On the problem of criteria for phase transformations in molecular water clusters (hexamer and octamer examples)

2018 ◽  
Vol 59 (6) ◽  
Keyword(s):  
Phase Transformations ◽  
Water Clusters ◽  
Molecular Water

Molecular Water Clusters in River and and Their Dynamics. Celestial Bodies Influence

2012 ◽  
Vol 2 (5) ◽  
pp. 56-66 ◽  
Author(s):  
A. Zubow ◽  
K. Zubow ◽  
V. A. Zubow
Keyword(s):  
Water Clusters ◽  
Molecular Water ◽  
Celestial Bodies

Water clusters induced assembly of chiral organic microstructures showing reversible phase transformations and luminescence switching

2010 ◽  
Vol 46 (13) ◽  
pp. 2307 ◽  
Author(s):  
Guozan Yuan ◽  
Chengfeng Zhu ◽  
Yan Liu ◽  
Yu Fang ◽  
Yong Cui
Keyword(s):  
Phase Transformations ◽  
Water Clusters ◽  
Reversible Phase

scholarly journals Molecular Water Clusters in Water Environment. Third Phase of Water

2019 ◽  
Vol 7 ◽  
pp. 71
Author(s):  
G. S. Anagnostatos ◽  
K. Viras ◽  
M. Soutzidou ◽  
P. Pissis
Keyword(s):  
Water Clusters ◽  
Water Environment ◽  
Molecular Water ◽  
Third Phase

No abstract (available).

Structural Parameters and Thermodynamics of the Formation of Molecular Water Clusters

2018 ◽  
Vol 12 (1) ◽  
pp. 44-49 ◽  
Author(s):  
K. V. Berezin ◽  
O. V. Kozlov ◽  
M. L. Chernavina ◽  
A. M. Lihter ◽  
V. V. Smirnov ◽  
...  
Keyword(s):  
Water Clusters ◽  
Structural Parameters ◽  
Molecular Water

scholarly journals Synthesis, properties, application of nanosized powders of oxides and hydroxides. Cluster model of water state on their surface

2021 ◽  
Vol 12 (2-2021) ◽  
pp. 125-128
Author(s):  
I. V. Kozerozhets ◽  
◽  
G. P. Panasyuk ◽  
Keyword(s):  
Thermal Conductivity ◽  
Phase Composition ◽  
Phase Transformations ◽  
Polymer Matrix ◽  
Cluster Model ◽  
Water Clusters ◽  
Nanosized Powders ◽  
Water State ◽  
Synthesis Properties

The work is devoted to the development of the physicochemical foundations of the processes of obtaining powders of oxides and hydroxides, including aluminum, magnesium, calcium, and silicon with a given shape, size, impurity and phase composition, low thermal conductivity, etc., by methods of pyrolysis of a polymer matrix and hydrothermal treatment element-containing precursors, as well as the creation of a mechanism that allows describing the phase transformations of powders of oxides and hydroxides and reveals the role of water clusters with a low heat of vaporization in phase transformations.

The use of high-resolution FESEM to study solid-state phase transformations and reactions

1994 ◽  
Vol 52 ◽  
pp. 1028-1029
Author(s):  
P. G. Kotula ◽  
D. D. Erickson ◽  
C. B. Carter
Keyword(s):  
Solid State ◽  
High Resolution ◽  
Phase Transformations ◽  
High Efficiency ◽  
Sol Gel ◽  
Quantitative Information ◽  
Solid State Reactions ◽  
Critical Dimensions ◽  
Backscattered Electrons ◽  
Backscattered Electron

High-resolution field-emission-gun scanning electron microscopy (FESEM) has recently emerged as an extremely powerful method for characterizing the micro- or nanostructure of materials. The development of high efficiency backscattered-electron detectors has increased the resolution attainable with backscattered-electrons to almost that attainable with secondary-electrons. This increased resolution allows backscattered-electron imaging to be utilized to study materials once possible only by TEM. In addition to providing quantitative information, such as critical dimensions, SEM is more statistically representative. That is, the amount of material that can be sampled with SEM for a given measurement is many orders of magnitude greater than that with TEM.In the present work, a Hitachi S-900 FESEM (operating at 5kV) equipped with a high-resolution backscattered electron detector, has been used to study the α-Fe2O3 enhanced or seeded solid-state phase transformations of sol-gel alumina and solid-state reactions in the NiO/α-Al2O3 system. In both cases, a thin-film cross-section approach has been developed to facilitate the investigation. Specifically, the FESEM allows transformed- or reaction-layer thicknesses along interfaces that are millimeters in length to be measured with a resolution of better than 10nm.

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