scholarly journals Volterra transfer functions in analysis of the stochastic filter driven by harmonic plus gaussian noise input

Radiotekhnika ◽  
2019 ◽  
Vol 1 (196) ◽  
pp. 89-97
Author(s):  
O.I. Kharchenko ◽  
V.M. Kartashov
2019 ◽  
pp. 128-133
Author(s):  
O.I. Kharchenko

The problem of standing out a signal from an additive mixture of a harmonic signal and white Gaussian noise is considered. The analysis is based on the phenomenon of stochastic resonance (SR), which consists in amplifying a periodic signal under the influence of noise of a certain power. SR is a universal physical phenomenon that is typical of some nonlinear systems, and is came out not only in technical, but also in biological and social systems. When calculating the spectral characteristics of the output signal, Volterra series were used. The problem is solved using the transfer functions of Volterra without the initial definition of kernels. Volterra transfer functions are obtained by the harmonic input signal method. The influence of the input signal parameters, in particular the amplitude and frequency of the harmonic signal and the noise power, on the spectral power density of the output signal is studied. Optimal parameters values are determined. Criteria are formulated for using a stochastic filter to standing out a harmonic signal on the background white Gaussian noise.


1980 ◽  
Vol 70 (6) ◽  
pp. 2261-2273
Author(s):  
Robert W. McGonigle ◽  
Paul W. Burton

abstract Uncertainties in the instrumental constants for the standard LP instruments of the WWSSN, arising from errors in amplitude measurements of the calibration pulse, are analytically quantified assuming that such measurement errors may be approximated by a perturbing Gaussian noise distribution. More importantly, for the practicing seismologist, uncertainties in magnification and phase delay of the entire instrumental transfer function are deduced from least-squares inversion of the seismogram calibration pulse. It is emphasized that reliable estimates of instrumental transfer functions are obtained by least-squares inversion of the calibration pulse, particularly for underdamped or near critically damped seismographs, where the Gaussian noise distribution is the dominant source of error.


Author(s):  
K.-H. Herrmann ◽  
E. Reuber ◽  
P. Schiske

Aposteriori deblurring of high resolution electron micrographs of weak phase objects can be performed by holographic filters [1,2] which are arranged in the Fourier domain of a light-optical reconstruction set-up. According to the diffraction efficiency and the lateral position of the grating structure, the filters permit adjustment of the amplitudes and phases of the spatial frequencies in the image which is obtained in the first diffraction order.In the case of bright field imaging with axial illumination, the Contrast Transfer Functions (CTF) are oscillating, but real. For different imageforming conditions and several signal-to-noise ratios an extensive set of Wiener-filters should be available. A simple method of producing such filters by only photographic and mechanical means will be described here.A transparent master grating with 6.25 lines/mm and 160 mm diameter was produced by a high precision computer plotter. It is photographed through a rotating mask, plotted by a standard plotter.


Author(s):  
Peter Rez

In high resolution microscopy the image amplitude is given by the convolution of the specimen exit surface wave function and the microscope objective lens transfer function. This is usually done by multiplying the wave function and the transfer function in reciprocal space and integrating over the effective aperture. For very thin specimens the scattering can be represented by a weak phase object and the amplitude observed in the image plane is1where fe (Θ) is the electron scattering factor, r is a postition variable, Θ a scattering angle and x(Θ) the lens transfer function. x(Θ) is given by2where Cs is the objective lens spherical aberration coefficient, the wavelength, and f the defocus.We shall consider one dimensional scattering that might arise from a cross sectional specimen containing disordered planes of a heavy element stacked in a regular sequence among planes of lighter elements. In a direction parallel to the disordered planes there will be a continuous distribution of scattering angle.


Author(s):  
Hannes Lichte

Generally, the electron object wave o(r) is modulated both in amplitude and phase. In the image plane of an ideal imaging system we would expect to find an image wave b(r) that is modulated in exactly the same way, i. e. b(r) =o(r). If, however, there are aberrations, the image wave instead reads as b(r) =o(r) * FT(WTF) i. e. the convolution of the object wave with the Fourier transform of the wave transfer function WTF . Taking into account chromatic aberration, illumination divergence and the wave aberration of the objective lens, one finds WTF(R) = Echrom(R)Ediv(R).exp(iX(R)) . The envelope functions Echrom(R) and Ediv(R) damp the image wave, whereas the effect of the wave aberration X(R) is to disorder amplitude and phase according to real and imaginary part of exp(iX(R)) , as is schematically sketched in fig. 1.Since in ordinary electron microscopy only the amplitude of the image wave can be recorded by the intensity of the image, the wave aberration has to be chosen such that the object component of interest (phase or amplitude) is directed into the image amplitude. Using an aberration free objective lens, for X=0 one sees the object amplitude, for X= π/2 (“Zernike phase contrast”) the object phase. For a real objective lens, however, the wave aberration is given by X(R) = 2π (.25 Csλ3R4 + 0.5ΔzλR2), Cs meaning the coefficient of spherical aberration and Δz defocusing. Consequently, the transfer functions sin X(R) and cos(X(R)) strongly depend on R such that amplitude and phase of the image wave represent only fragments of the object which, fortunately, supplement each other. However, recording only the amplitude gives rise to the fundamental problems, restricting resolution and interpretability of ordinary electron images:


2019 ◽  
Vol 62 (3) ◽  
pp. 745-757 ◽  
Author(s):  
Jessica M. Wess ◽  
Joshua G. W. Bernstein

PurposeFor listeners with single-sided deafness, a cochlear implant (CI) can improve speech understanding by giving the listener access to the ear with the better target-to-masker ratio (TMR; head shadow) or by providing interaural difference cues to facilitate the perceptual separation of concurrent talkers (squelch). CI simulations presented to listeners with normal hearing examined how these benefits could be affected by interaural differences in loudness growth in a speech-on-speech masking task.MethodExperiment 1 examined a target–masker spatial configuration where the vocoded ear had a poorer TMR than the nonvocoded ear. Experiment 2 examined the reverse configuration. Generic head-related transfer functions simulated free-field listening. Compression or expansion was applied independently to each vocoder channel (power-law exponents: 0.25, 0.5, 1, 1.5, or 2).ResultsCompression reduced the benefit provided by the vocoder ear in both experiments. There was some evidence that expansion increased squelch in Experiment 1 but reduced the benefit in Experiment 2 where the vocoder ear provided a combination of head-shadow and squelch benefits.ConclusionsThe effects of compression and expansion are interpreted in terms of envelope distortion and changes in the vocoded-ear TMR (for head shadow) or changes in perceived target–masker spatial separation (for squelch). The compression parameter is a candidate for clinical optimization to improve single-sided deafness CI outcomes.


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