scholarly journals Development of Measurement Technique for Viscosity and Surface Tension with Near-infrared Laser-Induced Capillary Wave -Theoretical Analysis of Uncertainties caused by the Temperature Dependence of Surface Tension and Experimental Verification of the Effect on the Temperature Dependence of Surface Tension with Decanol Aqueous Solution between Surface Heating and Volume Heating-

Netsu Bussei ◽  
2015 ◽  
Vol 29 (2) ◽  
pp. 82-89
Author(s):  
Hiroki Takiguchi ◽  
Yuji Nagasaka
Keyword(s):  
Aqueous Solution ◽  
Surface Tension ◽  
Theoretical Analysis ◽  
Temperature Dependence ◽  
Measurement Technique ◽  
Experimental Verification ◽  
Near Infrared ◽  
Capillary Wave ◽  
Infrared Laser ◽  
Surface Heating

Effect of crystal axis in temperature dependence of laser-induced damage thresholds by nanosecond near-infrared laser

2015 ◽  
Vol 353 ◽  
pp. 117-121 ◽  
Author(s):  
Katsuhiro Mikami ◽  
Tsuyoshi Sugita ◽  
Minako Azumi ◽  
Takahisa Jitsuno
Keyword(s):  
Temperature Dependence ◽  
Near Infrared ◽  
Infrared Laser ◽  
Crystal Axis ◽  
Laser Induced Damage

scholarly journals Gold nanorod-mediated near-infrared laser ablation: in vivo experiments on mice and theoretical analysis at different settings

2016 ◽  
Vol 33 (2) ◽  
pp. 150-159 ◽  
Author(s):  
Rachael Mooney ◽  
Emiliano Schena ◽  
Paola Saccomandi ◽  
Ali Zhumkhawala ◽  
Karen Aboody ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Theoretical Analysis ◽  
Near Infrared ◽  
Infrared Laser ◽  
Gold Nanorod ◽  
In Vivo Experiments

Silicon Fringe Sample Metrology—A Thickness Measurement Technique

2013 ◽  
Author(s):  
Mark Kimball
Keyword(s):  
Temperature Dependence ◽  
Temperature Coefficient ◽  
Measurement Technique ◽  
Thickness Measurement ◽  
Sample Thickness ◽  
Index Of Refraction ◽  
Interference Fringes ◽  
Noncontact Method ◽  
Thickness Variations

Abstract Silicon’s index of refraction has a strong temperature coefficient. This temperature dependence can be used to aid sample thinning procedures used for backside analysis, by providing a noncontact method of measuring absolute sample thickness. It also can remove slope ambiguity while counting interference fringes (used to determine the direction and magnitude of thickness variations across a sample).

Sign in / Sign up

Export Citation Format

Share Document