis in the region of 10 nm under irradiation is possible with EDS (UTW type, Tracor Nothern) and parallel EELS (666 type, Gatan). A quadrapole mass spectrometer is attached near specimen chamber to carry out TDS analysis.

In-situ observation of structural changes in aluminum during He+ and H2+ dual-ion beam irradiation

1992 ◽  
Vol 191-194 ◽  
pp. 1219-1223 ◽  
Author(s):  
S. Furuno ◽  
K. Hojou ◽  
K. Izui ◽  
N. Kamigaki ◽  
K. Ono ◽  
...  
Keyword(s):  
Structural Changes ◽  
Ion Beam ◽  
In Situ Observation ◽  
Beam Irradiation ◽  
Ion Beam Irradiation

In-situ observation of damage evolution in SiC crystals during He+ and H2+ dual-ion beam irradiation

1992 ◽  
Vol 191-194 ◽  
pp. 583-587 ◽  
Author(s):  
K. Hojou ◽  
S. Furuno ◽  
K.N. Kushita ◽  
H. Otsu ◽  
K. Izui
Keyword(s):  
Damage Evolution ◽  
Ion Beam ◽  
In Situ Observation ◽  
Beam Irradiation ◽  
Ion Beam Irradiation

In-situ luminescence measurement of lithium aluminate under ion beam irradiation

1992 ◽  
Vol 191-194 ◽  
pp. 268-271 ◽  
Author(s):  
Yoshiyuki Asaoka ◽  
Hirotake Moriyama ◽  
Kimihiko Iwasaki ◽  
Kimikazu Moritani ◽  
Yasuhiko Ito
Keyword(s):  
Ion Beam ◽  
Lithium Aluminate ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Luminescence Measurement

Development of an Ion Beam Irradiation System for Liquid Crystal Alignment Layer Production

2008 ◽  
Author(s):  
Takeshi Matsumoto ◽  
Yuko Kinoshita ◽  
Masahiro Tanii ◽  
Junichi Tatemichi ◽  
Masashi Konishi ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Ion Beam ◽  
Beam Irradiation ◽  
Ion Beam Irradiation ◽  
Alignment Layer ◽  
Liquid Crystal Alignment ◽  
Irradiation System ◽  
Crystal Alignment
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