A Distributed Heterogeneous Inspection System for High Performance In-line Surface Defect Detection

2018 ◽  
pp. 1-13
Author(s):  
Yu-Cheng Chou ◽  
Wei-Chieh Liao ◽  
Yan-Liang Chen ◽  
Ming Chang ◽  
Po Lin
Keyword(s):  
Defect Detection ◽  
High Performance ◽  
Surface Defect ◽  
Inspection System ◽  
Surface Defect Detection

scholarly journals Research Progress of Automated Visual Surface Defect Detection for Industrial Metal Planar Materials

Sensors ◽  
2020 ◽  
Vol 20 (18) ◽  
pp. 5136
Author(s):  
Xiaoxin Fang ◽  
Qiwu Luo ◽  
Bingxing Zhou ◽  
Congcong Li ◽  
Lu Tian
Keyword(s):  
Defect Detection ◽  
Surface Defect ◽  
Three Dimensional ◽  
Image Features ◽  
Stereoscopic Vision ◽  
Research Progress ◽  
Inspection System ◽  
Two Dimensional ◽  
Surface Defect Detection ◽  
Planar Materials

The computer-vision-based surface defect detection of metal planar materials is a research hotspot in the field of metallurgical industry. The high standard of planar surface quality in the metal manufacturing industry requires that the performance of an automated visual inspection system and its algorithms are constantly improved. This paper attempts to present a comprehensive survey on both two-dimensional and three-dimensional surface defect detection technologies based on reviewing over 160 publications for some typical metal planar material products of steel, aluminum, copper plates and strips. According to the algorithm properties as well as the image features, the existing two-dimensional methodologies are categorized into four groups: statistical, spectral, model, and machine learning-based methods. On the basis of three-dimensional data acquisition, the three-dimensional technologies are divided into stereoscopic vision, photometric stereo, laser scanner, and structured light measurement methods. These classical algorithms and emerging methods are introduced, analyzed, and compared in this review. Finally, the remaining challenges and future research trends of visual defect detection are discussed and forecasted at an abstract level.

Surface defect detection for high-speed rails using an inverse P-M diffusion model

Sensor Review ◽  
2016 ◽  
Vol 36 (1) ◽  
pp. 86-97 ◽  
Author(s):  
Zhendong He ◽  
Yaonan Wang ◽  
Feng Yin ◽  
Jie Liu
Keyword(s):  
Diffusion Model ◽  
Defect Detection ◽  
High Speed ◽  
Surface Defect ◽  
Nearest Neighbor ◽  
Inspection System ◽  
Content Type ◽  
Difference Image ◽  
Vision Inspection ◽  
Surface Defect Detection

Purpose – When using a machine vision inspection system for rail surface defect detection, many complex factors such as illumination changes, reflection inequality, shadows, stains and rust might inevitably deform the scanned rail surface image. This paper aims to reduce the influence of these factors, a pipeline of image processing algorithms for robust defect detection is developed. Design/methodology/approach – First, a new inverse Perona-Malik (P-M) diffusion model is presented for image enhancement, which takes the reciprocal of gradient as feature to adjust the diffusion coefficients, and a distinct nearest-neighbor difference scheme is introduced to select proper defect boundaries during discretized implementation. As a result, the defect regions are sufficiently smoothened, whereas the faultless background remains unchanged. Then, by subtracting the diffused image from the original image, the defect features will be highlighted in the difference image. Subsequently, an adaptive threshold binarization, followed by an attribute opening like filter, can easily eliminate the noisy interferences and find out the desired defects. Findings – Using data from our developed inspection apparatus, the experiments show that the proposed method can attain a detection and measurement precisions as high as 93.6 and 85.9 per cent, respectively, while the recovery accuracy remains 93 per cent. Additionally, the proposed method is computationally efficient and can perform robustly even under complex environments. Originality/value – A pipeline of algorithms for rail surface detection is proposed. Particularly, an inverse P-M diffusion model with a distinct discretization scheme is introduced to enhance the defect boundaries and suppress noises. The performance of the proposed method has been verified with real images from our own developed system.

scholarly journals YOLOv4-MN3 for PCB Surface Defect Detection

2021 ◽  
Vol 11 (24) ◽  
pp. 11701
Author(s):  
Xinting Liao ◽  
Shengping Lv ◽  
Denghui Li ◽  
Yong Luo ◽  
Zichun Zhu ◽  
...  
Keyword(s):  
Defect Detection ◽  
High Performance ◽  
Surface Defect ◽  
Printed Circuit Board ◽  
Surface Defects ◽  
Activation Function ◽  
Production Quality ◽  
Circuit Board ◽  
Detection Accuracy ◽  
Surface Defect Detection

Surface defect detection for printed circuit board (PCB) is indispensable for managing PCB production quality. However, automatic detection of PCB surface defects is still a challenging task because, even within the same category of surface defect, defects present great differences in morphology and pattern. Although many computer vision-based detectors have been established to handle these problems, current detectors struggle to achieve high detection accuracy, fast detection speed and low memory consumption simultaneously. To address those issues, we propose a cost-effective deep learning (DL)-based detector based on the cutting-edge YOLOv4 to detect PCB surface defect quickly and efficiently. The YOLOv4 is improved upon with respect to its backbone network and the activation function in its neck/prediction network. The improved YOLOv4 is evaluated with a customized dataset, collected from a PCB factory. The experimental results show that the improved detector achieved a high performance, scoring 98.64% on mean average precision (mAP) at 56.98 frames per second (FPS), outperforming the other compared SOTA detectors. Furthermore, the improved YOLOv4 reduced the parameter space of YOLOv4 from 63.96 M to 39.59 M and the number of multiply-accumulate operations (Madds) from 59.75 G to 26.15 G.

SDDNet: A Fast and Accurate Network for Surface Defect Detection

2021 ◽  
Vol 70 ◽  
pp. 1-13
Author(s):  
Lisha Cui ◽  
Xiaoheng Jiang ◽  
Mingliang Xu ◽  
Wanqing Li ◽  
Pei Lv ◽  
...  
Keyword(s):  
Defect Detection ◽  
Surface Defect ◽  
Surface Defect Detection

Lightweight detection algorithm for fine-grained surface defects of aerospace seal rings

2021 ◽  
pp. 1-18
Author(s):  
Hui Liu ◽  
Boxia He ◽  
Yong He ◽  
Xiaotian Tao
Keyword(s):  
Feature Extraction ◽  
Defect Detection ◽  
Surface Defect ◽  
Surface Defects ◽  
Detection Algorithm ◽  
Seal Ring ◽  
Fine Grained ◽  
Aerospace Applications ◽  
Surface Defect Detection ◽  
The Mean

The existing seal ring surface defect detection methods for aerospace applications have the problems of low detection efficiency, strong specificity, large fine-grained classification errors, and unstable detection results. Considering these problems, a fine-grained seal ring surface defect detection algorithm for aerospace applications is proposed. Based on analysis of the stacking process of standard convolution, heat maps of original pixels in the receptive field participating in the convolution operation are quantified and generated. According to the generated heat map, the feature extraction optimization method of convolution combinations with different dilation rates is proposed, and an efficient convolution feature extraction network containing three kinds of dilated convolutions is designed. Combined with the O-ring surface defect features, a multiscale defect detection network is designed. Before the head of multiscale classification and position regression, feature fusion tree modules are added to ensure the reuse and compression of the responsive features of different receptive fields on the same scale feature maps. Experimental results show that on the O-rings-3000 testing dataset, the mean condition accuracy of the proposed algorithm reaches 95.10% for 5 types of surface defects of aerospace O-rings. Compared with RefineDet, the mean condition accuracy of the proposed algorithm is only reduced by 1.79%, while the parameters and FLOPs are reduced by 35.29% and 64.90%, respectively. Moreover, the proposed algorithm has good adaptability to image blur and light changes caused by the cutting of imaging hardware, thus saving the cost.

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